.........................................–0.5V to +7.0V
Output Current into Outputs (LOW)............................. 20 mA
Static Discharge Voltage ........................................... >2001V
(per MIL-STD-883, Method 3015)
Latch-Up Current..................................................... >200 mA
Operating Range
Range
Military
[3]
Ambient
Temperature
–55
°
C to +125
°
C
V
CC
5V
±
10%
Electrical Characteristic
s
Over the Operating Range
[4]
7C187A–15
Parameter
V
OH
V
OL
V
IH
V
IL
I
IX
I
OZ
I
OS
I
CC
I
SB1
I
SB2
Description
Output HIGH Voltage
Output LOW Voltage
Input HIGH Voltage
Input LOW Voltage
[2]
Input Load Current
Output Leakage
Current
Output Short
Circuit Current
[5]
V
CC
Operating
Supply Current
Automatic CE Power-
Down Current
[6]
Automatic CE Power-
Down Current
[6]
GND
≤
V
I
≤
V
CC
GND
≤
V
O
≤
V
CC
, Output Disabled
V
CC
= Max., V
OUT
= GND
V
CC
= Max., I
OUT
= 0 mA
Max. V
CC
, CE
≥
V
IH
Max. V
CC
, CE
≥
V
CC
– 0.3V,
V
IN
≥
V
CC
– 0.3V or
V
IN
≤
0.3V
Mil
Mil
Mil
Test Conditions
V
CC
= Min., I
OH
= –4.0 mA
V
CC
= Min., I
OL
=12.0 mA
Mil
2.2
–0.5
–5
–5
Min.
2.4
0.4
V
CC
0.8
+5
+5
–350
160
40
20
2.2
–0.5
–5
–5
Max.
7C187A–20
Min.
2.4
0.4
V
CC
0.8
+5
+5
–350
90
40
20
Max.
Unit
V
V
V
V
µA
µA
mA
mA
mA
mA
Shaded area contains preliminary information.
Notes:
2. V
IL
(min.) = –3.0V for pulse durations less than 30 ns.
3. T
A
is the “instant on” case temperature.
4. See the last page of this specification for Group A subgroup testing information.
5. Not more than 1 output should be shorted at one time. Duration of the short circuit should not exceed 30 seconds.
6. A pull-up resistor to V
CC
on the CE input is required to keep the device deselected during V
CC
power-up, otherwise I
SB
will exceed values given.
2
CY7C187A
Electrical Characteristic
s
Over the Operating Range
[4]
(continued)
7C187A–25
Parameter
V
OH
V
OL
V
IH
V
IL
I
IX
I
OZ
I
OS
I
CC
I
SB1
I
SB2
Description
Output HIGH Voltage
Output LOW Voltage
Input HIGH Voltage
Input LOW Voltage
[2]
7C187A–35
Min.
2.4
Max.
0.4
2.2
–3.0
–5
–5
V
CC
0.8
+5
+5
–350
80
30
20
Unit
V
V
V
V
µA
µA
mA
mA
mA
mA
Test Conditions
V
CC
= Min., I
OH
= –4.0 mA
V
CC
= Min., I
OL
=8.0 mA
Mil
Min.
2.4
Max.
0.4
2.2
–3.0
GND < V
I
< V
CC
GND < V
O <
V
CC
, Output Disabled
V
CC
= Max., V
OUT
= GND
V
CC
= Max., I
OUT
= 0 mA
Max. V
CC
, CE > V
IH
Max. V
CC
, CE > V
CC
– 0.3V,
V
IN
> V
CC
– 0.3V or
V
IN
< 0.3V
Mil
Mil
Mil
–5
–5
V
CC
0.8
+5
+5
–350
80
40
20
Input Load Current
Output Leakage Current
Output Short
Circuit Current
[5]
V
CC
Operating
Supply Current
Automatic CE
Power-Down Current
[6]
Automatic CE
Power-Down Current
[6]
Capacitance
[7]
Parameter
C
IN
C
OUT
Description
Input Capacitance
Output Capacitance
Test Conditions
T
A
= 25°C, f = 1 MHz,
V
CC
= 5.0V
Max.
10
10
Unit
pF
pF
Note:
7. Tested initially and after any design or process changes that may affect these parameters.
AC Test Loads and Waveforms
R1 481Ω
5V
OUTPUT
30 pF
INCLUDING
JIG AND
SCOPE
R2
255Ω
5V
OUTPUT
5 pF
INCLUDING
JIG AND
SCOPE
R2
255Ω
R1 481Ω
ALL INPUT PULSES
3.0V
10%
GND
≤
5 ns
≤
5 ns
C187A–5
90%
90%
10%
(a)
(b)
C187A–4
Equivalent to:
THÉVENIN EQUIVALENT
167Ω
OUTPUT
1.73V
3
CY7C187A
Switching Characteristics
Over the Operating Range
[4, 8
]
7C187A–15
Parameter
READ CYCLE
t
RC
t
AA
t
OHA
t
ACE
t
LZCE
t
HZCE
t
PU
t
PD
t
WC
t
SCE
t
AW
t
HA
t
SA
t
PWE
t
SD
t
HD
t
LZWE
t
HZWE
Read Cycle Time
Address to Data Valid
Output Hold from
Address Change
CE LOW to Data Valid
CE LOW to Low Z
[9]
CE HIGH toHigh Z
[9,10]
7C187A–20
Min.
20
Max.
7C187A–25
Min.
25
Max.
7C187A–35
Min.
35
Max.
Unit
ns
35
3
ns
ns
35
5
15
0
20
25
25
25
0
0
20
15
0
5
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
10
ns
Description
Min.
15
Max.
15
3
15
3
8
0
15
15
10
10
0
0
10
7
0
3
7
20
15
15
0
0
15
10
0
5
0
5
3
20
3
20
5
8
0
20
20
20
20
0
0
15
10
0
5
7
25
25
10
20
CE LOW to Power-Up
CE HIGH to Power-Down
Write Cycle Time
CE LOW to Write End
Address Set-Up to
Write End
Address Hold from
Write End
Address Set-Up to
Write Start
WE Pulse Width
Data Set-Up to Write End
Data Hold from Write End
WE HIGH to Low Z
[9]
WRITE CYCLE
[11]
WE LOW to High Z
[9,10]
7
Shaded area contains preliminary information.
Notes:
8. Test conditions assume signal transition time of 5 ns or less, timing reference levels of 1.5V, input pulse levels of 0 to 3.0V, and output loading of the specified
I
OL
/I
OH
and 30-pF load capacitance.
9. At any given temperature and voltage condition, t
HZCE
is less than t
LZCE
for any given device.
10. t
HZCE
and t
HZWE
are specified with C
L
= 5 pF as in part (b) of AC Test Loads. Transition is measured
±500
mV from steady-state voltage.
11. The internal write time of the memory is defined by the overlap of CE LOW and WE LOW. Both signals must be LOW to initiate a write and either signal can
terminate a write by going HIGH. The data input set-up and hold timing should be referenced to the rising edge of the signal that terminates the write.
4
CY7C187A
Switching Waveforms
Read Cycle No. 1
[12,13]
t
RC
ADDRESS
t
OHA
DATA OUT
PREVIOUS DATA VALID
t
AA
DATA VALID
C187A–6
Read Cycle No.2
[12,14]
CE
t
ACE
t
LZCE
DATA OUT
HIGH IMPEDANCE
t
RC
t
HZCE
DATA VALID
t
PD
HIGH
IMPEDANCE
V
CC
SUPPLY
CURRENT
t
PU
50%
ICC
50%
ISB
C187A–7
Write Cycle No.1 (WE Controlled)
[11]
t
WC
ADDRESS
t
SCE
CE
t
SA
WE
t
SD
DATA IN
DATA
IN
VALID
t
HZWE
DATA OUT
DATA UNDEFINED
C187A–8
t
AW
t
PWE
t
HA
t
HD
t
LZWE
HIGH IMPEDANCE
Notes:
12. WE is HIGH for read cycle.
13. Device is continuously selected, CE = V
IL
.
14. Address valid prior to or coincident with CE transition LOW.
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