CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation
of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
NOTE:
1. The package thermal impedance is calculated in accordance with JESD 51-7.
DC Electrical Specifications
TEST
CONDITIONS
PARAMETER
HC TYPES
High Level Input
Voltage
V
IH
-
-
2
4.5
6
Low Level Input
Voltage
V
IL
-
-
2
4.5
6
High Level Output
Voltage
CMOS Loads
High Level Output
Voltage
TTL Loads
Low Level Output
Voltage
CMOS Loads
Low Level Output
Voltage
TTL Loads
Input Leakage
Current
Quiescent Device
Current
I
I
I
CC
V
CC
or
GND
V
CC
or
GND
V
OL
V
IH
or
V
IL
V
OH
V
IH
or
V
IL
-0.02
-0.02
-0.02
-6
-7.8
0.02
0.02
0.02
6
7.8
-
0
2
4.5
6
4.5
6
2
4.5
6
4.5
6
6
6
1.5
3.15
4.2
-
-
-
1.9
4.4
5.9
3.98
5.48
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
0.5
1.35
1.8
-
-
-
-
-
0.1
0.1
0.1
0.26
0.26
±0.1
8
1.5
3.15
4.2
-
-
-
1.9
4.4
5.9
3.84
5.34
-
-
-
-
-
-
-
-
-
-
0.5
1.35
1.8
-
-
-
-
-
0.1
0.1
0.1
0.33
0.33
±1
80
1.5
3.15
4.2
-
-
-
1.9
4.4
5.9
3.7
5.2
-
-
-
-
-
-
-
-
-
-
0.5
1.35
1.8
-
-
-
-
-
0.1
0.1
0.1
0.4
0.4
±1
160
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
µA
µA
SYMBOL
V
I
(V)
I
O
(mA) V
CC
(V)
MIN
25
o
C
TYP
MAX
-40
o
C TO 85
o
C
MIN
MAX
-55
o
C TO 125
o
C
MIN
MAX
UNITS
4
CD54/74HC365, CD54/74HCT365, CD54/74HC366
DC Electrical Specifications
(Continued)
TEST
CONDITIONS
PARAMETER
Three-State Leakage
Current
HCT TYPES
High Level Input
Voltage
Low Level Input
Voltage
High Level Output
Voltage
CMOS Loads
High Level Output
Voltage
TTL Loads
Low Level Output
Voltage
CMOS Loads
Low Level Output
Voltage
TTL Loads
Input Leakage
Current
Quiescent Device
Current
Additional Quiescent
Device Current Per
Input Pin: 1 Unit Load
(Note 2)
Three-State Leakage
Current
NOTE:
2. For dual-supply systems theoretical worst case (V
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Microcontroller MCU
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