A3P250-1VQ144T datasheet, PDF - EEWORLD Datasheet

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A3P250-1VQ144T: DescriptionFPGA, 1536 CLBS, 60000 GATES, 350 MHz, PBGA144; Categorysemiconductor Programmable logic devices; File Size4MB，136 Pages; ManufacturerActel; Websitehttp://www.actel.com/

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A3P250-1VQ144T Overview

FPGA, 1536 CLBS, 60000 GATES, 350 MHz, PBGA144

A3P250-1VQ144T Parametric

Parameter Name	Attribute value
Number of functions	1
Number of terminals	144
Maximum operating temperature	125 Cel
Minimum operating temperature	-40 Cel
Maximum supply/operating voltage	1.58 V
Minimum supply/operating voltage	1.42 V
Rated supply voltage	1.5 V
Processing package description	1 MM PITCH, FBGA-144
state	ACTIVE
Craftsmanship	CMOS
packaging shape	SQUARE
Package Size	GRID ARRAY, LOW PROFILE
surface mount	Yes
Terminal form	BALL
Terminal spacing	1 mm
Terminal location	BOTTOM
Packaging Materials	PLASTIC/EPOXY
Temperature level	AUTOMOTIVE
organize	1536 CLBS, 60000 GATES
Maximum FCLK clock frequency	350 MHz
Number of configurable logic modules	1536
Programmable logic type	FIELD PROGRAMMABLE GATE ARRAY
Number of equivalent gate circuits	60000

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v1.0

Automotive ProASIC3 Flash Family FPGAs

Features and Benefits

High-Temperature AEC-Q100–Qualified Devices

• Grade 2 105°C T

(115°C T

)

• Grade 1 125°C T

(135°C T

)

• PPAP Documentation

Low Power

• 1.5 V Core Voltage

• Support for 1.5-V-Only Systems

• Low-Impedance Flash Switches

High-Performance Routing Hierarchy

• Segmented, Hierarchical Routing and Clock Structure

• High-Performance, Low-Skew Global Network

• Architecture Supports Ultra-High Utilization

Firm-Error Immune

• Only Automotive FPGAs to Offer Firm-Error Immunity

• Can Be Used without Configuration Upset Risk

Advanced I/O

•

700 Mbps DDR, LVDS-Capable I/Os

1.5 V, 1.8 V, 2.5 V, and 3.3 V Mixed-Voltage Operation

Bank-Selectable I/O Voltages—up to 4 Banks per Chip

Single-Ended I/O Standards: LVTTL, LVCMOS 3.3 V /

2.5 V / 1.8 V / 1.5 V, 3.3 V PCI / 3.3 V PCI-X, and LVCMOS

2.5 V / 5.0 V Input

Differential I/O Standards: LVPECL, LVDS, B-LVDS, and

M-LVDS (A3P250 and A3P1000)

I/O Registers on Input, Output, and Enable Paths

Hot-Swappable and Cold-Sparing I/Os

Programmable Output Slew Rate and Drive Strength

Weak Pull-Up/-Down

IEEE 1149.1 (JTAG) Boundary Scan Test

Pin-Compatible Packages across the Automotive ProASIC

Family

High Capacity

• 60 k to 1 M System Gates

• Up to 144 kbits of SRAM

• Up to 300 User I/Os

Reprogrammable Flash Technology

• 130-nm, 7-Layer Metal (6 Copper), Flash-Based CMOS

Automotive Process

• Live-at-Power-Up (LAPU) Level 0 Support

• Single-Chip Solution

• Retains Programmed Design when Powered Off

On-Chip User Nonvolatile Memory

• 1 kbit of FlashROM with Synchronous Interface

High Performance

• 350 MHz System Performance

• 3.3 V, 66 MHz 64-Bit PCI

Clock Conditioning Circuit (CCC) and PLL

• Six CCC Blocks, One with an Integrated PLL

• Configurable

Phase

Shift, Multiply/Divide,

Delay

Capabilities, and External Feedback

• Wide Input Frequency Range (1.5 MHz up to 350 MHz)

In-System Programming (ISP) and Security

• Secure ISP Using On-Chip 128-Bit Advanced Encryption

Standard (AES) Decryption via JTAG (IEEE 1532–compliant)

• FlashLock

to Secure FPGA Contents (anti-tampering)

SRAMs

• Variable-Aspect-Ratio 4,608-Bit RAM Blocks (×1, ×2, ×4, ×9,

and ×18 organizations available)

Automotive ProASIC3 Product Family

ProASIC3 Devices

System Gates

VersaTiles (D-flip-flops)

RAM kbits (1,024 bits)

4,608-Bit Blocks

FlashROM Bits

Secure (AES) ISP

Integrated PLL in CCCs

VersaNet Globals*

I/O Banks

Maximum User I/Os

Package Pins

VQFP

FBGA

A3P060

60 k

1,536

Yes

VQ100

FG144

A3P125

125 k

3,072

Yes

133

VQ100

FG144

A3P250

250 k

6,144

Yes

157

VQ100

FG144, FG256

A3P1000

24,576

144

Yes

300

FG144, FG256, FG484

Note:

*Six chip-wide (main) globals and three additional global networks in each quadrant are available.

January 2008

1 – Automotive ProASIC3 Device Family Overview

General Description

Automotive ProASIC3 nonvolatile flash technology gives automotive system designers the

advantage of a secure, low-power, single-chip solution that is live at power-up (LAPU). Automotive

ProASIC3 is reprogrammable and offers time-to-market benefits at an ASIC-level unit cost. These

features enable designers to create high-density systems using existing ASIC or FPGA design flows

and tools.

Automotive ProASIC3 devices offer 1 kbit of on-chip, reprogrammable, nonvolatile FlashROM

storage as well as clock conditioning circuitry based on an integrated phase-locked loop (PLL).

Automotive ProASIC3 devices have up to 1 million system gates, supported with up to 144 kbits of

SRAM and up to 300 user I/Os.

Automotive ProASIC3 devices are the only firm-error-immune automotive grade FPGAs. Firm-error

immunity makes them ideally suited for demanding applications in powertrain, safety, and

telematics-based subsystems, where firm-error failure is not an option.

Firm errors in SRAM-based FPGAs can result in high defect levels in field-deployed systems. These

unavoidable defects must be considered separately from standard defects and failure mechanisms

when looking at overall system quality and reliability.

Flash Advantages

Reduced Cost of Ownership

Advantages to the designer extend beyond low unit cost, performance, and ease of use. Unlike

SRAM-based FPGAs, flash-based Automotive ProASIC3 devices allow all functionality to be live at

power-up; no external boot PROM is required. On-board security mechanisms prevent access to all

the programming information and enable secure remote updates of the FPGA logic. Flash-based

FPGAs are LAPU Class 0 devices, offering the lowest available power in a single-chip device and

providing firm-error immunity. The Automotive ProASIC3 family device architecture mitigates the

need for ASIC migration at high user volumes. This makes the Automotive ProASIC3 family a cost-

effective ASIC replacement solution, especially for automotive applications.

Security

The nonvolatile, flash-based Automotive ProASIC3 devices do not require a boot PROM, so there is

no vulnerable external bitstream that can be easily copied. Automotive ProASIC3 devices

incorporate FlashLock, which provides a unique combination of reprogrammability and design

security without external overhead, advantages that only an FPGA with nonvolatile flash

programming can offer.

Automotive ProASIC3 devices utilize a 128-bit flash-based lock and a separate AES key to secure

programmed intellectual property and configuration data. In addition, all FlashROM data in

Automotive ProASIC3 devices can be encrypted prior to loading, using the industry-leading AES-

128 (FIPS192) bit block cipher encryption standard. The AES was adopted by the National Institute

of Standards and Technology (NIST) in 2000 and replaces the 1977 DES standard. Automotive

ProASIC3 devices have a built-in AES decryption engine and a flash-based AES key that make them

the most comprehensive programmable logic device security solution available today. Automotive

ProASIC3 devices with AES-based security allow for secure, remote field updates over public

networks such as the Internet, and ensure that valuable IP remains out of the hands of system

overbuilders, system cloners, and IP thieves. The contents of a programmed Automotive ProASIC3

device cannot be read back, although secure design verification is possible. Additionally, security

features of Automotive ProASIC3 devices provide anti-tampering protection.

Security, built into the FPGA fabric, is an inherent component of the Automotive ProASIC3 family.

The flash cells are located beneath seven metal layers, and many device design and layout

v1.0

1-1

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