NM25C041 4K-Bit Serial Interface CMOS EEPROM (Serial Peripheral Interface
(SPI) Synchronous Bus)
March 1999
NM25C041
4K-Bit Serial Interface CMOS EEPROM (Serial
Peripheral Interface (SPI™) Synchronous Bus)
General Description
The NM25C041 is a 4096-bit MODE 1 SPI (Serial Peripheral
Interface) CMOS EEPROM which is designed for high-reliability
non-volatile data storage applications. The SPI interface features
a byte-wide format (all data is transferred in 8-bit words) to
interface with the Motorola 68HC11 microprocessor, or equivalent,
at a 2.1MHz clock transfer rate. (This interface is considered the
fastest serial communication method.) This 4-wire SPI interface
allows the end user full EEPROM functionality while keeping pin
count and space requirements low for maximum PC board space
utilization.
The SPI interface requires four I/O pins on each EEPROM device:
Chip Select (CS), Clock (SCK), Serial Data In (SI), and Serial Data
Out (SO), as well as 2 other control pins: Write Protect (WP) and
HOLD (HOLD). The Write Protect pin can be used to disable the
Write operation and the HOLD pin is used to interrupt the SI
datastream and place the device in a Hold state during micropro-
cessor instruction generation. Please refer to the following dia-
grams and description for more details.
All programming cycles are completely self-timed and do not
require an ERASE, or similar setup, before programming any cells.
Programming can be performed in 3 modes, address (byte) write,
page (4 addresses/bytes) write or
partial
page write. Furthermore,
the EEPROM is provided with 4 levels of write protection wherein
the data, once programmed, cannot be altered. This is controlled
by the Status Register and is described in greater detail within this
datasheet. In order to prevent spurious programming, the EEPROM
has both a Write Enable command, which is immediately disabled
after each programming operation, and a Write Protect (WP) pin,
which must be pulled HIGH to program.
Features
s
2.1 MHz clock rate @ 2.7V to 5.5V
s
4096 bits organized as 512 x 8
s
Multiple chips on the same 3 wire bus with separate chip
select lines
s
Self-timed programming cycle
s
Simultaneous programming of 1 to 4 bytes at a time
s
Status register can be polled during programming to monitor
RDY/BUSY
s
Both the Write Protect (WP) pin and 'auto-write disable after
programming' provides hardware and software write
protection
s
Block write protect feature to protect against accidental
writes
s
Endurance: 1,000,000 data changes
s
Data retention greater than 40 years
s
Packages available: 8-pin DIP and 8-pin SO
Block Diagram
CS
HOLD
SCK
SI
Instruction
Register
Instruction
Decoder
Control Logic
and Clock
Generators
V
CC
V
SS
WP
Address
Counter/
Register
Program
Enable
V
PP
EEPROM Array
4096 Bits
(512 x 8)
High Voltage
Generator
and
Program
Timer
Decoder
1 of 512
Read/Write Amps
Data In/Out Register
8 Bits
Data Out
Buffer
SO
Non-Volatile
Status Register
SPI™ is a trademark of Motorola Corporation.
DS800002-1
© 1999 Fairchild Semiconductor Corporation
NM25C041 Rev. D.1
1
www.fairchildsemi.com
NM25C041 4K-Bit Serial Interface CMOS EEPROM (Serial Peripheral Interface
(SPI) Synchronous Bus)
Absolute Maximum Ratings
(Note 1)
Ambient Storage Temperature
All Input or Output Voltages
with Respect to Ground
Lead Temperature (Soldering, 10 sec.)
ESD Rating
-65°C to +150°C
+6.5V to -0.3V
+300°C
2000V
Operating Conditions
Ambient Operating Temperature
NM25C041
NM25C041E
NM25C041V
Power Supply (V
CC
)
NM25C041
0°C to +70°C
-40°C to +85°C
-40°C to +125°C
4.5V to 5.5V
DC and AC Electrical Characteristics
4.5V
≤
V
CC
≤
5.5V
Symbol
I
CC
I
CCSB
I
IL
I
OL
V
IL
V
IH
V
OL
V
OH
f
OP
t
RI
t
FI
t
CLH
t
CLL
t
CSH
t
CSS
t
DIS
t
HDS
t
CSN
t
DIN
t
HDN
t
PD
t
DH
t
LZ
t
DF
t
HZ
t
WP
Parameter
Operating Current
Standby Current
Input Leakage
Output Leakage
Input Low Voltage
Input High Voltage
Output Low Voltage
Output High Voltage
SCK Frequency
Input Rise Time
Input Fall Time
Clock High Time
Clock Low Time
Min CS High Time
CS Setup Time
Data Setup Time
HOLD Setup Time
CS Hold Time
Data Hold Time
HOLD Hold Time
Output Delay
Output Hold Time
HOLD to Output Low Z
Output Disable Time
HOLD to Output High Z
Write Cycle Time
Conditions
CS = V
IL
CS = V
CC
V
IN
= 0 to V
CC
V
OUT
= GND to V
CC
Min
Max
3
50
Units
mA
µA
µA
µA
V
V
V
V
-1
-1
-0.3
0.7 * V
CC
1
1
V
CC
* 0.3
V
CC
+ 0.3
0.4
I
OL
= 1.6 mA
I
OH
= -0.8 mA
V
CC
- 0.8
2.1
2.0
2.0
(Note 2)
(Note 2)
(Note 3)
190
190
240
240
100
90
240
100
90
C
L
= 200 pF
0
100
C
L
= 200 pF
240
100
1–4 Bytes
10
240
MHz
µs
µs
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ms
Capacitance (Note 4)
T
A
= 25°C, f = 2.1/1 MHz
Symbol
C
OUT
C
IN
AC Test Conditions
Output Load
Input Pulse Levels
Timing Measurement Reference Level
C
L
= 200 pF
0.1 * V
CC
- 0.9 * V
CC
0.3 * V
CC
- 0.7 * V
CC
Test
Output Capacitance
Input Capacitance
Typ
3
2
Max
8
6
Units
pF
pF
Note 1:
Stress above those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress rating only and functional operation of the
device at these or any other conditions above those indicated in the operational sections of the specification is not implied. Exposure to absolute maximum rating conditions for
extended periods may affect device reliability.
Note 2:
The f
OP
frequency specification specifies a minimum clock period of 1/f
OP
. Therefore, for every f
OP
clock cycle, t
CLH
+ t
CLL
must be equal to or greater than 1/f
OP
. For
example, if the 2.1MHz period = 476ns and t
CLH
= 190ns, t
CLL
must be 286ns.
Note 3:
CS must be brought high for a minimum of t
CSH
between consecutive instruction cycles.
Note 4:
This parameter is periodically sampled and not 100% tested.
3
NM25C041 Rev. D.1
www.fairchildsemi.com
NM25C041 4K-Bit Serial Interface CMOS EEPROM (Serial Peripheral Interface
(SPI) Synchronous Bus)
Low Voltage 2.7V
≤
V
CC
≤
4.5V Specifications
Operating Conditions
Absolute Maximum Ratings
(Note 5)
Ambient Storage Temperature
All Input or Output Voltage with
Respect to Ground
Lead Temp. (Soldering, 10 sec.)
ESD Rating
-65°C to +150°C
+6.5V to -0.3V
+300°C
2000V
Ambient Operating Temperature
NM25C041L/LZ
NM25C041LE/LZE
NM25C041LV
Power Supply (V
CC
)
0°C to +70°C
-40°C to +85°C
-40°C to +125°C
2.7V - 4.5V
DC and AC Electrical Characteristics
2.7V
≤
V
CC
≤
4.5V
25C041L/LE
25C041LZ/LZE
Min.
Max.
3
µA
10
1
V
IN
= 0 to V
CC
V
OUT
= GND to V
CC
-1
-1
-0.3
0.7 * V
CC
I
OL
= 0.8 mA
I
OH
= –0.8 mA
V
CC
- 0.8
1.0
2.0
2.0
(Note 6)
(Note 6)
(Note 7)
410
410
500
500
100
240
500
100
240
500
0
240
500
240
1-4 Bytes
15
0
240
500
240
15
410
410
500
500
100
240
500
100
240
500
1
1
V
CC
* 0.3
V
CC
+ 0.3
0.4
V
CC
- 0.8
1.0
2.0
2.0
-1
-1
-0.3
0.7 * V
CC
10
N/A
1
1
V
CC
* 0.3
V
CC
+ 0.3
0.4
µA
µA
V
V
V
V
MHz
µs
µs
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ms
25C041LV
Min
Max
3
Symbol
I
CC
I
CCSB
Parameter
Operating Current
Standby Current
L
LZ
Input Leakage
Output Leakage
Input Low Voltage
Input High Voltage
Output Low Voltage
Output High Voltage
SCK Frequency
Input Rise Time
Input Fall Time
Clock High Time
Clock Low Time
Min. CS High Time
CS Setup Time
Data Setup Time
HOLD Setup Time
CS Hold Time
Data Hold Time
HOLD Hold Time
Output Delay
Output Hold Time
HOLD Output Low Z
Output Disable Time
HOLD to Output Hi Z
Write Cycle Time
Conditions
CS = V
IL
CS = V
CC
Units
mA
I
IL
I
OL
V
IL
V
IH
V
OL
V
OH
f
OP
t
RI
t
FI
t
CLH
t
CLL
t
CSH
t
CSS
t
DIS
t
HDS
t
CSN
t
DIN
t
HDN
t
PD
t
DH
t
LZ
t
DF
t
HZ
t
WP
Capacitance
T
A
= 25°C, f = 2.1/1 MHz (Note 8)
Symbol
C
OUT
C
IN
AC Test Conditions
Output Load
Input Pulse Levels
Timing Measurement Reference Level
C
L
= 200 pF
0.1 * V
CC
- 0.9 * V
CC
0.3 * V
CC
- 0.7 * V
CC
Test
Output Capacitance
Input Capacitance
Typ Max Units
3
2
8
6
pF
pF
Note 5:
Stress above those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress rating only, and functional operation of the
device at these or any other conditions above those indicated in the operational sections of the specification is not implied. Exposure to absolute maximum rating conditions for
extended periods may affect device reliability.
Note 6 :
The f
OP
frequency specification specifies a minimum clock period of 1/f
OP
. Therefore, for every f
OP
clock cycle, t
CLH
+ t
CLL
must be equal to or greater than 1/f
OP
. For
example, if the 2.1MHz period = 476ns and t
CLH
= 190ns, t
CLL
must be 286ns.
Note 7:
CS must be brought high for a minimum of t
CSH
between consecutive instruction cycles.
Note 8:
This parameter is periodically sampled and not 100% tested.
4
NM25C041 Rev. D.1
www.fairchildsemi.com
Test/Measurement
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