OBSOLETE
4, 8 MEG x 36
ECC-OPTIMIZED DRAM SIMMs
DRAM
MODULE
FEATURES
• Four-CAS#, ECC-optimized configuration in a 72-pin,
single in-line memory module (SIMM)
• 16MB (4 Meg x 36) and 32MB (8 Meg x 36)
• High-performance CMOS silicon-gate process
• Single 5V
±10%
power supply
• All inputs, outputs and clocks are TTL-compatible
• Refresh modes: RAS#-ONLY, CAS#-BEFORE-RAS#
(CBR) and HIDDEN
• 2,048-cycle refresh distributed across 32ms
• Extended Data-Out (EDO) PAGE MODE access
MT9D436 X
MT18D836 X
For the latest data sheet revisions, please refer to the Micron
Web site: www.micron.com/mti/msp/html/datasheet.html
PIN ASSIGNMENT (Front View)
72-Pin SIMM
4 Meg x 36 (shown)
8 Meg x 36
1
36
37
72
OPTIONS
• Timing
50ns access
60ns access
• Package
72 -pin SIMM
MARKING
-5
-6
M
KEY TIMING PARAMETERS
SPEED
-5
-6
t
RC
t
RAC
t
PC
t
AA
t
CAC
t
CAS
84ns
104ns
50ns
60ns
20ns
25ns
25ns
30ns
13ns
15ns
8ns
10ns
PART NUMBERS
PART NUMBER
MT9D436M-x X
MT18D836M-x X
x = speed
CONFIGURATION
4 Meg x 36
8 Meg x 36
FEATURES
4 CAS#, ECC
4 CAS#, ECC
MODE
EDO
EDO
PIN SYMBOL
PIN SYMBOL
PIN SYMBOL
PIN SYMBOL
1
V
SS
19
A10
37
DQ18
55
DQ13
2
DQ1
20
DQ5
38
DQ36
56
DQ31
3
DQ19
21
DQ23
39
V
SS
57
DQ14
4
DQ2
22
DQ6
40
CAS0#
58
DQ32
5
DQ20
23
DQ24
41
CAS2#
59
V
DD
6
DQ3
24
DQ7
42
CAS3#
60
DQ33
7
DQ21
25
DQ25
43
CAS1#
61
DQ15
8
DQ4
26
DQ8
44
RAS0#
62
DQ34
9
DQ22
27
DQ26
45 NC/RAS1#* 63
DQ16
10
V
DD
28
A7
46
NC
64
DQ35
11
NC
29
NC (A11)
47
WE#
65
DQ17
12
A0
30
V
DD
48
NC
66
NC
13
A1
31
A8
49
DQ10
67
PRD1
14
A2
32
A9
50
DQ28
68
PRD2
15
A3
33 NC/RAS3#* 51
DQ11
69
PRD3
16
A4
34
RAS2#
52
DQ29
70
PRD4
17
A5
35
DQ27
53
DQ12
71
NC
18
A6
36
DQ9
54
DQ30
72
V
SS
*32MB version only
NOTE:
Symbols in parentheses are not used on these modules but may be used
for other modules in this product family. They are for reference only.
GENERAL DESCRIPTION
The MT9D436 X and MT18D836 X are randomly ac-
cessed, 16MB and 32MB solid-state memories organized in
a x36 configuration. These modules are designed for sys-
tems that utilize ECC and do not conduct single-byte ac-
cesses. These modules do not support parity functionality.
During READ or WRITE cycles, each bit is uniquely
addressed through 20 address bits that are entered 10 bits
(A0 -A9) at a time. RAS# is used to latch the first 10 bits and
CAS# the latter 10 bits. READ or WRITE cycles are selected
with the WE# input. A logic HIGH on WE# dictates read
mode, while a logic LOW on WE# dictates write mode.
During a WRITE cycle, data-in (D) is latched by the falling
edge of WE# or CAS#, whichever occurs last. EARLY WRITE
4, 8 Meg x 36 ECC-Optimized DRAM SIMMs
DM65.p65 – Rev. 9/98
occurs when WE# goes LOW prior to CAS# going LOW,
and the output pin(s) remain open (High-Z) until the next
CAS# cycle.
EDO PAGE MODE
EDO PAGE MODE is an accelerated FAST-PAGE-MODE
cycle. The primary advantage of EDO is the availability of
data-out even after CAS# goes back HIGH. EDO provides
for CAS# precharge time (
t
CP) to occur without the output
data going invalid. This elimination of CAS# output control
provides for pipelined READs.
FAST-PAGE-MODE modules have traditionally turned
the output buffers off (High-Z) with the rising edge of
CAS#. EDO operates like FAST-PAGE-MODE READs, ex-
cept data will be held valid or become valid after CAS# goes
1
Micron Technology, Inc., reserves the right to change products or specifications without notice.
©1998,
Micron Technology, Inc.
Micron is a registered trademark of Micron Technology, Inc.
OBSOLETE
4, 8 MEG x 36
ECC-OPTIMIZED DRAM SIMMs
EDO PAGE MODE (continued)
HIGH, as long as RAS# is held LOW. (Refer to the
MT4C4M4E8 DRAM data sheet for additional information
on EDO functionality.)
the RAS# HIGH time. Memory cell data is retained in its
correct state by maintaining power and executing any
RAS# cycle (READ, WRITE) or RAS# REFRESH cycle (RAS#
ONLY, CBR or HIDDEN) so that all 2,048 combinations of
RAS# addresses are executed at least every 32ms, regard-
less of sequence. The CBR REFRESH cycle will invoke the
refresh counter for automatic RAS# addressing.
REFRESH
Returning RAS# and CAS# HIGH terminates a memory
cycle and decreases chip current to a reduced standby level.
Also, the chip is preconditioned for the next cycle during
JEDEC-DEFINED
PRESENCE-DETECT – MT9D436 (16MB)
SYMBOL
PRD1
PRD2
PRD3
PRD4
PIN
67
68
69
70
-5
Vss
NC
Vss
Vss
-6
Vss
NC
NC
NC
JEDEC-DEFINED
PRESENCE-DETECT – MT18D836 (32MB)
SYMBOL
PRD1
PRD2
PRD3
PRD4
PIN
67
68
69
70
-5
NC
Vss
Vss
Vss
-6
NC
Vss
NC
NC
4, 8 Meg x 36 ECC-Optimized DRAM SIMMs
DM65.p65 – Rev. 9/98
2
Micron Technology, Inc., reserves the right to change products or specifications without notice.
©1998,
Micron Technology, Inc.
OBSOLETE
4, 8 MEG x 36
ECC-OPTIMIZED DRAM SIMMs
FUNCTIONAL BLOCK DIAGRAM
MT9D436 (16MB)
DQ1
DQ8
DQ9, 18, 27, 36
DQ10
DQ17
DQ1 - 4
WE#
U1
CAS0#
RAS0#
CAS#
RAS#
OE# A0–A10
DQ1 - 4
WE#
U2
CAS#
RAS#
OE# A0–A10
DQ1 - 4
WE#
U5
CAS#
RAS#
OE# A0–A10
DQ1 - 4
WE#
U3
CAS#
RAS#
OE# A0–A10
DQ1 - 4
WE#
U4
CAS#
RAS#
OE# A0–A10
11
CAS1#
WE#
11
11
11
11
DQ19
DQ26
DQ28
DQ35
DQ1 - 4
WE#
U6
CAS2#
RAS2#
CAS#
RAS#
OE# A0–A10
DQ1 - 4
WE#
U7
CAS#
RAS#
OE# A0–A10
DQ1 - 4
WE#
U3
U8
CAS#
RAS#
OE# A0–A10
DQ1 - 4
WE#
U9
CAS#
RAS#
OE# A0–A10
CAS3#
A0–A10
11
11
11
11
V
DD
V
SS
U1-U9
U1-U9
U1-U9 = 4 Meg x 4 DRAMs
4, 8 Meg x 36 ECC-Optimized DRAM SIMMs
DM65.p65 – Rev. 9/98
3
Micron Technology, Inc., reserves the right to change products or specifications without notice.
©1998,
Micron Technology, Inc.
OBSOLETE
4, 8 MEG x 36
ECC-OPTIMIZED DRAM SIMMs
FUNCTIONAL BLOCK DIAGRAM
MT18D836 (32MB)
DQ1
DQ8
DQ9, 18, 27, 36
DQ10
DQ17
DQ1 - 4
WE#
U1
CAS0#
RAS0#
CAS#
RAS#
OE# A0–A10
DQ1 - 4
WE#
U2
CAS#
RAS#
OE# A0–A10
DQ1 - 4
WE#
U5
CAS#
RAS#
OE# A0–A10
DQ1 - 4
WE#
U3
CAS#
RAS#
OE# A0–A10
DQ1 - 4
WE#
U4
CAS#
RAS#
OE# A0–A10
CAS1#
WE#
11
11
11
11
11
DQ19
DQ26
DQ28
DQ35
DQ1 - 4
WE#
U6
CAS2#
RAS2#
CAS#
RAS#
OE# A0–A10
DQ1 - 4
WE#
U7
CAS#
RAS#
OE# A0–A10
DQ1 - 4
WE#
U8
CAS#
RAS#
OE# A0–A10
DQ1 - 4
WE#
U9
CAS#
RAS#
OE# A0–A10
CAS3#
A0–A10
11
11
11
11
DQ1
DQ8
DQ9, 18, 27, 36
DQ10
DQ17
DQ1 - 4
WE#
U10
CAS#
RAS1#
RAS#
OE# A0–A10
DQ1 - 4
WE#
U11
CAS#
RAS#
OE# A0–A10
DQ1 - 4
WE#
U14
CAS#
RAS#
OE# A0–A10
DQ1 - 4
WE#
U12
CAS#
RAS#
OE# A0–A10
DQ1 - 4
WE#
U13
CAS#
RAS#
OE# A0–A10
11
11
11
11
11
DQ19
DQ26
DQ28
DQ35
DQ1 - 4
WE#
CAS# U15
RAS3#
RAS#
OE# A0–A10
DQ1 - 4
WE#
CAS# U16
RAS#
OE# A0–A10
DQ1 - 4
WE#
CAS# U17
RAS#
OE# A0–A10
DQ1 - 4
WE#
CAS# U18
RAS#
OE# A0–A10
11
11
11
11
V
DD
V
SS
U1-U18
U1-U18
U1-U18 = 4 Meg x 4 DRAMs
4, 8 Meg x 36 ECC-Optimized DRAM SIMMs
DM65.p65 – Rev. 9/98
4
Micron Technology, Inc., reserves the right to change products or specifications without notice.
©1998,
Micron Technology, Inc.
OBSOLETE
4, 8 MEG x 36
ECC-OPTIMIZED DRAM SIMMs
ABSOLUTE MAXIMUM RATINGS*
Voltage on V
DD
Supply Relative to V
SS
............. -1V to +7V
Operating Temperature, T
A
(ambient) .......... 0°C to +70°C
Storage Temperature (plastic) .................... -55°C to +125°C
Power Dissipation ............................................................. 9W
Short Circuit Output Current ..................................... 50mA
*Stresses greater than those listed under “Absolute Maxi-
mum Ratings” may cause permanent damage to the device.
This is a stress rating only, and functional operation of the
device at these or any other conditions above those indi-
cated in the operational sections of this specification is not
implied. Exposure to absolute maximum rating conditions
for extended periods may affect reliability.
DC ELECTRICAL CHARACTERISTICS AND OPERATING CONDITIONS
(Notes: 1, 5, 6) (V
DD
= +5V
±10%)
PARAMETER/CONDITION
SUPPLY VOLTAGE
INPUT HIGH VOLTAGE: Logic 1; All inputs
INPUT LOW VOLTAGE: Logic 0; All inputs
INPUT LEAKAGE CURRENT:
Any input 0V
≤
V
IN
≤
5.5V
(All other pins not under test = 0V)
OUTPUT LEAKAGE CURRENT:
(DQ is disabled; 0V
≤
V
OUT
≤
5.5V)
OUTPUT LEVELS:
Output High Voltage (I
OUT
= -5mA)
Output Low Voltage (I
OUT
= 4.2mA)
CAS0#-CAS3#
A0-A10, WE#
RAS0#-RAS3#
DQ1-DQ36
SYMBOL
V
DD
V
IH
V
IL
I
I
1
I
I
2
I
I
3
I
OZ
V
OH
V
OL
MIN
4.5
2.4
-1.0
-12
-36
-10
-10
2.4
–
MAX
5.5
V
DD
+ 1
0.8
12
36
10
10
–
0.4
UNITS
V
V
V
µA
µA
µA
µA
V
V
22
22
22
NOTES
Icc SPECIFICATIONS AND CONDITIONS
(Notes: 1, 5, 6) (V
DD
= +5V
±10%)
PARAMETER/CONDITION
STANDBY CURRENT: (TTL)
(RAS# = CAS# = V
IH
)
STANDBY CURRENT: (CMOS)
(RAS# = CAS# = Other Inputs = V
DD
- 0.2V)
OPERATING CURRENT: Random READ/WRITE
Average power supply current
(RAS#, CAS#, address cycling:
t
RC =
t
RC [MIN])
OPERATING CURRENT: EDO PAGE MODE
Average power supply current
(RAS# = V
IL
, CAS#, address cycling:
t
PC =
t
PC [MIN])
REFRESH CURRENT: RAS#-ONLY
Average power supply current
(RAS# cycling, CAS# = V
IH
:
t
RC =
t
RC [MIN])
REFRESH CURRENT: CBR
Average power supply current
(RAS#, CAS#, address cycling;
t
RC =
t
RC [MIN])
SYMBOL
I
CC
1
I
CC
2
SIZE
16MB
32MB
16MB
32MB
16MB
32MB
16MB
32MB
16MB
32MB
16MB
32MB
-5
9
18
5
9
1,260
1,269
990
999
1,260
1,269
1,260
1,269
MAX
-6
9
18
5
9
1,170
1,179
900
909
1,170
1,179
1,170
1,179
UNITS
mA
mA
mA
3, 21
NOTES
I
CC
3
I
CC
4
mA
3, 21
I
CC
5
mA
3, 21
I
CC
6
mA
3, 4
4, 8 Meg x 36 ECC-Optimized DRAM SIMMs
DM65.p65 – Rev. 9/98
5
Micron Technology, Inc., reserves the right to change products or specifications without notice.
©1998,
Micron Technology, Inc.