DS1020
Programmable 8-Bit
Silicon Delay Line
www.dalsemi.com
FEATURES
All-silicon time delay
Models with 0.15 ns, 0.25 ns, 0.5 ns, 1 ns,
and 2 ns steps
Programmable using 3-wire serial port or
8-bit parallel port
Leading and trailing edge accuracy
Standard 16-pin DIP or 16-pin SOIC
Economical
Auto-insertable, low profile
Low-power CMOS
TTL/CMOS-compatible
Vapor phase, IR and wave solderable
IN
E
Q/PO
P1
P2
P3
P4
GND
PIN ASSIGNMENT
1
2
3
4
5
6
7
8
16
15
14
13
12
11
10
9
V
CC
OUT
S
P7
P6
C
P5
D
IN
E
Q/PO
P1
P2
P3
P4
GND
1
2
3
4
5
6
7
8
16
15
14
13
12
11
10
9
V
CC
OUT
S
P7
P6
C
P5
D
DS1020 16-pin DIP (300-mil)
See Mech. Drawings Section
DS1020S 16-pin SOIC (300-mil)
See Mech. Drawings Section
PIN DESCRIPTION
IN
P0-P7
GND
OUT
V
CC
S
E
C
Q
D
- Delay Input
- Parallel Program Pins
- Ground
- Delay Output
- +5 Volts
- Mode Select
- Enable
- Serial Port Clock
- Serial Data Output
- Serial Data Input
DESCRIPTION
The DS1020 Programmable 8-Bit Silicon Delay Line consists of an 8-bit, user-programmable CMOS
silicon integrated circuit. Delay values, programmed using either the 3-wire serial port or the 8-bit
parallel port, can be varied over 256 equal steps. The fastest model (-15) offers a maximum delay of
48.25 ns with an incremental delay of 0.15 ns, while the slowest model (-200) has a maximum delay of
520 ns with an incremental delay of 2 ns. All models have an inherent (step-zero) delay of 10 ns. After
the user-determined delay, the input logic state is reproduced at the output without inversion. The
DS1020 is TTL- and CMOS-compatible, capable of driving 10 74LS-type loads, and features both rising
and falling edge accuracy.
The all-CMOS DS1020 integrated circuit has been designed as a reliable, economic alternative to hybrid
programmable delay lines. It is offered in a standard 16-pin auto-insertable DIP and a space-saving
surface mount 16-pin SOIC.
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111799
DS1020
PARALLEL MODE (S=1)
In the PARALLEL programming mode, the output of the DS1020 will reproduce the logic state of the
input after a delay determined by the state of the eight program input pins P0 - P7. The parallel inputs can
be programmed using DC levels or computer-generated data. For infrequent modification of the delay
value, jumpers may be used to connect the input pins to V
CC
and ground. For applications requiring
frequent timing adjustment, DIP switches should be used. The enable pin (E) must be at a logic 1 in
hardwired implementations.
Maximum flexibility is obtained when the eight parallel programming bits are set using computer-
generated data. When the data setup (t
DSE
) and data hold (t
DHE
) requirements are observed, the enable pin
can be used to latch data supplied on an 8-bit bus. Enable must be held at a logic 1 if it is not used to latch
the data. After each change in delay value, a settling time (t
EDV
or t
PDV
) is required before input logic
levels are accurately delayed.
Since the DS1020 is a CMOS design, unused input pins (D and C) must be connected to well-defined
logic levels; they must not be allowed to float.
SERIAL MODE (S = 0)
In the SERIAL programming mode, the output of the DS1020 will reproduce the logic state of the input
after a delay time determined by an 8-bit value clocked into serial port D. While observing data setup
(t
DSC
) and data hold (t
DHC
) requirements, timing data is loaded in MSB-to-LSB order by the rising edge of
the serial clock (C). The enable pin (E) must be at a logic 1 to load or read the internal 8-bit input register,
during which time the delay is determined by the last value activated. Data transfer ends and the new
delay value is activated when enable (E) returns to a logic 0. After each change, a settling time (t
EDV
) is
required before the delay is accurate.
As timing values are shifted into the serial data input (D), the previous contents of the 8-bit input register
are shifted out of the serial output pin (Q) in MSB-to-LSB order. By connecting the serial output of one
DS1020 to the serial input of a second DS1020, multiple devices can be daisy-chained (cascaded) for
programming purposes (Figure 3). The total number of serial bits must be eight times the number of units
daisy-chained and each group of 8 bits must be sent in MSB-to-LSB order.
Applications can read the setting of the DS1020 delay line by connecting the serial output pin (Q) to the
serial input (D) through a resistor with a value of 1k to 10k ohms (Figure 2). Since the read process is
destructive, the resistor restores the value read and provides isolation when writing to the device. The
resistor must connect the serial output (Q) of the last device to the serial input (D) of the first device of a
daisy-chain (Figure 3). For serial readout with automatic restoration through a resistor, the device used to
write serial data must go to a high impedance state.
To initiate a serial read, enable (E) is taken to a logic 1 while serial clock (C) is at a logic 0. After a
waiting time (t
EQV
), bit 7 (MSB) appears on the serial output (Q). On the first rising (0
→
1) transition of
the serial clock (C), bit 7 (MSB) is rewritten and bit 6 appears on the output after a time t
CQV
. To restore
the input register to its original state, this clocking process must be repeated 8 times. In the case of a
daisy-chain, the process must be repeated 8 times per package. If the value read is restored before enable
(E) is returned to logic 0, no settling time (t
EDV
) is required and the programmed delay remains
unchanged.
Since the DS1020 is a CMOS design, unused input pins (P1 - P7) must be connected to well-defined logic
levels; they must not be allowed to float. Serial output Q/P0 should be allowed to float if unused.
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DS1020
DALLAS SEMICONDUCTOR TEST CIRCUIT
Figure 4
TEST SETUP DESCRIPTION
Figure 4 illustrates the hardware configuration used for measuring the timing parameters of the DS1020.
The input waveform is produced by a precision pulse generator under software control. Time delays are
measured by a time interval counter (20 ps resolution) connected to the output. The DS1020 serial and
parallel ports are controlled by interfaces to a central computer. All measurements are fully automated
with each instrument controlled by the computer over an IEEE 488 bus.
TEST CONDITIONS
INPUT:
Ambient Temperature:
Supply Voltage (V
CC
):
Input Pulse:
Source Impedance:
Rise and Fall Time:
25°C
±=3°C
5.0V
±=0.1V
High = 3.0V
±=0.1V
Low = 0.0V
±=0.1V
50 ohms max.
3.0 ns max.
(measured between
0.6V and 2.4V)
Pulse Width:
500 ns (DS1020–15)
500 ns (DS1020–25)
2
µs
(DS1020–50)
4
µs
(DS1020–100)
4
µs
(DS1020–200)
1
µs
(DS1020–15)
1
µs
(DS1020–25)
4
µs
(DS1020–50)
8
µs
(DS1020–100)
8
µs
(DS1020–200)
Period:
NOTE: Above conditions are for test only and do not restrict the operation of the device under other data
sheet conditions.
OUTPUT:
Output is loaded with a 74F04. Delay is measured between the 1.5V level of the rising edge of the input
signal and the 1.5V level of the corresponding edge of the output.
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Embedded System
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