Edits to Burn-In Circuit Figure .......................................................7
Edits to Application Information ....................................................8
Rev. H | Page 2 of 21
Data Sheet
GENERAL DESCRIPTION
(Continued from Page 1)
PSRR and CMRR exceed 120 dB. These characteristics, coupled
with long-term drift of 0.2 µV/month, allow the circuit designer
to achieve performance levels previously attained only by discrete
designs.
Low cost, high volume production of
OP27
is achieved by
using an on-chip Zener zap-trimming network. This reliable
and stable offset trimming scheme has proven its effectiveness
over many years of production history.
OP27
The
OP27
provides excellent performance in low noise,
high accuracy amplification of low level signals. Applications
include stable integrators, precision summing amplifiers,
precision voltage threshold detectors, comparators, and
professional audio circuits such as tape heads and microphone
preamplifiers.
Rev. H | Page 3 of 21
OP27
SPECIFICATIONS
ELECTRICAL CHARACTERISTICS
V
S
= ±15 V, T
A
= 25°C, unless otherwise noted.
Table 1.
Parameter
INPUT OFFSET VOLTAGE
1
LONG-TERM V
OS
STABILITY
2, 3
INPUT OFFSET CURRENT
INPUT BIAS CURRENT
INPUT NOISE VOLTAGE
3, 4
INPUT NOISE
Voltage Density
3
INPUT NOISE
Current Density
3
INPUT RESISTANCE
Differential Mode
5
Common Mode
INPUT VOLTAGE RANGE
COMMON-MODE REJECTION RATIO
POWER SUPPLY REJECTION RATIO
LARGE SIGNAL VOLTAGE GAIN
OUTPUT VOLTAGE SWING
SLEW RATE
6
GAIN BANDWIDTH PRODUCT
6
OPEN-LOOP OUTPUT RESISTANCE
POWER CONSUMPTION
OFFSET ADJUSTMENT RANGE
1
2
Data Sheet
Symbol
V
OS
V
OS
/Time
I
OS
I
B
e
n p-p
e
n
Test Conditions
i
n
0.1 Hz to 10 Hz
f
O
= 10 Hz
f
O
= 30 Hz
f
O
= 1000 Hz
f
O
= 10 Hz
f
O
= 30 Hz
f
O
= 1000 Hz
OP27A/OP27E
Min
Typ
Max
10
25
0.2
1.0
7
35
±10
±40
0.08
0.18
3.5
5.5
3.1
4.5
3.0
3.8
1.7
4.0
1.0
2.3
0.4
0.6
1.3
±11.0
114
1000
800
±12.0
±10.0
1.7
5.0
6
3
±12.3
126
1
1800
1500
±13.8
±11.5
2.8
8.0
70
90
±4.0
Min
OP27G
Typ
30
0.4
12
±15
0.09
3.8
3.3
3.2
1.7
1.0
0.4
4
2
±12.3
120
2
1500
1500
±13.5
±11.5
2.8
8.0
70
100
±4.0
Max
100
2.0
75
±80
0.25
8.0
5.6
4.5
0.6
Unit
µV
µV/M
O
nA
nA
µV p-p
nV/√Hz
nV/√Hz
nV/√Hz
pA/√Hz
pA/√Hz
pA/√Hz
MΩ
GΩ
V
dB
µV/V
V/mV
V/mV
V
V
V/µs
MHz
Ω
mW
mV
R
IN
R
INCM
IVR
CMRR
PSRR
A
VO
V
O
SR
GBW
R
O
P
d
0.7
±11.0
100
10
700
600
±11.5
±10.0
1.7
5.0
140
V
CM
= ±11 V
V
S
= ±4 V to ±18 V
R
L
≥ 2 kΩ, V
O
= ±10 V
R
L
≥ 600 Ω, V
O
= ±10 V
R
L
≥ 2 kΩ
R
L
≥ 600 Ω
R
L
≥ 2 kΩ
V
O
= 0, I
O
= 0
V
O
R
P
= 10 kΩ
20
170
Input offset voltage measurements are performed approximately 0.5 seconds after application of power. A/E grades guaranteed fully warmed up.
Long-term input offset voltage stability refers to the average trend line of V
OS
vs. time over extended periods after the first 30 days of operation. Excluding the initial
hour of operation, changes in V
OS
during the first 30 days are typically 2.5 µV. Refer to the Typical Performance Characteristics section.
3
Sample tested.
4
See voltage noise test circuit (Figure 31).
5
Guaranteed by input bias current.
6
Guaranteed by design.
Rev. H | Page 4 of 21
Data Sheet
V
S
= ±15 V, −55°C ≤ T
A
≤ 125°C, unless otherwise noted.
Table 2.
Parameter
INPUT OFFSET VOLTAGE
1
AVERAGE INPUT OFFSET DRIFT
INPUT OFFSET CURRENT
INPUT BIAS CURRENT
INPUT VOLTAGE RANGE
COMMON-MODE REJECTION RATIO
POWER SUPPLY REJECTION RATIO
LARGE SIGNAL VOLTAGE GAIN
OUTPUT VOLTAGE SWING
1
OP27
Symbol
V
OS
TCV
OS2
TCV
OSn3
I
OS
IB
IVR
CMRR
PSRR
A
VO
V
O
Test Conditions
Min
OP27A
Typ
30
0.2
15
±20
±11.5
122
2
1200
±13.5
Max
60
0.6
50
±60
Unit
µV
µV/°C
nA
nA
V
dB
µV/V
V/mV
V
V
CM
= ±10 V
V
S
= ±4.5 V to ±18 V
R
L
≥ 2 kΩ, V
O
= ±10 V
R
L
≥ 2 kΩ
±10.3
108
600
±11.5
16
Input offset voltage measurements are performed by automated test equipment approximately 0.5 seconds after application of power. A/E grades guaranteed fully
warmed up.
2
The TCV
OS
performance is within the specifications unnulled or when nulled with R
P
= 8 kΩ to 20 kΩ. TCV
OS
is 100% tested for A/E grades, sample tested for G grades.
3
Guaranteed by design.
V
S
= ±15 V, −25°C ≤ T
A
≤ 85°C for
OP27J
and
OP27Z
and −40°C ≤ T
A
≤ 85°C for
OP27GS,
unless otherwise noted.
Table 3.
Parameter
INPUT ONSET VOLTAGE
AVERAGE INPUT OFFSET DRIFT
INPUT OFFSET CURRENT
INPUT BIAS CURRENT
INPUT VOLTAGE RANGE
COMMON-MODE REJECTION RATIO
POWER SUPPLY REJECTION RATIO
LARGE SIGNAL VOLTAGE GAIN
OUTPUT VOLTAGE SWING
1
2
Symbol
V
OS
TCV
OS1
TCV
OSn2
I
OS
I
B
IVR
CMRR
PSRR
A
VO
V
O
Test Conditions
Min
V
CM
= ±10 V
V
S
= ±4.5 V to ±18 V
R
L
≥ 2 kΩ, V
O
= ±10 V
R
L
≥ 2 kΩ
±10.5
110
750
±11.7
OP27E
Typ
20
0.2
0.2
10
±14
±11.8
124
2
1500
±13.6
Max
50
0.6
0.6
50
±60
Min
±10.5
96
15
450
±11.0
OP27G
Typ
55
04
04
20
±25
±11.8
118
2
1000
±13.3
Max
220
1.8
1.8
135
±150
32
Unit
µV
µV/°C
µV/°C
nA
nA
V
dB
µV/V
V/mV
V
The TCV
OS
performance is within the specifications unnulled or when nulled with R
P
= 8 kΩ to 20 kΩ. TCV
OS
is 100% tested for A/E grades, sample tested for C/G grades.
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