S25FL032P Known Good Die
32-Mbit CMOS 3.0 Volt Flash Memory with
100-MHz SPI (Serial Peripheral Interface) Multi I/O Bus
Supplement
Distinctive Characteristics
Architectural Advantages
Single power supply operation
– Full voltage range: 2.7 to 3.6V read and write operations
One time programmable (OTP) area for permanent, secure
identification; can be programmed and locked at the factory
CFI (Common Flash Interface) compliant: allows host system
to identify and accommodate multiple flash devices
Process technology
– Manufactured on 0.09 µm MirrorBit
®
process technology
Memory architecture
– Uniform 64 KB sectors
– Top or bottom parameter block (Two 64-KB sectors (top or bottom)
broken down into sixteen 4-KB sub-sectors each)
– 256-byte page size
– Backward compatible with the S25FL032A device
Tested to data sheet specifications at temperature
Quality and reliability levels equivalent to standard
packaged components
Program
–
–
–
–
–
–
–
–
Page Program (up to 256 bytes) in 1.5 ms (typical)
Program operations are on a page by page basis
Accelerated programming mode via 9V W#/ACC pin
Quad Page Programming
Bulk erase function
Sector erase (SE) command (D8h) for 64 KB sectors
Sub-sector erase (P4E) command (20h) for 4 KB sectors
Sub-sector erase (P8E) command (40h) for 8 KB sectors
Performance Characteristics
Speed
– Normal READ (Serial): 40 MHz clock rate
– FAST_READ (Serial): 100 MHz clock rate (maximum)
– DUAL I/O FAST_READ: 80 MHz clock rate or 20 MB/s effective data
rate
– QUAD I/O FAST_READ: 80 MHz clock rate or 40 MB/s effective
data rate
Erase
Power saving standby mode
– Standby Mode 80 µA (typical)
– Deep Power-Down Mode 3 µA (typical)
Cycling endurance
– 100,000 cycles per sector typical
Data retention
– 20 years typical
Memory Protection Features
Memory Protection
– W#/ACC pin works in conjunction with Status Register Bits to
protect specified memory areas
– Status Register Block Protection bits (BP2, BP1, BP0) in status
Device ID
– JEDEC standard two-byte electronic signature
– RES command one-byte electronic signature for backward
compatibility
General Description
The S25FL032P in Known Good Die (KGD) form is a 3.0 Volt (2.7V to 3.6V), single-power-supply Flash memory device.
Spansion defines KGD as standard product in die form, tested for functionality and speed. Spansion KGD products have the
same reliability and quality as Spansion products in packaged form.
S25FL032P Features
The S25FL032P is a 3.0 Volt (2.7V to 3.6V), single-power-supply Flash memory device. The device consists of 64 uniform
64 KB sectors with the two (Top or Bottom) 64 KB sectors further split up into thirty-two 4KB sub sectors. The S25FL032P
device is fully backward compatible with the S25FL032A device.
The device accepts data written to SI (Serial Input) and outputs data on SO (Serial Output). The devices are designed to be
programmed in-system with the standard system 3.0-volt V
CC
supply.
The memory can be programmed 1 to 256 bytes at a time, using the Page Program command. The device supports Sector
Erase and Bulk Erase commands. Each device requires only a 3.0 volt power supply (2.7 V to 3.6 V) for both read and write
functions. Internally generated and regulated voltages are provided for the program operations. This device requires a high
voltage supply to the W#/ACC pin to enable the Accelerated Programming mode.
Electrical Specifications
Refer to the S25FL032P data sheet, publication number S25FL032P_00, for full electrical specifications on the S25FL032P in
KGD form.
Publication Number
S25FL032P_KGD_SP
Revision
01
Issue Date
Febuary 5, 2010
Supplement
3.
3.1
Ordering Information
Standard Products
Spansion KGD products are available different configurations. The order number (Valid Combination) is
formed by a combination of the elements below.
S25FL032P
0X
D
E
I
00
4
DEVICE CARRIER
4 = Die in Surftape™ (Tape and Reel)
2500 per 7 inch reel
7 = Die in Waffle Pack
9 = Wafer in Wafer Jar
MODEL NUMBER
00 = No additional ordering options
TEMPERATURE RANGE
I = Industrial (–40
o
C to +85
o
C)
V = Automotive In-cabin (–40°C to +105°C)
DIE/WAFER OPTION
E = 725 µm thickness without polyimide
PACKAGE TYPE
D = Die with KGD test flow
W = Wafer with KGD test flow
SPEED OPTION
0P = 66 MHz
0X = 100 MHz
DEVICE NUMBER/DESCRIPTION
Valid Combinations
Valid Combinations list configurations planned to be supported in volume for this device. Consult the local
Spansion sales office to confirm availability of specific valid combinations and to check on newly released
combinations.
S25FL032P Valid Combinations
Device Number
Speed Option
Package Type, and Temperature Range
DEI
4,7
DEV
(1)
0P
WEI
9
WEV
(1)
S25FL032P
DEI
(1)
4,7
DEV
(1)
0X
WEI
(1)
9
WEV
(1)
Note
1. Contact factory for availability.
00
Model Number
Device Carrier
4
S25FL032P Known Good Die
S25FL032P_KGD_SP_01 Febuary 5, 2010