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UPD44165082F5-E50-EQ1

Description
IC,SYNC SRAM,QDR,2MX8,CMOS,BGA,165PIN
Categorystorage    storage   
File Size308KB,32 Pages
ManufacturerRenesas Electronics Corporation
Websitehttps://www.renesas.com/
Download Datasheet Parametric View All

UPD44165082F5-E50-EQ1 Overview

IC,SYNC SRAM,QDR,2MX8,CMOS,BGA,165PIN

UPD44165082F5-E50-EQ1 Parametric

Parameter NameAttribute value
MakerRenesas Electronics Corporation
Parts packaging codeBGA
Contacts165
Reach Compliance Codecompliant
ECCN code3A991.B.2.A
Maximum access time0.38 ns
Maximum clock frequency (fCLK)200 MHz
I/O typeSEPARATE
JESD-30 codeR-XBGA-B165
memory density16777216 bit
Memory IC TypeSTANDARD SRAM
memory width8
Number of terminals165
word count2097152 words
character code2000000
Operating modeSYNCHRONOUS
organize2MX8
Output characteristics3-STATE
encapsulated codeBGA
Encapsulate equivalent codeBGA165,11X15,40
Package shapeRECTANGULAR
Package formGRID ARRAY
Parallel/SerialPARALLEL
power supply1.5/1.8,1.8 V
Certification statusNot Qualified
Maximum standby current0.17 A
Minimum standby current1.7 V
Maximum slew rate0.49 mA
surface mountYES
technologyCMOS
Terminal formBALL
Terminal pitch1 mm
Terminal locationBOTTOM
DATA SHEET
MOS INTEGRATED CIRCUIT
μ
PD44165082, 44165182, 44165362
18M-BIT QDR
TM
II SRAM
2-WORD BURST OPERATION
Description
The
μ
PD44165082 is a 2,097,152-word by 8-bit, the
μ
PD44165182 is a 1,048,576-word by 18-bit and the
μ
PD44165362 is a 524,288-word by 36-bit synchronous quad data rate static RAM fabricated with advanced CMOS
technology using full CMOS six-transistor memory cell.
The
μ
PD44165082,
μ
PD44165182 and
μ
PD44165362 integrate unique synchronous peripheral circuitry and a burst
counter. All input registers controlled by an input clock pair (K and /K) are latched on the positive edge of K and /K.
These products are suitable for application which require synchronous operation, high speed, low voltage, high
density and wide bit configuration.
These products are packaged in 165-pin PLASTIC BGA.
Features
1.8 ± 0.1 V power supply and HSTL I/O
DLL circuitry for wide output data valid window and future frequency scaling
Separate independent read and write data ports with concurrent transactions
100% bus utilization DDR READ and WRITE operation
Two-tick burst for low DDR transaction size
Two input clocks (K and /K) for precise DDR timing at clock rising edges only
Two output clocks (C and /C) for precise flight time and clock skew matching-clock
and data delivered together to receiving device
Internally self-timed write control
Clock-stop capability with
μ
s restart
User programmable impedance output
Fast clock cycle time : 5.0 ns (200 MHz), 6.0 ns (167 MHz), 7.5 ns (133 MHz)
Simple control logic for easy depth expansion
JTAG boundary scan
The information in this document is subject to change without notice. Before using this document, please
confirm that this is the latest version.
Not all products and/or types are available in every country. Please check with an NEC Electronics
sales representative for availability and additional information.
Document No. M15824EJ8V0DS00 (8th edition)
Date Published April 2007 NS CP(N)
Printed in Japan
The mark <R> shows major revised points.
2001
The revised points can be easily searched by copying an "<R>" in the PDF file and specifying it in the "Find what:" field.

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