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TC7S66F_09

Description
TOSHIBA CMOS Digital Integrated Circuit Silicon Monolithic
File Size154KB,7 Pages
ManufacturerToshiba Semiconductor
Websitehttp://toshiba-semicon-storage.com/
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TC7S66F_09 Overview

TOSHIBA CMOS Digital Integrated Circuit Silicon Monolithic

TC7S66F/FU
TOSHIBA CMOS Digital Integrated Circuit
Silicon Monolithic
TC7S66F,TC7S66FU
Bilateral Switch
The TC7S66 is a high Speed C
2
MOS Bilateral Switch fabricated
with silicon gate C
2
MOS technology.
It consists of a high speed switch capable of controlling either
digital or analog signals while maintaining the C
2
MOS low power
dissipation.
Control input (C) is provided to control the switch.
The switch turns ON while the C input is high, and the switch
turns OFF while low.
Input is equipped with protection circuits against static
discharge or transient excess voltage.
TC7S66F
Features
High speed: t
pd
=
7 ns (typ.) @V
CC
=
5 V
Low power dissipation: I
CC
=
1
μA
(max) @Ta
=
25°C
High noise immunity: V
NIH
=
V
NIL
=
28% V
CC
(min)
Low ON resistance: R
ON
=
100
Ω
(typ.) @V
CC
=
9 V
Low T.H.D: THD
=
0.05% (typ.) @V
CC
=
5 V
Pin and function compatible with TC4S66F
TC7S66FU
Absolute Maximum Ratings
(Ta
=
25°C)
Characteristics
DC Supply voltage
Control input voltage
Switch I/O voltage
Control diode current
Output diode current
Through I/O current
DC V
CC
/ground current
Power dissipation
Storage temperature range
Lead temperature (10 s)
Symbol
V
CC
V
IN
V
I/O
I
CK
I
OK
I
T
I
CC
P
D
T
stg
T
L
Rating
−0.5
to 13
−0.5
to V
CC
+
0.5
−0.5
to V
CC
+
0.5
±20
±20
±12.5
±25
200
−65
to 150
260
Weight
SSOP5-P-0.95 : 0.016 g (typ.)
SSOP5-P-0.65A : 0.006 g (typ.)
Unit
V
V
V
mA
mA
mA
mA
mW
°C
°C
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if
the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum
ratings and the operating ranges.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
1
2009-09-30
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