CERAMIC CHIP INDUCTORS
1. PART NO. EXPRESSION :
C1 SERIES
C1-1N0S-10
(a)
(b) (c)
(d)
(a) Series code
(b) Inductance code : 1N0 = 1.0nH
(c) Tolerance code : S = ±0.3nH, J = ±5%
(d) 10 : Lead Free
2. CONFIGURATION & DIMENSIONS :
A
D
B
C
Unit:m/m
A
1.0±0.05
B
0.5±0.05
C
0.5±0.05
D
0.1 ~ 0.3
3. GENERAL SPECIFICATION :
a) Operating temp. : -40°C to +85°C
b) Storage temp. : -10°C to +40°C
c) Humdity range : 70% RH Max.
d) Resistance to solder heat : 265°C.6secs
NOTE : Specifications subject to change without notice. Please check our website for latest information.
26.09.2008
SUPERWORLD ELECTRONICS (S) PTE LTD
PG. 1
CERAMIC CHIP INDUCTORS
6. ELECTRICAL CHARACTERISTICS :
Part Number
C1-1N0S-10
C1-1N2S-10
C1-1N5S-10
C1-1N8S-10
C1-2N0S-10
C1-2N2S-10
C1-2N4S-10
C1-2N7S-10
C1-3N0S-10
C1-3N3S-10
C1-3N9S-10
C1-4N7S-10
C1-5N6S-10
C1-6N8J-10
C1-8N2J-10
C1-10NJ-10
C1-12NJ-10
C1-15NJ-10
C1-18NJ-10
C1-22NJ-10
C1-27NJ-10
C1-33NJ-10
C1-39NJ-10
C1-47NJ-10
C1-56NJ-10
C1-68NJ-10
C1-82NJ-10
C1-R10J-10
C1-R12J-10
Tolerance code :
S : ±0.3nH
J : ±5%
EIA
Size
0402
0402
0402
0402
0402
0402
0402
0402
0402
0402
0402
0402
0402
0402
0402
0402
0402
0402
0402
0402
0402
0402
0402
0402
0402
0402
0402
0402
0402
Inductance
( nH )
1.0
1.2
1.5
1.8
2.0
2.2
2.4
2.7
3.0
3.3
3.9
4.7
5.6
6.8
8.2
10
12
15
18
22
27
33
39
47
56
68
82
100
120
Q
Min.
8
8
8
8
8
8
8
8
8
8
8
8
8
8
8
8
8
8
8
8
8
8
8
8
8
8
8
8
8
Test
Frequency
( MHz )
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
100
SRF
( GHz )
Min.
10
10
6
6
6
6
6
6
6
6
4
4
4
3.9
3.6
3.2
2.7
2.3
2.1
1.9
1.6
1.3
1.2
1.0
0.75
0.75
0.60
0.60
0.60
DCR
( )
Max.
0.08
0.09
0.10
0.12
0.12
0.13
0.13
0.13
0.16
0.16
0.21
0.21
0.23
0.25
0.28
0.31
0.40
0.46
0.55
0.60
0.70
0.80
0.90
1.00
1.00
1.20
1.30
1.50
1.60
C1 SERIES
Rated Current
( mA )
Max.
300
300
300
300
300
300
300
300
300
300
300
300
300
300
300
300
300
300
300
300
300
200
200
200
200
180
150
150
150
NOTE : Specifications subject to change without notice. Please check our website for latest information.
26.09.2008
SUPERWORLD ELECTRONICS (S) PTE LTD
PG. 2
CERAMIC CHIP INDUCTORS
7. CHARACTERISTICS CURVES :
C1 SERIES
Inductance vs. Frequency
Q vs. Frequency
NOTE : Specifications subject to change without notice. Please check our website for latest information.
26.09.2008
SUPERWORLD ELECTRONICS (S) PTE LTD
PG. 3
CERAMIC CHIP INDUCTORS
8. RELIABILITY & TEST CONDITION :
C1 SERIES
ITEM
Solder Heat Resistance
PERFORMANCE
Appearance : Cracks should not be allowed.
More than 75% of the terminal electrode
should be covered with new solder.
TEST CONDITION
Preheat : 100~150°C, 60sec.
Solder : Sn-Ag3.0-Cu0.5
Solder Temperature : 265±3°C
Flux : Rosin
Dip Time : 6±1sec.
265°C
150°C
Preheating Dipping
Natural
cooling
60
seconds
6±1
seconds
Solderability
More than 90% of the terminal electrode
should be covered with new solder.
Preheat : 150°C, 60sec.
Solder : Sn-Ag3.0-Cu0.5
Solder Temperature : 240±5°C
Flux : Rosin
Dip Time : 3±1sec.
240°C
150°C
Preheating Dipping
Natural
cooling
60
seconds
3±1.0
seconds
Terminal Strength
The terminal electrode & the dielectric must
not be damaged by the forces applied on the
right conditions.
For C Series :
Size
1
2
3
4
5
6
Force (Kfg)
0.2
0.5
0.6
1.0
1.0
1.0
1.5
2.0
> 25
Time (sec)
W
W
7
8
Flexture Strength
The terminal electrode & the dielectric must
not be damaged by the forces applied on the
right conditions.
20(.787)
Bending
45(1.772)
45(1.772)
40(1.575)
Solder a chip on a test substrate, bend the substrate
by 3mm (0.118in) for 10secs and return.
100(3.937)
NOTE : Specifications subject to change without notice. Please check our website for latest information.
26.09.2008
SUPERWORLD ELECTRONICS (S) PTE LTD
PG. 4
CERAMIC CHIP INDUCTORS
8. RELIABILITY & TEST CONDITION :
C1 SERIES
ITEM
Bending Strength
PERFORMANCE
The ferrite should not be damaged by forces
applied on the right condition.
R0.5(0.02)
1.0(0.039)
TEST CONDITION
Chip
A
High Temperature Resistance
Appearance : No damage.
Inductance : Within ±20% of initial value.
Temperature : 85±5°C
Applied Current : rated current
Duration : 1008±12hrs
Measurement : After placing for at least 24hrs.
Humidity : 90~95% RH.
Temperature : 60±2°C
Applied Current : rated current (max.)
Duration : 1008±12hrs
Measurement : After placing for at least 24hrs.
Humidity Resistance
Thermal Shock
Appearance : Cracking, chipping or any other
defects that are harmful to the characteristics
shall not be allowed.
Inductance : Within ±20% of initial value.
Phase
1
Temperature (°C)
-40±2°C
+85±5°C
Times (min.)
30
30
For C Series :
Condition for 1 cycle
Step1 : -40±2°C 30 min.
Step2 : +85±5°C 30 min.
Number of cycles : 100
Measurement : After placing for at least 24hrs.
Temperature : -40±2°C
Duration : 1008±12hrs
Measurement : After placing for at least 24hrs.
Low temperature storage test
2
Measured : 100 times
NOTE : Specifications subject to change without notice. Please check our website for latest information.
26.09.2008
SUPERWORLD ELECTRONICS (S) PTE LTD
PG. 5
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