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2SJ668(TE16L1)

Description
TRANSISTOR,MOSFET,P-CHANNEL,60V V(BR)DSS,5A I(D),TO-252AA
CategoryDiscrete semiconductor    The transistor   
File Size187KB,6 Pages
ManufacturerToshiba Semiconductor
Websitehttp://toshiba-semicon-storage.com/
Download Datasheet Parametric View All

2SJ668(TE16L1) Overview

TRANSISTOR,MOSFET,P-CHANNEL,60V V(BR)DSS,5A I(D),TO-252AA

2SJ668(TE16L1) Parametric

Parameter NameAttribute value
Is it Rohs certified?incompatible
package instruction,
Reach Compliance Codeunknow
ConfigurationSingle
Maximum drain current (Abs) (ID)5 A
FET technologyMETAL-OXIDE SEMICONDUCTOR
Operating modeENHANCEMENT MODE
Maximum operating temperature150 °C
Polarity/channel typeP-CHANNEL
Maximum power dissipation(Abs)20 W
surface mountYES
Base Number Matches1
2SJ668
TOSHIBA Field Effect Transistor Silicon P-Channel MOS Type (U−MOSIII)
2SJ668
5.2
±
0.2
1.5
±
0.2
Relay Drive, DC/DC Converter and Motor Drive
Applications
4 V gate drive
Low drain-source ON-resistance: R
DS (ON)
= 0.12
(typ.)
1.2 MAX.
Unit: mm
6.5
±
0.2
0.6 MAX.
Low leakage current: I
DSS
=
−100 μA
(max) (V
DS
=
−60
V)
Enhancement mode: V
th
=
−0.8
to
−2.0
V (V
DS
=
−10
V, I
D
=
−1
mA)
9.5
±
0.3
High forward transfer admittance: |Y
fs
| = 5.0 S (typ.)
5.5
±
0.2
1.1
±
0.2
0.6 MAX.
0.8 MAX.
2.3
±
0.2
Absolute Maximum Ratings
(Ta = 25°C)
Characteristic
Drain-source voltage
Drain-gate voltage (R
GS
= 20 kΩ)
Gate-source voltage
Drain current
DC
(Note 1)
Symbol
V
DSS
V
DGR
V
GSS
I
D
I
DP
P
D
E
AS
I
AR
E
AR
T
ch
T
stg
Rating
−60
−60
±20
−5
−20
20
40.5
−5
2
150
−55
to 150
Unit
V
V
V
A
A
W
mJ
A
mJ
°C
°C
0.6
±
0.15
1
2
1.05 MAX.
3
2.3
±
0.15 2.3
±
0.15
2
Pulse (Note 1)
GATE
DRAIN
(HEAT
SINK)
3. SOURSE
1.
2.
0.1
±
0.1
1
3
Drain power dissipation (Tc=25°C)
Single pulse avalanche energy
(Note 2)
Avalanche current
Repetitive avalanche energy (Note 3)
Channel temperature
Storage temperature range
JEDEC
JEITA
TOSHIBA
2-7J1B
Weight: 0.35 g (typ.)
Note:
Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in
temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e.
operating temperature/current/voltage, etc.) are within the absolute maximum ratings. Please design the appropriate
reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/“Derating Concept and
Methods”) and individual reliability data (i.e. reliability test report and estimated failure rate, etc).
Thermal Characteristics
Characteristic
Thermal resistance, channel to case
Thermal resistance, channel to ambient
Symbol
R
th (ch−c)
R
th (ch−a)
Max
6.25
125
Unit
°C / W
°C / W
Note 1: Ensure that the channel temperature does not exceed 150°C.
Note 2: V
DD
=
−25
V, T
ch
= 25°C (initial), L = 2.2 mH, R
G
= 25
Ω,
I
AR
=
−5
A
Note 3: Repetitive rating: pulse width limited by maximum channel temperature
This transistor is an electrostatic-sensitive device. Handle with care.
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