FEATURES
1.
2.
3.
4.
5.
6.
Multilayer LTCC ( Low Temperature Cofired Ceramics ) Technology
Reflow solderable
Miniatured Size 2.00 x 1.25 x 1.05 mm
3
Low Insertion Loss (Typical –0.3dB@2.4GHz)
High attenuation on 2nd and 3rd harmonic suppressed
Suitable for 2.45 GHz Working Frequency Operation
APPLICATIONS
1.
2.
2.4GHz ISM Band RF Application
Bluetooth, Wireless LAN, Home RF
CONSTRUCTION
Fig 1. Outline of 2.4GHz Low Pass Filter
DESCRIPTION
Our new ceramic Low Pass Filter specified for 2.4 GHz ISM Band application, as
shown in fig-1. Both of Wireless LAN IEEE 802.11b, and Bluetooth
TM
typically located on this unlicensed frequency band
which range covers from 2.4GHz to 2.4835GHz. To fulfil the in-band and out-band frequency requirements, this Low Pass
Filter has been designed to a high suppression on 2
nd
and 3
rd
harmonic as well as low insertion loss characteristics
through our advanced LTCC (Low Temperature Co-fired Ceramic) technology and superior product design via 3D EM
Simulation Skill.
This Low Pass Filter has a rectangular ceramic body with a tiny dimension of 2.00 x 1.25 x 1.05 mm
3
future meet the SMT
automation and miniaturization requirements on modern portable devices.
DIMENSIONS
Figure
Symbol
L
W
T
A
B
C
D
E
F
P
Dimension
2.00 ± 0.15 mm
1.25 ± 0.10 mm
1.05 ± 0.10 mm
0.30 ± 0.10 mm
0.30 ± 0.10 mm
0.30 ± 0.10 mm
0.40 ± 0.20 mm
0.30 ± 0.10 mm
0.20 ± 0.10 mm
0.65 ± 0.10 mm
Page 2 of 7
AS_2.4GHz 2012LPF_A0_05
Sep.-2001
SOLDER LAND PATTERN
Figure
Symbol
Dimension (mm)
2.00
±
0.10
1.00
±
0.10
1.30
±
0.10
1.40
±
0.10
0.30
±
0.10
0.35
±
0.10
0.20
±
0.10
0.30
±
0.10
0.40
±
0.10
L
W2
W1
B1
L1
I/O Solder Pad
Ground Solder Pad
Ground Via
L
B
A1
A
A
B
L1
A1
B1
W1
W2
Φ
Line width to be design to match 50Ω characteristic impedance,
depending on PCB material and thickness.
MARKING:
No marking, the white line means up-side
ELECTRICAL CHARACTERISTICS
n
RFLPF2012110A0x Series
Item
Specification
2450
±
50 MHz
0.7 (max)
1.5
30 @ 2 x (f
0
±
BW/2)
25 @ 3 x (f
0
±
BW/2)
*Note2: Maximum Input power: 10W for 5 minutes
Frequency range (MHz)
Insertion Loss (dB)
VSWR
Attenuation (dB min.)
*Note1: Rated power 5W MAX
Page 3 of 7
AS_2.4GHz 2012LPF_A0_05
Sep.-2001
RELIABILITY TEST
n
Mechanical performance
Test item
Solderability
Test condition / Test method
Solder temp.
: 235
±
5°C
Specification
At least 80% of a surface of
each terminal electrode must be
covered by fresh solder.
Immersion time: 2
±
1 sec
Solder: SN63
Resistance to soldering heat
Solder: Sn63
Preheating temperature: 150
±
10°C
Solder Temperature: 260
±
5°C
Immersion time: 10
±
1 sec
Measurement to be made after keeping at room
temp. for 24±2 hrs.
No mechanical damage.
Ceramic surface shall not be
exposed in the middle of the
termination or on the
terminated product edge by
leaching.
Drop Test
Height : 75 cm
Direction : 3 directions
Times : 3 times for each direction.
No mechanical damage.
Samples shall satisfy electrical
specification after test..
n
Environmental characteristics
Test item
Test condition / Test method
Humidity:90% to 95% R.H.
Tempertaure:40±2°C
Time: 500±24 hours.
Measurement: After placing for 24 hours Minimum.
Specification
No mechanical damage.
Samples shall satisfy electrical
specification after test.
Humidity (steady conditions)
Temperature cycle
1.
2.
3.
4.
30±3 minutes at -40°C±3°C,
10~15 minutes at room temperature,
30±3 minutes at +85°±3°C,
10~15 minutes at room temperature,
No mechanical damage.
Samples shall satisfy electrical
specification after test.
Total 100 continuous cycles
Measurement after placing for 48±2 hrs min.
High temperature
Temperature: 85°C±2°C
Test duration: 24 hours
Measurement must be taken after subjection to the
above conditions, followed by exposure in room
environment for 1 to 2 hours.
Low temperature
Temperature: -40°C±3°C
Test duration: 24 hours
Measurement must be taken after subjection to the
above conditions, followed by exposure in room
environment for 1 to 2 hours.
No mechanical damage.
Samples shall satisfy electrical
specification after test.
No mechanical damage.
Samples shall satisfy electrical
specification after test.
Page 4 of 7
AS_2.4GHz 2012LPF_A0_05
Sep.-2001
Embedded System
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