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CY7C1446V25-200AC

Description
Cache SRAM, 512KX72, 3ns, CMOS, PQFP100, 14 X 20 MM, 1.40 MM HEIGHT, PLASTIC, TQFP-100
Categorystorage    storage   
File Size967KB,30 Pages
ManufacturerCypress Semiconductor
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CY7C1446V25-200AC Overview

Cache SRAM, 512KX72, 3ns, CMOS, PQFP100, 14 X 20 MM, 1.40 MM HEIGHT, PLASTIC, TQFP-100

CY7C1446V25-200AC Parametric

Parameter NameAttribute value
Is it lead-free?Contains lead
Is it Rohs certified?incompatible
MakerCypress Semiconductor
Parts packaging codeQFP
package instructionLQFP,
Contacts100
Reach Compliance Codecompliant
ECCN code3A991.B.2.A
Maximum access time3 ns
JESD-30 codeR-PQFP-G100
JESD-609 codee0
length20 mm
memory density37748736 bit
Memory IC TypeCACHE SRAM
memory width72
Humidity sensitivity level3
Number of functions1
Number of terminals100
word count524288 words
character code512000
Operating modeSYNCHRONOUS
Maximum operating temperature70 °C
Minimum operating temperature
organize512KX72
Package body materialPLASTIC/EPOXY
encapsulated codeLQFP
Package shapeRECTANGULAR
Package formFLATPACK, LOW PROFILE
Parallel/SerialPARALLEL
Peak Reflow Temperature (Celsius)225
Certification statusNot Qualified
Maximum seat height1.6 mm
Maximum supply voltage (Vsup)2.625 V
Minimum supply voltage (Vsup)2.375 V
Nominal supply voltage (Vsup)2.5 V
surface mountYES
technologyCMOS
Temperature levelCOMMERCIAL
Terminal surfaceTIN LEAD (800)
Terminal formGULL WING
Terminal pitch0.65 mm
Terminal locationQUAD
Maximum time at peak reflow temperature30
width14 mm
PRELIMINARY
CY7C1446V25
CY7C1442V25
CY7C1440V25
1M x 36/2M x 18/512K x 72 Pipelined SRAM
Features
Fast clock speed: 300,250,200, and 167 MHz
Provide high-performance 3-1-1-1 access rate
Fast access time: 2.3, 2.7, 3.0 and 3.5 ns
Optimal for depth expansion
Single 2.5V + 5% / -5%
Separate V
DDQ
for 2.5V or 1.8V I/O
Common data inputs and data outputs
Byte Write Enable and Global Write control
Chip enable for address pipeline
Address, data, and control registers
Internally self-timed Write Cycle
Burst control pins (interleaved or linear burst
sequence)
Automatic power-down for portable applications
High-density, high-speed packages
JTAG boundary scan for BGA packaging version
Available in 119-ball bump BGA, 165-ball FBGA, and
100-lead TQFP packages (CY7C1440V25 and
CY7C1446V25). 209 FBGA package for CY7C1446V25.
address-pipelining Chip Enable (CE), burst control inputs
(ADSC, ADSP, and ADV), Write enables (BWa, BWb, BWc,
BWd, and BWE), and Global Write (GW).
Asynchronous inputs include the Output Enable (OE) and
burst mode control (MODE). The data (DQ
a,b,c,d
) and the data
parity (DP
a,b,c,d
) outputs, enabled by OE, are also
asynchronous.
DQ
a,b,c,d
and DP
a,b,c,d
apply to CY7C1440V25, DQ
a,b,c,d,e,f,g,h
and DP
a,b,c,d,e,f,g,h
apply to CY7C1446V25, and DQ
a,b
and
DP
a,b
apply to CY7C1446V25. a, b, c, d, e, f, g, and h each are
eight bits wide in the case of DQ and one bit wide in the case
of DP.
Addresses and chip enables are registered with either
Address Status Processor (ADSP) or Address Status
Controller (ADSC) input pins. Subsequent burst addresses
can be internally generated as controlled by the Burst Advance
Pin (ADV).
Address, data inputs, and Write controls are registered on-chip
to initiate self-timed Write cycle. Write cycles can be one to
four bytes wide as controlled by the Write control inputs.
Individual byte Write allows individual byte to be written. BWa
controls DQa and DPa. BWb controls DQb and DPb. BWc
controls DQc and DPd. BWd controls DQ and DPd. BWe
controls DQe and DPe. BWf controls DQf and DPf. BWg
controls DQg and DPg. BWh controls DQh and DPh. BWa,
BWb, BWc, BWd, BWe, BWf, BWg, and BWh can be active
only with BWE being LOW. GW being LOW causes all bytes
to be written. Write pass-through capability allows written data
available at the output for the immediately next Read cycle.
This device also incorporates pipelined enable circuit for easy
depth expansion without penalizing system performance.
All inputs and outputs of the CY7C1440V25, CY7C1446V25,
and the CY7C1446V25 are JEDEC-standard JESD8-5-
compatible.
Functional Description
The Cypress Synchronous Burst SRAM family employs
high-speed, low-power CMOS designs using advanced
single-layer polysilicon, triple-layer metal technology. Each
memory cell consists of six transistors.
The CY7C1440V25, CY7C1446V25, and CY7C1446V25
SRAMs integrate 1,048,576 × 36/2,097,152 × 18, and
524,288 × 72 SRAM cells with advanced synchronous
peripheral circuitry and a two-bit counter for internal burst
operation. All synchronous inputs are gated by registers
controlled by a positive-edge-triggered Clock Input (CLK). The
synchronous inputs include all addresses, all data inputs,
Selection Guide
CY7C1440V25
CY7C1446V25
CY7C1446V25
-300
2.2
TBD
TBD
CY7C1440V25
CY7C1446V25
CY7C1446V25
-250
2.4
TBD
TBD
CY7C1440V25
CY7C1446V25
CY7C1446V25
-200
3.1
TBD
TBD
CY7C1440V25 Unit
CY7C1446V25
CY7C1446V25
-167
3.5
ns
TBD
mA
TBD
mA
Maximum Access Time
Maximum Operating Current
Maximum CMOS Standby Current
Commercial
Cypress Semiconductor Corporation
Document #: 38-05187 Rev. **
3901 North First Street
San Jose
CA 95134 • 408-943-2600
Revised April 18, 2002

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