CAUTION: Do not operate at or near the maximum ratings listed for extended periods of time. Exposure to such conditions may adversely impact product
reliability and result in failures not covered by warranty.
NOTES:
4.
θ
JA
is measured with the component mounted on a high effective thermal conductivity test board in free air. See Tech Brief
TB379
for details.
5. For
θ
JC
, the "case temp" location is the center of the ceramic on the package underside.
6. Post-reflow drift for the ISL71090SEH25 devices can be 100µV typical based on experimental results with devices on FR4 double sided boards. The
engineer must take this into account when considering the reference voltage after assembly.
7. Product capability established by initial characterization. The "EH" version is acceptance tested on a wafer by wafer basis to 50krad(Si) at low dose rate.
8. The output capacitance used for SEE testing is 0.1µF for C
IN
and C
OUT
.
Electrical Specifications
-55°C to +125°C and radiation.
PARAMETER
V
OUT
V
OA
V
OA
V
OA
TC V
OUT
V
IN
I
IN
ΔV
OUT
/ΔV
IN
ΔV
OUT
/ΔI
OUT
V
D
I
SC+
I
SC-
t
R
V
IN
= 5V, I
OUT
= 0, unless otherwise specified. Boldface limits apply over the operating temperature range,
MIN
(Note 9)
-0.05
-0.15
-0.152
MAX
(Note 9)
+0.05
+0.15
+0.152
10
V
OUT
= 2.5V
V
IN
= 4V to 30V, V
OUT
= 2.5V
Sourcing: 0mA
≤
I
OUT
≤
20mA
Sinking: -10mA
≤
I
OUT
≤
0mA
V
OUT
= 2.5V @ 10mA
T
A
= +25°C, V
OUT
tied to GND
T
A
= +25°C, V
OUT
tied to V
IN
90% of final value, C
L
= 1.0µF,
C
C
= open
f = 120Hz
0.1Hz
≤
f
≤
10Hz, V
OUT
= 2.5V
10Hz
≤
f
≤
1kHz, V
OUT
= 2.5V
f = 1kHz, V
OUT
= 2.5V
T
A
= +125°C, 1000Hrs
4
0.930
8
20
40
1.1
55
-61
150
90
1.9
1.6
50
15
30
1.28
18
35
70
1.7
DESCRIPTION
Output Voltage
V
OUT
Accuracy @ T
A
= +25°C (Note 6)
V
IN
= 5V
V
OUT
= 2.5V
CONDITIONS
TYP
2.5
UNIT
V
%
%
%
ppm/°C
V
mA
ppm/V
ppm/mA
ppm/mA
V
mA
mA
µs
dB
µV
P-P
µV
RMS
nV/√Hz
ppm
V
OUT
Accuracy @ T
A
= -55°C to +125°C V
OUT
= 2.5V
V
OUT
Accuracy @ T
A
= -55°C to +125°C, V
OUT
= 2.5V
Post Rad
Output Voltage Temperature
Coefficient (Note 10)
Input Voltage Range
Supply Current
Line Regulation
Load Regulation
Dropout Voltage (Note 11)
Short Circuit Current
Short Circuit Current
Turn-on Settling Time
Ripple Rejection
e
N
V
N
ΔV
OUT
/Δt
NOTES:
Output Voltage Noise
Broadband Voltage Noise
Noise Density
Long Term Drift
9. Compliance to datasheet limits is assured by one or more methods: production test, characterization and/or design.
10. Over the specified temperature range. Temperature coefficient is measured by the box method whereby the change in V
OUT
is divided by the
temperature range; in this case, = 180°C. (i.e., -55°C to +125°C).
11. Dropout Voltage is the minimum V
IN
- V
OUT
differential voltage measured at the point where V
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