DCA-J
Agilent 86100C
Wide-Bandwidth Oscilloscope
Mainframe and Modules
Technical Specifications
Four instruments in one
A digital communications analyzer,
a full featured wide-bandwidth
oscilloscope, a time-domain
reflectometer, and a jitter analyzer
• Accurate compliance
testing of optical transceivers
• Automated jitter and amplitude
interference decomposition
• Internally generated pattern trigger
• Modular platform for testing waveforms to
40 Gb/s and beyond
• Broadest coverage of data rates with optical reference
receivers, electrical channels, and clock recovery
• Built-in S-parameters with TDR measurements
• Compatible with Agilent 86100A/B-series,
83480A-series,and 54750-series modules
• < 90 fs intrinsic jitter
• Open operating system – Windows
®
XP Pro
Table of Contents
Overview
Features
Eye-diagram/mask test
Jitter analysis
Equalization and amplitude analysis
Jitter spectrum/PLL bandwidth
TDR/TDT/S-parameters
Measurements
Additional capabilities
Clock recovery
3
4
5
6
7
7
8
9
10
Specifications
Mainframe & triggering
(includes precision time base module
and precision waveform analyzer module)
Computer system & storage
Modules
Overview
Module selection table
Specifications
Multimode/single-mode
Single-mode
Dual electrical
TDR
Clock recovery
13
16
17
18
19
21
23
25
27
Ordering Information
29
2
Overview of Infiniium DCA-J
Features
Four instruments in one
The 86100C Infiniium DCA-J can be viewed as four
high-powered instruments in one:
• A general-purpose wide-bandwidth sampling
oscilloscope. PatternLock triggering significantly
enhances the usability as a general purpose scope.
• A digital communications analyzer
• A time domain reflectometer
• A precision jitter and amplitude interference analyzer
Just select the desired instrument mode and start making
measurements.
The key to accurate measurements of lightwave
communications waveforms is the optical receiver.
The 86100C has a broad range of precision receivers
integrated within the instrument.
• Built-in photodiodes, with flat frequency responses,
yield the highest waveform fidelity. This provides
high accuracy for extinction ratio measurements.
• Standards-based transmitter compliance measurements
require filtered responses. The 86100C offers a broad
range of filter combinations. Filters can be automatically
and repeatably switched in or out of the measurement
channel remotely over GPIB or with a front panel
button. The frequency response of the entire
measurement path is calibrated, and will maintain
its performance over long-term usage.
• The integrated optical receiver provides a calibrated
optical channel. With the accurate optical receiver
built into the module, optical signals are accurately
measured and displayed in optical power units.
• Switches or couplers are not required for an average
power measurement. Signal routing is simplified and
signal strength is maintained.
Configurable to meet your needs
The 86100C supports a wide range of modules for testing
both optical and electrical signals. Select modules to get
the specific bandwidth, filtering, and sensitivity you need.
Digital communications analysis
Accurate eye-diagram analysis is essential for
characterizing the quality of transmitters used
from 100 Mb/s to 40 Gb/s. The 86100C is designed
specifically for the complex task of analyzing digital
communications waveforms. Compliance mask and
parametric testing no longer require a complicated
sequence of setups and configurations. If you can press
a button, you can perform a complete compliance test.
The important measurements you need are right at your
fingertips, including:
• industry standard mask testing with built-in
margin analysis
• extinction ratio measurements with accuracy and
repeatability
• eye measurements: crossing %, eye height and width,
‘1’ and ‘0’ levels, jitter, rise or fall times and more
Windows is a U.S. registered trademark of Microsoft Corporation.
3
Eye diagram mask testing
The 86100C provides efficient, high-throughput
waveform compliance testing with a suite of standards
based eye-diagram masks. The test process has been
streamlined into a minimum number of keystrokes for
testing at industry standard data rates.
Eyeline Mode
Eyeline Mode is available in the 86100C and provides
insight into the effects of specific bit transitions within a
data pattern. The unique view assists diagnosis of device
or system failures due to specific transitions or sets of
transitions within a pattern. When combined with mask
limit tests, Eyeline Mode can quickly isolate the specific
bit that caused a mask violation.
Traditional triggering methods on an equivalent time
sampling scope are quite effective at generating eye
diagrams. However, these eye diagrams are made up of
samples whose timing relationship to the data pattern
is effectively random, so a given eye will be made up
of samples from many different bits in the pattern
taken with no specific timing order. The result is that
amplitude versus time trajectories of specific bits in
the pattern are not visible. Also, averaging of the eye
diagram is not valid, as the randomly related samples
will effectively average to the “middle” of the eye.
Eyeline Mode uses PatternLock triggering (Option 001
required) to build up an eye diagram from samples taken
sequentially through the data pattern. This maintains
a specific timing relationship between samples and
allows Eyeline Mode to draw the eye based on specific
bit trajectories. Effects of specific bit transitions can be
investigated, and averaging can be used with the eye
diagram.
Standard formats
Rate
1X Gigabit Ethernet
2X Gigabit Ethernet
10 Gigabit Ethernet
10 Gigabit Ethernet
10 Gigabit Ethernet FEC
10 Gigabit Ethernet LX4
Fibre Channel
2X Fibre Channel
4X Fibre Channel
8x Fibre Channel
10X Fibre Channel
10X Fibre Channel FEC
16x Fibre channel
Infiniband
STM0/OC1
STM1/OC3
STM4/OC12
STM16/OC48
STM16/OC48 FEC
STM64/OC192
STM64/OC192 FEC
STM64/OC192 FEC
STM64/OC192 Super FEC
STM256/OC768
STS1 EYE
STS3 EYE
(Mb/s)
1250
2500
9953.28
10312.5
11095.7
3125
1062.5
2125
4250
8500
10518.75
11317
14025
2500
51.84
155.52
622.08
2488.3
2666
9953.28
10664.2
10709
12500
39813
51.84
155.52
PatternLock Triggering advances the
capabilities of the sampling oscilloscope
The Enhanced Trigger option (Option 001) on the 86100C
provides a fundamental capability never available
before in an equivalent time sampling oscilloscope.
This new triggering mechanism enables the DCA-J to
generate a trigger at the repetition of the input data
pattern – a pattern trigger. Historically, this required the
pattern source to provide this type of trigger to the scope.
With the press of a button, PatternLock automatically
detects the pattern length, data rate and clock rate
making the complex triggering process transparent to
the user.
PatternLock enables the 86100C to behave more like a
real-time oscilloscope in terms of user experience.
Observation of specific bits within the data pattern is
greatly simplified. Users that are familiar with real-time
oscilloscopes, but perhaps less so with equivalent time
sampling scopes will be able to ramp up quickly.
PatternLock adds another new dimension to pattern
triggering by enabling the mainframe software to take
samples at specific locations in the data pattern with
outstanding timebase accuracy. This capability is a
building block for many of the new capabilities available
in the 86100C described later.
4
Other eye-diagram masks are easily created through
scaling those listed above. In addition, mask editing
allows for new masks either by editing existing masks,
or creating new masks from scratch. A new mask can
also be created or modified on an external PC using
a text editor such as Notepad, then can be transferred
to the instrument’s hard drive using LAN or Flash drive.
Perform these mask conformance tests with convenient
user-definable measurement conditions, such as mask
margins for guardband testing, number of waveforms
tested, and stop/limit actions. Mask margin can be
determined automatically to a user definable hit/error
ratio. Transmitter waveform dispersion penalty (TWDP)
tests can be performed directly in the 86100C. Exporting
the waveform for external post processing is not required.
(Option 201 and MATLAB® required. Dispersion penalty
script for specific test standards must be loaded into
the 86100C.)
MATLAB
®
is a registered trademark of The MathWorks, Inc.
Jitter analysis (Option 200)
The “J” in DCA-J represents the ability to perform
jitter analysis. The 86100C is a Digital Communications
Analyzer with jitter analysis capability. The 86100C adds
a fourth mode of operation – Jitter Mode. Extremely
wide bandwidth, low intrinsic jitter, and advanced
analysis algorithms yield the highest accuracy in jitter
measurements.
As data rates increase in both electrical and optical
applications, jitter is an ever increasing measurement
challenge. Decomposition of jitter into its constituent
components is becoming more critical. It provides
critical insight for jitter budgeting and performance
optimization in device and system designs. Many
communications standards require jitter decomposition
for compliance. Traditionally, techniques for separation of
jitter have been complex and often difficult to configure,
and availability of instruments for separation of jitter
becomes limited as data rates increase.
The DCA-J provides simple, one button setup and
execution of jitter analysis. Jitter Mode decomposes
jitter into its constituent components and presents
jitter data in various insightful displays. Jitter Mode
operates at all data rates the 86100C supports, removing
the traditional data rate limitations from complex jitter
analysis. The 86100C provides several key attributes to
jitter analysis:
• Very low intrinsic jitter (both random and
deterministic) translates to a very low jitter noise
floor which provides unmatched jitter measurement
sensitivity.
• Wide bandwidth measurement channels deliver very
low intrinsic data dependent jitter and allow analysis
of jitter on all data rates to 40 Gb/s and beyond.
• PatternLock triggering technology provides sampling
efficiency that makes jitter measurements very fast.
• Firmware revision 8.0 allows for accurate jitter
measurements on signals with large RJ/PJ components
(up to 0.7 UI).
Jitter analysis functionality is available through the
Option 200 software package. Option 200 includes:
• Decomposition of jitter into Total Jitter (TJ), Random
Jitter (RJ), Deterministic Jitter (DJ), Periodic Jitter
(PJ), Data Dependent Jitter (DDJ), Duty Cycle
Distortion (DCD), and Jitter induced by Intersymbol
Interference (ISI).
• Various graphical and tabular displays of jitter data
• Export of jitter data to convenient delimited text
format
• Save / recall of jitter database
• Jitter frequency spectrum
• Isolation and analysis of Sub-Rate Jitter (SRJ), that is,
periodic jitter that is at an integer sub-rate of the bitrate.
• Bathtub curve display in both Q and logBER scale
• Adjustable total jitter probability
Advanced EYE Analysis
(Option 401)
Accurate Jitter Measurements on Long Patterns
When testing jitter performance against specifications,
some standards, such as 10 Gigabit Ethernet, often make
use of long patterns such as PRBS31. Longer patterns
emulate actual data traffic more accurately and can
uncover more problems within a device. However, these
long patterns can be a challenge for many instruments
that measure jitter and estimate Total Jitter (TJ).
86100CU-401 addresses this challenge by making
compliant jitter measurements on long patterns, such
as PRBS31 or live traffic. Using powerful jitter analysis
algorithms, the software measures RJ, DJ, and calculates
estimated TJ, on electrical or optical signals.
Additionally, the application measures high probability
jitter such as J2 Jitter, sometimes referred to as “99%
Jitter” or “all but 1% of jitter”. It also measures J9 Jitter,
defined at a BER of 2.5E-10. Data Dependent Pulse Width
Shrinkage (DDPWS), a component of Data Dependent
Jitter (DDJ), is also reported when the 86100C DCA-J is
equipped with 86100C-200 Enhanced Jitter Analysis.
Compliant Mask Testing using BER Contours
Another feature of 86100CU-401 is its ability to perform
mask testing using specifications BER-contours. This
method of mask testing is used when specifications, such
as OIF-CEI 2.0 and XFP, define mask test requirements
based on a defined bit error ratio for the link. While
this type of mask can be modified and tested using
conventional mask testing techniques, the 86100C can
now perform compliant mask testing using both methods.
Sampling scopes, due to their unmatched signal fidelity,
are the de facto standard for mask testing.
Flexible Hardware Configuration
The software application runs on an external PC,
or 86100C DCA-J, running Microsoft® Office Excel
2003/2007. It uses any 86100C DCA-J hardware
configuration to perform a precision waveform
measurement and imports the data into MS Excel
for further processing. When performing jitter
measurements on high performance devices (RJ < 500fs),
the application is able to leverage 86100C-200 Enhanced
Jitter (Jitter Mode), well known for its speed and
accuracy. Alternatively, the application can also operate
standalone if Jitter Mode is not installed - the choice is
yours!
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