The UT54ACS165 and the UT54ACTS165 are 8-bit serial shift regis-
ters that, when clocked, shift the data toward serial output Q
H
. Parallel-
in access to each stage is provided by eight individual data inputs that
are enabled by a low level at the SH/LD input. The devices feature a
clock inhibit function and a complemented serial output Q
H
.
Clocking is accomplished by a low-to-high transition of the CLK input
while SH/LD is held high and CLK INH is held low. The functions of
the CLK and CLK INH (clock inhibit) inputs are interchangeable. Since
a low CLK input and a low-to-high transition of CLK INH will also
accomplish clocking, CLK INH should be changed to the high level
only while the CLK input is high. Parallel loading is disabled when
SH/LD is held high. Parallel inputs to the registers are enabled while
SH/LD is low independently of the levels of CLK, CLK INH or SER
inputs.
The devices are characterized over full military temperature range of
-55°C to +125°C.
PINOUTS
16-Pin DIP
Top View
SH/LD
CLK
E
F
G
H
Q
H
V
SS
1
2
3
4
5
6
7
8
16
15
14
13
12
11
10
9
V
DD
CLK INH
D
C
B
A
SER
Q
H
16-Lead Flatpack
Top View
SH/LD
CLK
E
F
G
H
Q
H
V
SS
1
2
3
4
5
6
7
8
16
15
14
13
12
11
10
9
V
DD
CLK INH
D
C
B
A
SER
Q
H
LOGIC SYMBOL
(1)
SH/LD
(15)
CLK INH
(2)
CLK
(10)
SER
(11)
A
(12)
B
(13)
C
(14)
D
(3)
E
(4)
F
(5)
G
(6)
H
SRG8
C1 (LOAD)
≥1
C2/
FUNCTION TABLE
INPUTS
SH/ CLK CLK SER PARALLEL
LD INH
A ... H
INTERNAL OUTPUTS
OUTPUTS
Q
A
Q
B
Q
H
Q
H
h
2D
1D
1D
L
H
H
H
H
X
L
L
L
H
X
L
↑
↑
X
X
H
L
X
a ... h
X
X
X
X
a
Q
A
H
L
Q
A
b
Q
B
Q
A
Q
A
Q
B
h
Q
H
Q
G
Q
G
Q
H
Q
H
Q
G
Q
G
Q
H
1
1D
(9)
Q
(7)
H
Q
H
X
Note:
1. Logic symbol in accordance with ANSI/IEEE Std 91-1984 and
IEC Publication 617-12.
Note:
1. Q
n
= The state of the referenced output one setup time prior to the Low-to-
High clock transition.PINOUTS
LOGIC DIAGRAM
A
(11
)
SH/LD
B
(12)
C
(13)
D
(14)
E
(3)
F
(4)
G
(5)
H
(6)
(1)
CLK INH
CLK
(15)
(2)
S
C
SER
S
C
D Q
B
S
C
DQ
C
S
C
D Q
D
S
C
D Q
E
S
C
D Q
F
S
C
D Q
G
S
C
(9)
Q
H
(10
)
D
Q
A
(7)
D Q
H
R
R
R
R
R
R
R
R
Q
H
2
OPERATIONAL ENVIRONMENT
1
PARAMETER
Total Dose
SEU Threshold
2
SEL Threshold
Neutron Fluence
LIMIT
1.0E6
80
120
1.0E14
UNITS
rads(Si)
MeV-cm
2
/mg
MeV-cm
2
/mg
n/cm
2
Notes:
1. Logic will not latchup during radiation exposure within the limits defined in the table.
2. Device storage elements are immune to SEU affects.
ABSOLUTE MAXIMUM RATINGS
SYMBOL
V
DD
V
I/O
T
STG
T
J
T
LS
Θ
JC
I
I
P
D
PARAMETER
Supply voltage
Voltage any pin
Storage Temperature range
Maximum junction temperature
Lead temperature (soldering 5 seconds)
Thermal resistance junction to case
DC input current
Maximum power dissipation
LIMIT
-0.3 to 7.0
-.3 to V
DD
+.3
-65 to +150
+175
+300
20
±10
1
UNITS
V
V
°C
°C
°C
°C/W
mA
W
Note:
1. Stresses outside the listed absolute maximum ratings may cause permanent damage to the device. This is a stress rating only, functional operation of the device at
these or any other conditions beyond limits indicated in the operational sections is not recommended. Exposure to absolute maximum rating conditions for extended
periods may affect device reliability.
RECOMMENDED OPERATING CONDITIONS
SYMBOL
V
DD
V
IN
T
C
PARAMETER
Supply voltage
Input voltage any pin
Temperature range
LIMIT
4.5 to 5.5
0 to V
DD
-55 to + 125
UNITS
V
V
°C
3
DC ELECTRICAL CHARACTERISTICS
7
(V
DD
= 5.0V
±
10%; V
SS
= 0V
6
, -55°C < T
C
< +125°C); Unless otherwise noted, Tc is per the temperature range ordered.
SYMBOL
V
IL
PARAMETER
Low-level input voltage
1
ACTS
ACS
High-level input voltage
1
ACTS
ACS
Input leakage current
ACTS/ACS
Low-level output voltage
3
ACTS
ACS
High-level output voltage
3
ACTS
ACS
Short-circuit output current
2 ,4
ACTS/ACS
Output current
10
(Sink)
I
OH
Output current
10
(Source)
P
total
I
DDQ
ΔI
DDQ
Power dissipation
2, 8, 9
Quiescent Supply Current
Quiescent Supply Current Delta
ACTS
V
IN
= V
DD
or V
SS
I
OL
= 8.0mA
I
OL
= 100μA
I
OH
= -8.0mA
I
OH
= -100μA
V
O
= V
DD
and V
SS
V
IN
= V
DD
or V
SS
V
OL
= 0.4V
V
IN
= V
DD
or V
SS
V
OH
= V
DD
- 0.4V
C
L
= 50pF
V
DD
= 5.5V
For input under test
V
IN
= V
DD
- 2.1V
For all other inputs
V
IN
= V
DD
or V
SS
V
DD
= 5.5V
C
IN
C
OUT
Input capacitance
5
Output capacitance
5
ƒ
= 1MHz @ 0V
ƒ
= 1MHz @ 0V
15
15
pF
pF
2.9
10
1.6
mW/
MHz
μA
mA
-8
mA
.7V
DD
V
DD
- 0.25
-200
8
200
.5V
DD
.7V
DD
-1
1
CONDITION
MIN
MAX
0.8
.3V
DD
UNIT
V
V
IH
V
I
IN
V
OL
μA
0.40
0.25
V
V
OH
V
I
OS
I
OL
mA
mA
4
Notes:
1. Functional tests are conducted in accordance with MIL-STD-883 with the following input test conditions: V
IH
= V
IH
(min) + 20%, - 0%; V
IL
= V
IL
(max) + 0%, -
50%, as specified herein, for TTL, CMOS, or Schmitt compatible inputs. Devices may be tested using any input voltage within the above specified range, but are
guaranteed to V
IH
(min) and V
IL
(max).
2. Supplied as a design limit but not guaranteed or tested.
3. Per MIL-PRF-38535, for current density
≤
5.0E5 amps/cm
2
, the maximum product of load capacitance (per output buffer) times frequency should not exceed 3,765
pF/MHz.
4. Not more than one output may be shorted at a time for maximum duration of one second.
5. Capacitance measured for initial qualification and when design changes may affect the value. Capacitance is measured between the designated terminal and V
SS
at
frequency of 1MHz and a signal amplitude of 50mV rms maximum.
6. Maximum allowable relative shift equals 50mV.
7. All specifications valid for radiation dose
≤
1E6 rads(Si).
8. Power does not include power contribution of any TTL output sink current.
9. Power dissipation specified per switching output.
10. This value is guaranteed based on characterization data, but not tested.
[i=s] This post was last edited by paulhyde on 2014-9-15 08:59 [/i] What should we do during non-competition time? Or learn something. I hope those with experience can share their thoughts and give yo...
The application for the development board was approved. Can I buy it on Wednesday or Thursday? I didn’t see the email on Tuesday for the electronic system design competition, but I just saw it today. ...
In a Dialog Based application, I want to perform the following operations. What should I do? In the main form, there is a CList Ctrl control (Report) -> corresponding to the variable m_list1, and ther...
I have 11 Core Coins and I bought an attachment for 10 Core Coins. But the system said that my operation made Core Coins < 0 and refused to download it. However, 10 of my coins were already deducted. ...
On August 23, media reported that Huawei’s internal forum posted an article on the afternoon of the 22nd titled “The entire company’s business policy must shift from pursuing scale to pursuing profits...
A line scan lens is an industrial lens used with line scan cameras. Its imaging principle is to capture the image of the workpiece using a linear sensor and then perform digital signal processing t...[Details]
Limited vocabulary recognition
According to the number of characters, words or short sentences in the vocabulary, it can be roughly divided into: less than 100 is small vocabulary; 100-1000 is...[Details]
On August 18th, Galaxis, a specialist in integrated intelligent intralogistics robotics, officially unveiled its next-generation, ultra-narrow aisle forklift mobile robot, the "VFR Ultra-Narrow Ser...[Details]
introduction
According to the China Fire Statistics Yearbook, electrical fires accounted for more than 30% of fire accidents in the past decade, and the trend is increasing year by year. They ...[Details]
UPS stands for Uninterruptible Power Supply, which includes energy storage devices. It is mainly used to provide uninterruptible power supply for devices that require high power stability.
...[Details]
A half-bridge is an inverter topology for converting DC to AC. A typical half-bridge circuit consists of two controller switches, a three-wire DC power supply, two feedback diodes, and two capacito...[Details]
As the range of electric vehicles continues to increase, driving electric vehicles for long-distance travel has become a trend. For high-speed travel, how much impact will high-speed driving of ele...[Details]
New version helps developers build secure and trustworthy embedded systems
Shanghai, China—August 21, 2025—
QNX, a division of BlackBerry Ltd., today announced the release of QNX...[Details]
Smartphones can be incredibly unintelligent. For example, consider an office full of people, each absorbed in their work. Suddenly, the silence is broken by a burst of loud pop music. A colleague's...[Details]
On August 18th, China's largest expressway
charging station,
the G25 Changshen Expressway Tonglu Service Area (South Area), officially opened and launched its integrated solar-storage-charg...[Details]
introduction
The widespread use of air conditioner communication circuits began with the rise of household inverter air conditioners. With China's energy conservation and emission reduction in...[Details]
The power transmission system between a car's engine and drive wheels is called its drivetrain. It ensures the necessary traction and speed under various driving conditions, and coordinates these t...[Details]
EVTank predicts that all-solid-state batteries will achieve small-scale mass production in 2027 and large-scale shipments by 2030. Global solid-state battery shipments will reach 614.1GWh, of which...[Details]
In a previous article, we introduced
the origin of
AVTP
and the meaning of the various header fields when using it to transmit audio. This article will explain the meaning and constraints of...[Details]
According to foreign media reports, Apple is secretly evaluating several artificial intelligence hardware concepts, including smart home displays, security devices and a desktop robot, of which the...[Details]
Electronics Design Contest
京公网安备 11010802033920号
EEWORLD
