CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation of the
device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
NOTE:
1.
θ
JA
is measured with the component mounted on a low effective thermal conductivity test board in free air. See Tech Brief TB379
for details.
TABLE 1. DC ELECTRICAL PERFORMANCE CHARACTERISTICS
Device Tested at: V
SUPPLY
=
±15V,
R
SOURCE
= 100Ω, R
LOAD
= 500kΩ, V
OUT
= 0V, Unless Otherwise Specified.
GROUP A
SUBGROUPS
1
2, 3
+I
B
V
CM
= 0V, +R
S
= 100kΩ, -R
S
= 100Ω
1
2, 3
-I
B
V
CM
= 0V, +R
S
= 100Ω, -R
S
= 100kΩ
1
2, 3
Input Offset
Current
Common Mode
Range
I
IO
V
CM
= 0V, +R
S
= 100kΩ, -R
S
= 100kΩ
1
2, 3
+CMR
V+ = 5V, V- = -25V
1
2, 3
-CMR
V+ = 25V, V- = -5V
1
2, 3
Large Signal
Voltage Gain
+A
VOL
V
OUT
= 0V and +10V, R
L
= 2kΩ
4
5, 6
-A
VOL
V
OUT
= 0V and -10V, R
L
= 2kΩ
4
5, 6
Common Mode
Rejection Ratio
+CMRR
∆V
CM
= +10V, V+ = +5V, V- = -25V,
V
OUT
= -10V
∆V
CM
= -10V, V+ = +25V, V- = -5V,
V
OUT
= +10V
R
L
= 2kΩ
1
2, 3
1
2, 3
4
5, 6
-V
OUT
R
L
= 2kΩ
4
5, 6
HA-2520/883
TEMPERATURE
+25
o
C
+125
o
C, -55
o
C
+25
o
C
+125
o
C, -55
o
C
+25
o
C
+125
o
C, -55
o
C
+25
o
C
+125
o
C, -55
o
C
+25
o
C
+125
o
C, -55
o
C
+25
o
C
+125
o
C, -55
o
C
+25
o
C
+125
o
C, -55
o
C
+25
o
C
+125
o
C, -55
o
C
+25
o
C
+125
o
C, -55
o
C
+25
o
C
+125
o
C, -55
o
C
+25
o
C
+125
o
C, -55
o
C
+25
o
C
+125
o
C, -55
o
C
MIN
-8
-10
-200
-400
-200
-400
-25
-50
+10
+10
-
-
10
7.5
10
7.5
80
80
80
80
10
10
-
-
MAX
8
10
200
400
200
400
25
50
-
-
-10
-10
-
-
-
-
-
-
-
-
-
-
-10
-10
UNITS
mV
mV
nA
nA
nA
nA
nA
nA
V
V
V
V
kV/V
kV/V
kV/V
kV/V
dB
dB
dB
dB
V
V
V
V
PARAMETERS
Input Offset
Voltage
Input Bias Current
SYMBOL
V
IO
V
CM
= 0V
CONDITIONS
-CMRR
Output Voltage
Swing
+V
OUT
2
HA-2520/883
TABLE 1. DC ELECTRICAL PERFORMANCE CHARACTERISTICS (Continued)
Device Tested at: V
SUPPLY
=
±15V,
R
SOURCE
= 100Ω, R
LOAD
= 500kΩ, V
OUT
= 0V, Unless Otherwise Specified.
GROUP A
SUBGROUPS
4
5, 6
-I
OUT
V
OUT
= +10V
4
5, 6
Quiescent Power
Supply Current
+I
CC
V
OUT
= 0V, I
OUT
= 0mA
1
2, 3
-I
CC
V
OUT
= 0V, I
OUT
= 0mA
1
2, 3
Power Supply
Rejection Ratio
+PSRR
∆V
SUP
= 10V, V+ = +20V, V- = -15V, V+
= +10V, V- = -15V
∆V
SUP
= 10V, V+ = +15V, V- = -20V, V+
= +15V, V- = -10V
Note 1
1
2, 3
1
2, 3
1
2, 3
-V
IO
Adj
Note 1
1
2, 3
NOTE:
2. Offset adjustment range is [V
IO
(Measured)
±1mV]
minimum referred to output. This test is for functionality only to assure adjustment through 0V.
HA-2520/883
TEMPERATURE
+25
o
C
+125
o
C, -55
o
C
+25
o
C
+125
o
C, -55
o
C
+25
o
C
+125
o
C, -55
o
C
+25
o
C
+125
o
C, -55
o
C
+25
o
C
+125
o
C, -55
o
C
+25
o
C
+125
o
C, -55
o
C
+25
o
C
+125
o
C, -55
o
C
+25
o
C
+125
o
C, -55
o
C
MIN
10
7.5
-
-
-
-
-6
-6.5
80
80
80
80
V
IO
-1
V
IO
-1
V
IO
+1
V
IO
+1
MAX
-
-
-10
-7.5
6
6.5
-
-
-
-
-
-
-
-
-
-
UNITS
mA
mA
mA
mA
mA
mA
mA
mA
dB
dB
dB
dB
mV
mV
mV
mV
PARAMETERS
Output Current
SYMBOL
+I
OUT
CONDITIONS
V
OUT
= -10V
-PSRR
Offset Voltage
Adjustment
+V
IO
Adj
TABLE 2. AC ELECTRICAL PERFORMANCE CHARACTERISTICS
Device Tested at: V
SUPPLY
=
±15V,
R
SOURCE
= 50Ω, R
LOAD
= 2kΩ, C
LOAD
= 50pF, A
VCL
= +3V/V, Unless Otherwise Specified.
GROUP A
SUBGROUPS
7
8A, 8B
-SR
V
OUT
= +5V to -5V, 75%
≥
-SR
≥
25%
7
8A, 8B
Rise and Fall Time
T
R
V
OUT
= 0 to +200mV, 10%
≤
T
R
≤
90%
7
8A, 8B
T
F
V
OUT
= 0 to -200mV, 10%
≤
T
F
≤
90%
7
8A, 8B
Overshoot
+OS
V
OUT
= 0 to +200mV
7
8A, 8B
-OS
V
OUT
= 0 to -200mV
7
8A, 8B
HA-2520/883
TEMPERATURE
+25
o
C
+125
o
C, -55
o
C
+25
o
C
+125
o
C, -55
o
C
+25
o
C
+125
o
C, -55
o
C
+25
o
C
+125
o
C, -55
o
C
+25
o
C
+125
o
C, -55
o
C
+25
o
C
+125
o
C, -55
o
C
MIN
100
84
100
84
-
-
-
-
-
-
-
-
MAX
-
-
-
-
50
55
50
55
40
45
40
45
UNITS
V/µs
V/µs
V/µs
V/µs
ns
ns
ns
ns
%
%
%
%
PARAMETERS
Slew Rate
SYMBOL
+SR
CONDITIONS
V
OUT
= -5V to +5V, 25%
≤
+SR
≤
75%
3
HA-2520/883
TABLE 3. ELECTRICAL PERFORMANCE CHARACTERISTICS
Device Characterized at: V
SUPPLY
=
±15V,
R
LOAD
= 2kΩ, C
LOAD
= 50pF, A
V
≥
3, C
COMP
= 0pF, Unless Otherwise Specified.
HA-2520/883
PARAMETERS
Differential Input
Resistance
Full Power
Bandwidth
Full Power
Bandwidth
Minimum Closed
Loop Stable Gain
Quiescent Power
Consumption
NOTES:
3. Parameters listed in Table 3 are controlled via design or process parameters and are not directly tested at final production. These parameters
are lab characterized upon initial design release, or upon design changes. These parameters are guaranteed by characterization based upon
data from multiple production runs which reflect lot to lot and within lot variation.
4. Full Power Bandwidth guarantee based on Slew Rate measurement using FPBW = Slew Rate/(2πV
PEAK
).
5. Quiescent Power Consumption based upon Quiescent Supply Current test maximum. (No load on outputs.)
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