User’s Manual
V850ES/SJ2, V850ES/SJ2-H
32-bit Single-Chip Microcontrollers
Hardware
V850ES/SJ2:
μPD703264
μPD703274
μPD703284
μPD70F3284
μPD703264Y
μPD703274Y
μPD703284Y
μPD70F3284Y
μPD703265
μPD703275
μPD703285
μPD70F3286
μPD703265Y
μPD703275Y
μPD703285Y
μPD70F3286Y
μPD703266
μPD703276
μPD703286
μPD70F3288
μPD703266Y
μPD703276Y
μPD703286Y
μPD70F3288Y
μPD70F3264
μPD70F3274
μPD703287
μPD70F3264Y μPD70F3274Y μPD703287Y
μPD70F3266
μPD70F3276
μPD703288
μPD70F3266Y μPD70F3276Y μPD703288Y
V850ES/SJ2-H:
μPD703265HY μPD703275HY μPD703285HY μPD703287HY
μPD703266HY μPD703276HY μPD703286HY μPD703288HY
μPD70F3266HY μPD70F3276HY μPD70F3286HY μPD70F3288HY
Document No. U16603EJ5V1UD00 (5th edition)
Date Published March 2008 N
2003, 2008
Printed in Japan
[MEMO]
2
User’s Manual U16603EJ5V1UD
NOTES FOR CMOS DEVICES
1
VOLTAGE APPLICATION WAVEFORM AT INPUT PIN
Waveform distortion due to input noise or a reflected wave may cause malfunction. If the input of the
CMOS device stays in the area between V
IL
(MAX) and V
IH
(MIN) due to noise, etc., the device may
malfunction. Take care to prevent chattering noise from entering the device when the input level is fixed,
and also in the transition period when the input level passes through the area between V
IL
(MAX) and
V
IH
(MIN).
2
HANDLING OF UNUSED INPUT PINS
Unconnected CMOS device inputs can be cause of malfunction. If an input pin is unconnected, it is
possible that an internal input level may be generated due to noise, etc., causing malfunction. CMOS
devices behave differently than Bipolar or NMOS devices. Input levels of CMOS devices must be fixed
high or low by using pull-up or pull-down circuitry. Each unused pin should be connected to V
DD
or GND
via a resistor if there is a possibility that it will be an output pin. All handling related to unused pins must
be judged separately for each device and according to related specifications governing the device.
3
PRECAUTION AGAINST ESD
A strong electric field, when exposed to a MOS device, can cause destruction of the gate oxide and
ultimately degrade the device operation. Steps must be taken to stop generation of static electricity as
much as possible, and quickly dissipate it when it has occurred.
Environmental control must be
adequate. When it is dry, a humidifier should be used. It is recommended to avoid using insulators that
easily build up static electricity. Semiconductor devices must be stored and transported in an anti-static
container, static shielding bag or conductive material. All test and measurement tools including work
benches and floors should be grounded.
The operator should be grounded using a wrist strap.
Semiconductor devices must not be touched with bare hands. Similar precautions need to be taken for
PW boards with mounted semiconductor devices.
4
STATUS BEFORE INITIALIZATION
Power-on does not necessarily define the initial status of a MOS device. Immediately after the power
source is turned ON, devices with reset functions have not yet been initialized. Hence, power-on does
not guarantee output pin levels, I/O settings or contents of registers. A device is not initialized until the
reset signal is received. A reset operation must be executed immediately after power-on for devices
with reset functions.
5
POWER ON/OFF SEQUENCE
In the case of a device that uses different power supplies for the internal operation and external
interface, as a rule, switch on the external power supply after switching on the internal power supply.
When switching the power supply off, as a rule, switch off the external power supply and then the
internal power supply. Use of the reverse power on/off sequences may result in the application of an
overvoltage to the internal elements of the device, causing malfunction and degradation of internal
elements due to the passage of an abnormal current.
The correct power on/off sequence must be judged separately for each device and according to related
specifications governing the device.
6
INPUT OF SIGNAL DURING POWER OFF STATE
Do not input signals or an I/O pull-up power supply while the device is not powered. The current
injection that results from input of such a signal or I/O pull-up power supply may cause malfunction and
the abnormal current that passes in the device at this time may cause degradation of internal elements.
Input of signals during the power off state must be judged separately for each device and according to
related specifications governing the device.
User’s Manual U16603EJ5V1UD
3
IECUBE is a registered trademark of NEC Corporation in Japan and Germany.
MINICUBE is a registered trademark of NEC Electronics Corporation in Japan and Germany or a trademark in
the United States of America.
EEPROM, IEBus, and Inter Equipment Bus are trademarks of NEC Electronics Corporation.
Windows and Windows NT are either registered trademarks or trademarks of Microsoft Corporation in the
United States and/or other countries.
PC/AT is a trademark of International Business Machines Corporation.
SPARCstation is a trademark of SPARC International, Inc.
Solaris and SunOS are trademarks of Sun Microsystems, Inc.
4
User’s Manual U16603EJ5V1UD
These commodities, technology or software, must be exported in accordance
with the export administration regulations of the exporting country.
Diversion contrary to the law of that country is prohibited.
•
The information in this document is current as of October, 2007. The information is subject to
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•
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•
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•
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•
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•
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M8E 02. 11-1
User’s Manual U16603EJ5V1UD
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