Data Sheet
FEATURES
Ten Degrees of Freedom Inertial Sensor
ADIS16407
GENERAL DESCRIPTION
The
ADIS16407
iSensor®
device is a complete inertial system
that includes a triaxial gyroscope, a triaxial accelerometer, a
triaxial magnetometer, and pressure sensors. Each sensor in
the
ADIS16407
combines industry-leading
iMEMS®
technology
with signal conditioning that optimizes dynamic performance.
The factory calibration characterizes each sensor for sensitivity,
bias, alignment, and linear acceleration (gyro bias). As a result,
each sensor has its own dynamic compensation formulas that
provide accurate sensor measurements.
APPLICATIONS
B
SELF TEST
TRIAXIAL
GYRO
TRIAXIAL
ACCEL
TRIAXIAL
MAGN
PRESSURE
TEMP
VDD
Platform stabilization and control
Navigation
Robotics
SO
DIO1 DIO2 DIO3 DIO4 RST
I/O
CONTROLLLER
CLOCK
Triaxial digital gyroscope with digital range scaling
±75°/sec, ±150°/sec, ±300°/sec settings
Axis-to-axis alignment, <0.05°
Triaxial digital accelerometer, ±18
g
minimum
Triaxial digital magnetometer, ±2.5 gauss minimum
Digital barometer, 10 mbar to 1200 mbar
Calibrated pressure range: 300 mbar to 1100 mbar
Autonomous operation and data collection
No external configuration commands required
210 ms start-up time, 4 ms sleep mode recovery time
Factory calibrated sensitivity, bias, and axial alignment
Calibration temperature range: −40°C to +85°C
SPI-compatible serial interface
Embedded temperature sensor
Programmable operation and control
Automatic and manual bias correction controls
Bartlett window FIR length, number of taps
Digital I/O: data ready, alarm indicator, general-purpose
Alarms for condition monitoring
Sleep mode for power management
DAC output voltage
Enable external sample clock input up to 1.1 kHz
Single command self test
Single-supply operation: 4.75 V to 5.25 V
2000
g
shock survivability
Operating temperature range: −40°C to +105°C
FUNCTIONAL BLOCK DIAGRAM
VDD
ALARMS
POWER
MANAGEMENT
GND
O
LE
CALIBRATION
AND
FILTERS
OUTPUT
DATA
REGISTERS
USER
CONTROL
REGISTERS
Figure 1.
Rev. C
Information furnished by Analog Devices is believed to be accurate and reliable. However, no
responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other
rights of third parties that may result from its use. Specifications subject to change without notice. No
license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
Trademarks and registered trademarks are the property of their respective owners.
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.
Tel: 781.329.4700
www.analog.com
Fax: 781.461.3113
©2011 Analog Devices, Inc. All rights reserved.
09797-001
ADIS16407
TE
CS
SCLK
SPI
DIN
DOUT
The
ADIS16407
provides a simple, cost-effective method for
integrating accurate, multiaxis inertial sensing into industrial
systems, especially when compared with the complexity and
investment associated with discrete designs. All necessary motion
testing and calibration are part of the production process at the
factory, greatly reducing system integration time. Tight orthogonal
alignment simplifies inertial frame alignment in navigation systems.
The SPI and register structure provide a simple interface for
data collection and configuration control.
The
ADIS16407
has a compatible pinout for systems that currently
use ADIS1635x, ADIS1636x, and ADIS1640x IMU products.
The
ADIS16407
is packaged in a module that is approximately
23 mm × 23 mm × 23 mm and has a standard connector interface.
ADIS16407
TABLE OF CONTENTS
Features .............................................................................................. 1
Applications ....................................................................................... 1
General Description ......................................................................... 1
Functional Block Diagram .............................................................. 1
Revision History ............................................................................... 2
Specifications..................................................................................... 3
Timing Specifications .................................................................. 6
Absolute Maximum Ratings............................................................ 7
ESD Caution .................................................................................. 7
Pin Configuration and Function Descriptions ............................. 8
Typical Performance Characteristics ............................................. 9
Basic Operation............................................................................... 10
Reading Sensor Data .................................................................. 10
Output Data Registers ................................................................ 11
Input ADC Channel ................................................................... 13
Device Configuration ................................................................ 13
User Registers .................................................................................. 14
System Functions ............................................................................ 15
Global Commands ..................................................................... 15
Power Management .................................................................... 15
Product Identification ................................................................ 15
Memory Management ............................................................... 15
Self Test Function ....................................................................... 16
Status/Error Flags ....................................................................... 16
Input/Output Configuration ......................................................... 17
Data Sheet
Data Ready Indicator ................................................................. 17
General-Purpose Input/Output................................................ 17
Auxiliary DAC ............................................................................ 17
Digital Processing Configuration ................................................. 18
Sample Rate ................................................................................. 18
Input Clock Configuration ....................................................... 18
Digital Filtering........................................................................... 18
Dynamic Range .......................................................................... 18
Gyroscopes .................................................................................. 19
Accelerometers ........................................................................... 20
Magnetometer Calibration ........................................................ 20
Flash Updates .............................................................................. 21
Restoring Factory Calibration .................................................. 21
Alarms .............................................................................................. 22
Static Alarm Use ......................................................................... 22
Dynamic Alarm Use .................................................................. 22
Alarm Reporting ........................................................................ 22
Installation/Handling................................................................. 23
Gyroscope Bias Optimization ................................................... 23
Interface Printed Circuit Board (PCB) .................................... 23
Ordering Guide .......................................................................... 24
Calibration ....................................................................................... 19
REVISION HISTORY
B
10/11—Rev. B to Rev. C
Change to Burst Read Function Section and Figure 12 ............ 10
Changed .25 mg to 3.333 mg ........................................ Throughout
Changes to System Functions Section ......................................... 15
Change to Product Identification Section ................................... 15
Change to Table 36 ......................................................................... 15
Changes to Digital Filtering Section, Table 47, Caption for
Figure 18, and Figure 19 ................................................................ 18
Change to Table 67 ......................................................................... 22
O
7/11—Rev. A to Rev. B
Change to Table 1, Barometer, Sensitivity Parameter .................. 4
SO
LE
Rev. C | Page 2 of 24
Applications Information .............................................................. 23
Outline Dimensions ....................................................................... 24
Added Barometer Section; Changes to Table 40 ........................ 16
Changes to Table 55, Table 56, Table 57 ...................................... 20
Changes to Table 58, Table 59, Table 60 ...................................... 21
6/11—Rev. 0 to Rev. A
Changes to Device Configuration Section and Figure 16 ......... 13
Changes to Figure 19...................................................................... 18
Changes to Figure 25 Caption ...................................................... 24
Changes to Ordering Guide .......................................................... 24
4/11—Revision 0: Initial Version
TE
Data Sheet
SPECIFICATIONS
T
A
= 25°C, VDD = 5 V, angular rate = 0°/sec, dynamic range = ±300°/sec ± 1
g,
unless otherwise noted.
Table 1.
Parameter
GYROSCOPES
Dynamic Range
Initial Sensitivity
Test Conditions/Comments
Min
±300
0.0495
Typ
±350
0.05
0.025
0.0125
±40
±0.05
±0.5
±0.1
±3
0.007
1.9
±0.01
0.05
±0.3
0.8
0.044
330
14.5
Max
ADIS16407
Unit
°/sec
°/sec/LSB
°/sec/LSB
°/sec/LSB
ppm/°C
Degrees
Degrees
% of FS
°/sec
°/sec
°/√hr
°/sec/°C
°/sec/g
°/sec/V
°/sec rms
°/sec/√Hz rms
Hz
kHz
g
mg/LSB
ppm/°C
Degrees
Degrees
% of FS
mg
mg
m/sec/√hr
mg/°C
mg/V
mg rms
mg/√Hz rms
Hz
kHz
gauss
mgauss/LSB
ppm/°C
Sensitivity Temperature Coefficient
Misalignment
Nonlinearity
Initial Bias Error
In-Run Bias Stability
Angular Random Walk
Bias Temperature Coefficient
Linear Acceleration Effect on Bias
Bias Voltage Sensitivity
Output Noise
Rate Noise Density
3 dB Bandwidth
Sensor Resonant Frequency
ACCELEROMETERS
Dynamic Range
Initial Sensitivity
Sensitivity Temperature Coefficient
Misalignment
Nonlinearity
Initial Bias Error
In-Run Bias Stability
Velocity Random Walk
Bias Temperature Coefficient
Bias Voltage Sensitivity
Output Noise
Noise Density
3 dB Bandwidth
Sensor Resonant Frequency
Each axis
LE
±18
3.285
±2.5
0.49
Rev. C | Page 3 of 24
Dynamic range = ±300°/sec
Dynamic range = ±150°/sec
Dynamic range = ±75°/sec
−40°C ≤ T
A
≤ +85°C
Axis to axis
Axis to frame (package)
Best fit straight line
±1 σ
1 σ, SMPL_PRD = 0x0001
1 σ, SMPL_PRD = 0x0001
−40°C ≤ T
A
≤ +85°C
Any axis, 1 σ (MSC_CTRL[7] = 1)
VDD = 4.75 V to 5.25 V
±300°/sec range, no filtering
f = 25 Hz, ±300°/sec range, no filtering
0.0505
MAGNETOMETER
Dynamic Range
Initial Sensitivity
Sensitivity Temperature Coefficient
O
B
SO
−40°C ≤ T
A
≤ +85°C
Axis to axis
Axis to frame (package)
Best fit straight line
±1 σ
1 σ, SMPL_PRD = 0x0001
1 σ, SMPL_PRD = 0x0001
−40°C ≤ T
A
≤ +85°C
VDD = 4.75 V to 5.25 V
No filtering
No filtering
25°C
25°C, 1 σ
Misalignment
Nonlinearity
Initial Bias Error
Bias Temperature Coefficient
Output Noise
Noise Density
Bandwidth
Axis to axis
Axis to frame (package)
Best fit straight line
25°C, 0 gauss stimulus
−40°C ≤ T
A
≤ +85°C
25°C, no filtering, rms
25°C, no filtering, rms
TE
3.33
±50
0.2
±0.5
0.1
±50
0.2
0.2
±0.3
2.5
9
0.5
330
5.5
±3.5
0.5
600
3.38
0.51
−3 dB
0.25
0.5
0.5
±4
0.5
1.15
0.06
1540
Degrees
Degrees
% of FS
mgauss
mgauss/°C
mgauss
mgauss/√Hz
Hz
ADIS16407
Parameter
BAROMETER
Pressure Range
Operating
Extended
1
Sensitivity
Total Error
Relative Error
2
Linearity
3
Noise
TEMPERATURE SENSOR
Scale Factor
25°C, output = 0x0000
Data Sheet
Test Conditions/Comments
Min
Typ
Max
Unit
300
10
25°C, 300 mbar to 1100 mbar
−40°C to +85°C, 300 mbar to 1100 mbar
25°C, 300 mbar to 1100 mbar
−40°C to +85°C, 300 mbar to 1100 mbar
0.3125
1.5
2.5
0.1
0.15
0.027
0.14
1100
1200
mbar
mbar
µbar/LSB
mbar
mbar
% of FS
% of FS
mbar rms
°C/LSB
SO
V
IH
= 3.3 V
V
IL
= 0 V
I
SOURCE
= 1.6 mA
I
SINK
= 1.6 mA
Endurance
5
T
J
= 85°C
Time until new data is available
SMPL_PRD = 0x0001
ADC INPUT
Resolution
Integral Nonlinearity
Differential Nonlinearity
Offset Error
Gain Error
Input Range
Input Capacitance
DAC OUTPUT
Resolution
Relative Accuracy
Differential Nonlinearity
Offset Error
Gain Error
Output Range
Output Impedance
Output Settling Time
LOGIC INPUTS
4
Input High Voltage, V
IH
Input Low Voltage, V
IL
CS Wake-Up Pulse Width
Logic 1 Input Current, I
IH
Logic 0 Input Current, I
IL
All Pins Except RST
RST Pin
Input Capacitance, C
IN
DIGITAL OUTPUTS
4
Output High Voltage, V
OH
Output Low Voltage, V
OL
FLASH MEMORY
Data Retention
6
FUNCTIONAL TIMES
7
Power-On Start-Up Time
Reset Recovery Time
Sleep Mode Recovery Time
Flash Memory Update Time
Flash Memory Test Time
Automatic Self Test Time
TE
12
±2
±1
±4
±2
20
12
±4
±1
±5
±0.5
3.3
2
10
2.0
0.8
0.55
20
±0.2
40
1
10
2.4
0.4
10,000
20
220
105
7
75
30
52
±10
60
0
3.3
During acquisition
5 kΩ/100 pF to GND
LE
0
Rev. C | Page 4 of 24
Bits
LSB
LSB
LSB
LSB
V
pF
Bits
LSB
LSB
mV
%
V
Ω
µs
V
V
V
μs
µA
µA
mA
pF
V
V
Cycles
Years
ms
ms
ms
ms
ms
ms
101 LSB ≤ input code ≤ 4095 LSB
CS signal to wake up from sleep mode
O
B
Data Sheet
Parameter
CONVERSION RATE
xGYRO_OUT, xACCL_OUT, xMAGN_OUT
BAR_OUT, BARO_OUTL
8
Clock Accuracy
Sync Input Clock
9
POWER SUPPLY
Power Supply Current
1
2
ADIS16407
Test Conditions/Comments
SMPL_PRD = 0x0001
SMPL_PRD = 0x0001
0.8
4.75
Min
Typ
819.2
51.2
±3
1.1
5.25
Max
Unit
SPS
SPS
SPS
%
kHz
V
mA
mA
Operating voltage range, VDD
Sleep mode
5.0
70
1.4
O
Rev. C | Page 5 of 24
B
SO
LE
TE
The extended pressure range is guaranteed by design.
The relative error assumes that the initial error, at +25°C, is corrected in the end application.
3
Linearity errors assume a full scale (FS) of 1000 mbar.
4
The digital I/O signals are driven by an internal 3.3 V supply, and the inputs are 5 V tolerant.
5
Endurance is qualified as per JEDEC Standard 22, Method A117, and measured at −40°C, +25°C, +85°C, and +125°C.
6
The data retention lifetime equivalent is at a junction temperature (T
J
) of 85°C as per JEDEC Standard 22, Method A117. Data retention lifetime decreases with junction
temperature.
7
These times do not include thermal settling and internal filter response times (330 Hz bandwidth), which may affect overall accuracy.
8
The BARO_OUT and BARO_OUTL registers sample at a rate that is 1/16
th
that of the other output registers.
9
The sync input clock functions below the specified minimum value, but at reduced performance levels.