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A40MX04-1PQ100MX39

Description
Field Programmable Gate Array, 547-Cell, CMOS, PQFP100,
CategoryProgrammable logic devices    Programmable logic   
File Size3MB,117 Pages
ManufacturerMicrosemi
Websitehttps://www.microsemi.com
Download Datasheet Parametric View All

A40MX04-1PQ100MX39 Overview

Field Programmable Gate Array, 547-Cell, CMOS, PQFP100,

A40MX04-1PQ100MX39 Parametric

Parameter NameAttribute value
Is it Rohs certified?incompatible
MakerMicrosemi
package instructionQFP, QFP100,.7X.9
Reach Compliance Codeunknown
JESD-30 codeR-PQFP-G100
Number of entries69
Number of logical units547
Output times69
Number of terminals100
Maximum operating temperature125 °C
Minimum operating temperature-55 °C
Package body materialPLASTIC/EPOXY
encapsulated codeQFP
Encapsulate equivalent codeQFP100,.7X.9
Package shapeRECTANGULAR
Package formFLATPACK
power supply3.3/5 V
Programmable logic typeFIELD PROGRAMMABLE GATE ARRAY
Certification statusNot Qualified
surface mountYES
technologyCMOS
Temperature levelMILITARY
Terminal formGULL WING
Terminal pitch0.635 mm
Terminal locationQUAD
v6.0
40MX and 42MX FPGA Families
Fe a t ur es
High C apaci t y
Single-Chip ASIC Alternative
3,000 to 54,000 System Gates
Up to 2.5 kbits Configurable Dual-Port SRAM
Fast Wide-Decode Circuitry
Up to 202 User-Programmable I/O Pins
5.6 ns Clock-to-Out
250 MHz Performance
5 ns Dual-Port SRAM Access
100 MHz FIFOs
7.5 ns 35-Bit Address Decode
• Commercial, Military Temperature, and MIL-STD-883
Ceramic Packages
• QML Certification
• Ceramic Devices Available to DSCC SMD
E ase of Int egr at io n
High P er f or m ance
• Mixed-Voltage Operation (5.0V or 3.3V for core and I/Os),
with PCI-Compliant I/Os
• Up to 100% Resource Utilization and 100% Pin Locking
• Deterministic, User-Controllable Timing
• Unique In-System Diagnostic and Verification Capability
with Silicon Explorer II
• Low Power Consumption
• IEEE Standard 1149.1 (JTAG) Boundary Scan Testing
HiR el Feat ur es
• Commercial, Industrial, Automotive, and Military
Temperature Plastic Packages
Pr od uc t P r o f i l e
Device
Capacity
System Gates
SRAM Bits
Logic Modules
Sequential
Combinatorial
Decode
Clock-to-Out
SRAM Modules
(64x4 or 32x8)
Dedicated Flip-Flops
Maximum Flip-Flops
Clocks
User I/O (maximum)
PCI
Boundary Scan Test (BST)
Packages (by pin count)
)
PLCC
PQFP
VQFP
TQFP
CQFP
PBGA
A40MX02
3,000
295
9.5 ns
147
1
57
44, 68
100
80
A40MX04
6,000
547
9.5 ns
273
1
69
44, 68, 84
100
80
A42MX09
14,000
348
336
5.6 ns
348
516
2
104
84
100, 160
100
176
A42MX16
24,000
624
608
6.1 ns
624
928
2
140
84
100, 160, 208
100
176
A42MX24
36,000
954
912
24
6.1 ns
954
1,410
2
176
Yes
Yes
84
160, 208
176
A42MX36
54,000
2,560
1,230
1,184
24
6.3 ns
10
1,230
1,822
6
202
Yes
Yes
208, 240
208, 256
272
J an u a r y 2 0 0 4
1
© 2004 Actel Corporation
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