EEWORLDEEWORLDEEWORLD

Part Number

Search

2SK880LTE85L

Description
TRANSISTOR N-CHANNEL, Si, SMALL SIGNAL, JFET, FET General Purpose Small Signal
CategoryDiscrete semiconductor    The transistor   
File Size290KB,4 Pages
ManufacturerToshiba Semiconductor
Websitehttp://toshiba-semicon-storage.com/
Download Datasheet Parametric View All

2SK880LTE85L Overview

TRANSISTOR N-CHANNEL, Si, SMALL SIGNAL, JFET, FET General Purpose Small Signal

2SK880LTE85L Parametric

Parameter NameAttribute value
package instructionSMALL OUTLINE, R-PDSO-G3
Reach Compliance Codeunknow
Other featuresLOW NOISE
ConfigurationSINGLE
FET technologyJUNCTION
JESD-30 codeR-PDSO-G3
Number of components1
Number of terminals3
Operating modeDEPLETION MODE
Maximum operating temperature125 °C
Package body materialPLASTIC/EPOXY
Package shapeRECTANGULAR
Package formSMALL OUTLINE
Polarity/channel typeN-CHANNEL
Certification statusNot Qualified
surface mountYES
Terminal formGULL WING
Terminal locationDUAL
transistor applicationsAMPLIFIER
Transistor component materialsSILICON
Base Number Matches1
2SK880
TOSHIBA Field Effect Transistor
Silicon N Channel Junction Type
2SK880
Audio Frequency Low Noise Amplifier Applications
High |Y
fs
|: |Y
fs
| = 15 mS (typ.) at V
DS
= 10 V, V
GS
= 0
High breakdown voltage: V
GDS
=
−50
V
Low noise: NF = 1.0dB (typ.)
at V
DS
= 10 V, I
D
= 0.5 mA, f = 1 kHz, R
G
= 1 kΩ
High input impedance: I
GSS
=
−1
nA (max) at V
GS
=
−30
V
Small package
Unit: mm
Absolute Maximum Ratings
(Ta
=
25°C)
Characteristics
Gate-drain voltage
Gate current
Drain power dissipation
Junction temperature
Storage temperature range
Symbol
V
GDS
I
G
P
D
T
j
T
stg
Rating
−50
10
100
125
−55~125
Unit
V
mA
mW
°C
°C
Note:
Using continuously under heavy loads (e.g. the application of
high temperature/current/voltage and the significant change in
temperature, etc.) may cause this product to decrease in the
reliability significantly even if the operating conditions (i.e.
operating temperature/current/voltage, etc.) are within the
absolute maximum ratings.
Please design the appropriate reliability upon reviewing the
Toshiba Semiconductor Reliability Handbook (“Handling
Precautions”/“Derating Concept and Methods”) and individual
reliability data (i.e. reliability test report and estimated failure
rate, etc).
JEDEC
JEITA
TOSHIBA
SC-70
2-2E1B
Weight: 0.006 g (typ.)
Marking
Electrical Characteristics
(Ta
=
25°C)
Characteristics
Gate cut-off current
Gate-drain breakdown voltage
Drain current
Gate-source cut-off voltage
Forward transfer admittance
Input capacitance
Reverse transfer capacitance
Symbol
I
GSS
V
(BR) GDS
I
DSS
(Note)
V
GS (OFF)
⎪Y
fs
C
iss
C
rss
NF (1)
Noise figure
NF (2)
Test Condition
V
GS
= −30
V, V
DS
=
0
V
DS
=
0, I
G
= −100 μA
V
DS
=
10 V, V
GS
=
0
V
DS
=
10 V, I
D
=
0.1
μA
V
DS
=
10 V, V
GS
=
0, f
=
1 kHz
V
DS
=
10 V, V
GS
=
0, f
=
1 MHz
V
DG
=
10 V, I
D
=
0, f
=
1 MHz
V
DS
=
10 V, R
G
=
1 kΩ
I
D
=
0.5 mA, f
=
10 Hz
V
DS
=
10 V, R
G
=
1 kΩ
I
D
=
0.5 mA, f
=
1 kHz
Min
−50
1.2
−0.2
4.0
Typ.
15
13
3
5
1
Max
−1.0
14.0
−1.5
dB
Unit
nA
V
mA
V
mS
pF
pF
Note: I
DSS
classification Y: 1.2~3.0 mA, GR: 2.6~6.5 mA, BL: 6.0~14 mA
1
2007-11-01
It’s like face to face with real people. What do you think of this black technology?
Source: New Design In the past, the carriages were slow and the letters were far away. It always seemed so long and difficult for two people who were thousands of miles apart to meet or talk to each o...
eric_wang Talking
The competition questions will be issued tomorrow, what are you doing tonight?
This is my first time participating in an electronic design competition. There are so many things I don’t understand!!! The questions will be released tomorrow. What are you all doing tonight? ??? ???...
吕志鹏 Electronics Design Contest
4-hour tour report of Xiangshan Park
4-hour tour of Xiangshan Park [[i] This post was last edited by DIAG on 2010-6-4 13:00 [/i]]...
DIAG Talking
Hercules-based industrial "safety" control system test DI switch input (SPI port IO simulation)
[font=Helvetica, Arial, sans-serif][size=2] Hercules-based industrial "safety" control system test DI switch input (SPI port IO simulation) [/size][/font] Function demonstration: test hardware [font=H...
蓝雨夜 Microcontroller MCU
Latest news sharing, MOTO XT883 uses TI chip
On September 2, 2011, Motorola held the New Milestone Motorola XT883 Experience Conference at Beta Coffee in Zhongguancun, Beijing. As the latest member of the Milestone series, Motorola XT883 is equi...
Laura_luck DSP and ARM Processors
I made a video tutorial. I hope you like it. 2010.3.6 51 MCU ===== Marquee (LED) QQ: 9086074
I made a video tutorial. I hope you like it. 2010.3.6 51 MCU ===== Marquee (LED) QQ: 9086074 BY: Feilong QQ: 9086074 I hope to meet more MCU development friends to communicate with each other. This is...
huangjiangmin Embedded System

EEWorld
subscription
account

EEWorld
service
account

Automotive
development
circle

Robot
development
community

Index Files: 1631  1328  200  545  173  33  27  5  11  4 
Datasheet   0 1 2 3 4 5 6 7 8 9 A B C D E F G H I J K L M N O P Q R S T U V W X Y Z
Room 1530, 15th Floor, Building B, No. 18 Zhongguancun Street, Haidian District, Beijing Telephone: (010) 82350740 Postal Code: 100190
Copyright © 2005-2026 EEWORLD.com.cn, Inc. All rights reserved 京ICP证060456号 京ICP备10001474号-1 电信业务审批[2006]字第258号函 京公网安备 11010802033920号