5962R0521402QXC datasheet, PDF

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5962R0521402QXC: DescriptionClock Driver, CMOS, CDFP48; Categorylogic logic; File Size426KB，33 Pages; ManufacturerAeroflex; Websitehttp://www.aeroflex.com/

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5962R0521402QXC Overview

Clock Driver, CMOS, CDFP48

5962R0521402QXC Parametric

Parameter Name	Attribute value
package instruction	DFP, FL48,.4,25
Reach Compliance Code	unknown
JESD-30 code	R-XDFP-F48
Number of terminals	48
Maximum operating temperature	125 °C
Minimum operating temperature	-40 °C
Package body material	CERAMIC
encapsulated code	DFP
Encapsulate equivalent code	FL48,.4,25
Package shape	RECTANGULAR
Package form	FLATPACK
power supply	2.5/3.3,3.3 V
Prop。Delay @ Nom-Sup	0.25 ns
Certification status	Not Qualified
Filter level	38535Q/M;38534H;883B
surface mount	YES
technology	CMOS
Temperature level	AUTOMOTIVE
Terminal form	FLAT
Terminal pitch	0.635 mm
Terminal location	DUAL
total dose	100k Rad(Si) V
Base Number Matches	1

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REVISIONS

LTR

DESCRIPTION

Correct title to accurately describe device function.

Add device types 03 and 04. - CFS

Correct package case outline X dimension Q and footnote 5/ Q to figure 1.

Update radiation features in section 1.5 and update boilerplate paragraphs as

required by the Mil-PRF-38535. Delete class M requirements throughout. -

MAA

DATE (YR-MO-DA)

07-02-22

APPROVED

Thomas M. Hess

13-06-07

Thomas M. Hess

REV

SHEET

REV

SHEET

REV STATUS

OF SHEETS

PMIC N/A

REV

SHEET

PREPARED BY

Charles F. Saffle

CHECKED BY

Charles F. Saffle

APPROVED BY

THIS DRAWING IS AVAILABLE

FOR USE BY ALL

DEPARTMENTS

AND AGENCIES OF THE

DEPARTMENT OF DEFENSE

Thomas M. Hess

DRAWING APPROVAL DATE

06-04-21

AMSC N/A

REVISION LEVEL

SIZE

CAGE CODE

STANDARD

MICROCIRCUIT

DRAWING

DLA LAND AND MARITIME

COLUMBUS, OHIO 43218-3990

http://www.landandmaritime.dla.mil

MICROCIRCUIT, DIGITAL, CMOS, RADIATION

HARDENED, PROGRAMMABLE SKEW CLOCK

BUFFER, MONOLITHIC SILICON

67268

SHEET

5962-05214

1 OF 32

5962-E281-12

DSCC FORM 2233

APR 97

2. APPLICABLE DOCUMENTS

2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part

of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the

solicitation or contract.

DEPARTMENT OF DEFENSE SPECIFICATION

MIL-PRF-38535

- Integrated Circuits, Manufacturing, General Specification for.

DEPARTMENT OF DEFENSE STANDARDS

MIL-STD-883

MIL-STD-1835

- Test Method Standard Microcircuits.

- Interface Standard Electronic Component Case Outlines.

DEPARTMENT OF DEFENSE HANDBOOKS

MIL-HDBK-103

MIL-HDBK-780

- List of Standard Microcircuit Drawings.

- Standard Microcircuit Drawings.

(Copies of these documents are available online at

http://quicksearch.dla.mil/

or from the Standardization Document Order

Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)

2.2 Non-Government publications. The following document(s) form a part of this document to the extent specified herein.

Unless otherwise specified, the issues of the documents are the issues of the documents cited in the solicitation or contract.

ASTM INTERNATIONAL (ASTM)

ASTM F1192 - Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion

Irradiation of Semiconductor Devices.

(Copies of this document are available online at

http://www.astm.org

or from ASTM International, 100 Barr Harbor Drive,

P.O. Box C700, West Conshohocken, PA 19428-2959.)

2.3 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text

of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a

specific exemption has been obtained.

3. REQUIREMENTS

3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with

MIL-PRF-38535 and as specified herein or as modified in the device manufacturer's Quality Management (QM) plan. The

modification in the QM plan shall not affect the form, fit, or function as described herein.

3.1.1 Microcircuit die. For the requirements of microcircuit die, see appendix A to this document.

3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified

in MIL-PRF-38535 and herein for device classes Q and V.

3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.4 herein and on figure 1.

3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2.

3.2.3 Functional block diagram. The functional block diagram shall be as specified on figure 3.

3.2.4 Timing waveforms and test circuits. The timing waveforms and test circuits shall be as specified on figure 4.

STANDARD

MICROCIRCUIT DRAWING

DLA LAND AND MARITIME

COLUMBUS, OHIO 43218-3990

DSCC FORM 2234

APR 97

SIZE

REVISION LEVEL

5962-05214

SHEET

3.2.5 Radiation exposure circuit. The radiation exposure circuit shall be maintained by the manufacturer under document

revision level control and shall be made available to the preparing and acquiring activity upon request.

3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the

electrical performance characteristics and postirradiation parameter limits are as specified in table IA and shall apply over the

full case operating temperature range.

3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table IIA. The electrical

tests for each subgroup are defined in table IA.

3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturer's PIN may also be

marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer

has the option of not marking the "5962-" on the device. For RHA product using this option, the RHA designator shall still be

marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535.

3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a "QML" or "Q" as required in

MIL-PRF-38535.

3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535

listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). The certificate of compliance

submitted to DLA Land and Maritime-VA prior to listing as an approved source of supply for this drawing shall affirm that the

manufacturer's product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and herein.

3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 shall

be provided with each lot of microcircuits delivered to this drawing.

STANDARD

MICROCIRCUIT DRAWING

DLA LAND AND MARITIME

COLUMBUS, OHIO 43218-3990

DSCC FORM 2234

APR 97

SIZE

REVISION LEVEL

5962-05214

SHEET

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