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2SC5755(TE85L)

Description
TRANSISTOR,BJT,NPN,10V V(BR)CEO,2A I(C),SOT-23
CategoryDiscrete semiconductor    The transistor   
File Size141KB,5 Pages
ManufacturerToshiba Semiconductor
Websitehttp://toshiba-semicon-storage.com/
Download Datasheet Parametric View All

2SC5755(TE85L) Overview

TRANSISTOR,BJT,NPN,10V V(BR)CEO,2A I(C),SOT-23

2SC5755(TE85L) Parametric

Parameter NameAttribute value
Is it Rohs certified?incompatible
package instruction,
Reach Compliance Codeunknow
Maximum collector current (IC)2 A
ConfigurationSingle
Minimum DC current gain (hFE)400
Maximum operating temperature150 °C
Polarity/channel typeNPN
Maximum power dissipation(Abs)0.75 W
surface mountYES
Base Number Matches1
2SC5755
TOSHIBA Transistor
Silicon NPN Epitaxial Type
2SC5755
High-Speed Switching Applications
DC-DC Converter Applications
Strobe Applications
High DC current gain: h
FE
= 400 to 1000 (I
C
= 0.2 A)
Low collector-emitter saturation voltage: V
CE (sat)
= 0.12 V (max)
High-speed switching: t
f
= 25 ns (typ.)
Unit: mm
Absolute Maximum Ratings
(Ta
=
25°C)
Characteristics
Collector-base voltage
Collector-emitter voltage
Emitter-base voltage
Collector current
Base current
Collector power
dissipation
Junction temperature
Storage temperature range
DC
t
=
10 s
DC
Pulse
Symbol
V
CBO
V
CEO
V
EBO
I
C
I
CP
I
B
P
C
(Note 1)
T
j
T
stg
Rating
20
10
7
2
3.5
200
500
750
150
−55
to 150
Unit
V
V
V
A
mA
mW
°C
°C
JEDEC
JEITA
TOSHIBA
2-3S1A
Weight: 0.01 g (typ.)
Note 1: Mounted on an FR4 board (glass epoxy, 1.6 mm thick, Cu area: 645 mm
2
)
Note 2: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly
even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute
maximum ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
1
2009-03-23
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