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HYB25D128800E-7

Description
DDR DRAM, 16MX8, 0.75ns, CMOS, PDSO66, 0.400 INCH, PLASTIC, TSOP2-66
Categorystorage    storage   
File Size1MB,76 Pages
ManufacturerInfineon
Websitehttp://www.infineon.com/
Environmental Compliance
Download Datasheet Parametric View All

HYB25D128800E-7 Overview

DDR DRAM, 16MX8, 0.75ns, CMOS, PDSO66, 0.400 INCH, PLASTIC, TSOP2-66

HYB25D128800E-7 Parametric

Parameter NameAttribute value
Is it Rohs certified?conform to
MakerInfineon
Parts packaging codeTSOP2
package instructionTSOP2,
Contacts66
Reach Compliance Codecompliant
ECCN codeEAR99
access modeFOUR BANK PAGE BURST
Maximum access time0.75 ns
Other featuresAUTO/SELF REFRESH
JESD-30 codeR-PDSO-G66
length22.22 mm
memory density134217728 bit
Memory IC TypeDDR DRAM
memory width8
Number of functions1
Number of ports1
Number of terminals66
word count16777216 words
character code16000000
Operating modeSYNCHRONOUS
Maximum operating temperature70 °C
Minimum operating temperature
organize16MX8
Package body materialPLASTIC/EPOXY
encapsulated codeTSOP2
Package shapeRECTANGULAR
Package formSMALL OUTLINE, THIN PROFILE
Peak Reflow Temperature (Celsius)NOT SPECIFIED
Certification statusNot Qualified
Maximum seat height1.2 mm
self refreshYES
Maximum supply voltage (Vsup)2.7 V
Minimum supply voltage (Vsup)2.3 V
Nominal supply voltage (Vsup)2.5 V
surface mountYES
technologyCMOS
Temperature levelCOMMERCIAL
Terminal formGULL WING
Terminal pitch0.65 mm
Terminal locationDUAL
Maximum time at peak reflow temperatureNOT SPECIFIED
width10.16 mm
HYB25D128800T(L)
128-Mbit Double Data Rate SDRAM
Preliminary Datasheet 2002-04-26
Features
CAS Latency and Frequency
CAS
Latency
2
2.5
Maximum Operating Frequency (MHz)
DDR200
DDR266B DDR266A
DDR333
-8
-7.5
-7
-6
100
100
133
133
125
133
143
166
• Double data rate architecture: two data transfers
per clock cycle
• Bidirectional data strobe (DQS) is transmitted
and received with data, to be used in capturing
data at the receiver
• DQS is edge-aligned with data for reads and is
center-aligned with data for writes
• Differential clock inputs (CK and CK)
• Four internal banks for concurrent operation
• Data mask (DM) for write data.
• DLL aligns DQ and DQS transitions with CK
transitions
• Commands entered on each positive CK edge;
data and data mask referenced to both edges of
DQS
• Burst Lengths: 2, 4, or 8
• CAS Latency: 2, 2.5
• Auto Precharge option for each burst access
• Auto Refresh and Self Refresh Modes
• 15.6
µs
Maximum Average Periodic Refresh
Interval (4k refresh)
• 2.5V (SSTL_2 compatible) I/O
• V
DDQ
= 2.5V
±
0.2V / V
DD
= 2.5V
±
0.2V
• TSOP66 package
Description
The 128Mb DDR SDRAM is a high-speed CMOS,
dynamic random-access memory containing 134,217,728
bits. It is internally configured as a quad-bank DRAM.
The 128Mb DDR SDRAM uses a double-data-rate archi-
tecture to achieve high-speed operation. The double data
rate architecture is essentially a 2n prefetch architecture
with an interface designed to transfer two data words per
clock cycle at the I/O pins. A single read or write access
for the 128Mb DDR SDRAM effectively consists of a sin-
gle 2n-bit wide, one clock cycle data transfer at the inter-
nal DRAM core and two corresponding n-bit wide, one-
half-clock-cycle data transfers at the I/O pins.
A bidirectional data strobe (DQS) is transmitted externally,
along with data, for use in data capture at the receiver.
DQS is a strobe transmitted by the DDR SDRAM during
Reads and by the memory controller during Writes. DQS
is edge-aligned with data for Reads and center-aligned
with data for Writes.
The 128Mb DDR SDRAM operates from a differential
clock (CK and CK; the crossing of CK going HIGH and CK
going LOW is referred to as the positive edge of CK).
Commands (address and control signals) are registered at
every positive edge of CK. Input data is registered on both
edges of DQS, and output data is referenced to both
edges of DQS, as well as to both edges of CK.
Read and write accesses to the DDR SDRAM are burst
oriented; accesses start at a selected location and con-
tinue for a programmed number of locations in a pro-
grammed sequence. Accesses begin with the registration
of an Active command, which is then followed by a Read
or Write command. The address bits registered coincident
with the Active command are used to select the bank and
row to be accessed. The address bits registered coinci-
dent with the Read or Write command are used to select
2002-04-26
the bank and the starting column location for the burst
access.
The DDR SDRAM provides for programmable Read or
Write burst lengths of 2, 4 or 8 locations. An Auto Pre-
charge function may be enabled to provide a self-timed
row precharge that is initiated at the end of the burst
access.
As with standard SDRAMs, the pipelined, multibank archi-
tecture of DDR SDRAMs allows for concurrent operation,
thereby providing high effective bandwidth by hiding row
precharge and activation time.
An auto refresh mode is provided along with a power-sav-
ing power-down mode. All inputs are compatible with the
JEDEC Standard for SSTL_2. All outputs are SSTL_2,
Class II compatible.
Note:
The functionality described and the timing specifi-
cations included in this data sheet are for the DLL Enabled
mode of operation.
Page 1 of 76

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