See Package Number N08E (N), M08A (M8), and MTC08 (MT8)
Pin Names
/CS
SO
/WP
V
SS
SI
SCK
/HOLD
V
CC
Chip Select Input
Serial Data Output
Write Protect
Ground
Serial Data Input
Serial Clock Input
Suspends Serial Data
Power Supply
Ordering Information
FM
25
C
XX
U
LZ
E
XX
Package
Letter Description
N
M8
MT8
None
V
E
Blank
L
LZ
Ultralite
Density/Mode
Interface
040
C
25
FM
8-pin DIP
8-pin SO
8-pin TSSOP
0 to 70°C
-40 to +125°C
-40 to +85°C
4.5V to 5.5V
2.7V to 5.5V
2.7V to 5.5V and
<1µA Standby Current
CS100UL Process
4K, mode 0
CMOS technology
SPI
Fairchild Nonvolatile
Memory Prefix
Temp. Range
Voltage Operating Range
2
FM25C040U Rev. B
www.fairchildsemi.com
FM25C040U 4K-Bit SPI Interface Serial CMOS EEPROM
Standard Voltage 4.5
≤
V
CC
≤
5.5V Specifications
Operating Conditions
Absolute Maximum Ratings
(Note 1)
Ambient Storage Temperature
All Input or Output Voltage with
Respect to Ground
Lead Temp. (Soldering, 10 sec.)
ESD Rating
-65°C to +150°C
+6.5V to -0.3V
+300°C
2000V
Ambient Operating Temperature
FM25C040U
FM25C040UE
FM25C040UV
Power Supply (V
CC
)
0°C to +70°C
-40°C to +85°C
-40°C to +125°C
4.5V to 5.5V
DC and AC Electrical Characteristics
4.5V
≤
V
CC
≤
5.5V (unless otherwise specified)
Symbol
I
CC
I
CCSB
I
IL
I
OL
V
IL
V
IH
V
OL
V
OH
f
OP
t
RI
t
FI
t
CLH
t
CLL
t
CSH
t
CSS
t
DIS
t
HDS
t
CSN
t
DIN
t
HDN
t
PD
t
DH
t
LZ
t
DF
t
HZ
t
WP
Parameter
Operating Current
Standby Current
Input Leakage
Output Leakage
CMOS Input Low Voltage
CMOS Input High Voltage
Output Low Voltage
Output High Voltage
SCK Frequency
Input Rise Time
Input Fall Time
Clock High Time
Clock Low Time
Min /CS High Time
/CS Setup Time
Data Setup Time
/HOLD Setup Time
/CS Hold Time
Data Hold Time
/HOLD Hold Time
Output Delay
Output Hold Time
/HOLD to Output Low Z
Output Disable Time
/HOLD to Output High Z
Write Cycle Time
Conditions
/CS = V
IL
/CS = V
CC
V
IN
= 0 to V
CC
V
OUT
= GND to V
CC
Min
Max
3
50
Units
mA
µA
µA
µA
V
V
V
V
MHz
µs
µs
ns
ns
ns
ns
ns
ns
ns
ns
ns
-1
-1
-0.3
0.7 * V
CC
+1
+1
V
CC
* 0.3
V
CC
+ 0.3
0.4
I
OL
= 1.6 mA
I
OH
= -0.8 mA
V
CC
- 0.8
2.1
2.0
2.0
(Note 2)
(Note 2)
(Note 3)
190
190
240
240
100
90
240
100
90
C
L
= 200 pF
0
100
C
L
= 200 pF
1–16 Bytes
240
100
10
240
ns
ns
ns
ns
ns
ms
Capacitance
T
A
= 25°C, f = 2.1/1 MHz (Note 4)
Symbol
C
OUT
C
IN
AC Test Conditions
Output Load
Input Pulse Levels
Timing Measurement Reference Level
C
L
= 200 pF
0.1 * V
CC
– 0.9 * V
CC
0.3 * V
CC
- 0.7 * V
CC
Test
Output Capacitance
Input Capacitance
Typ Max Units
3
2
8
6
pF
pF
Note 1:
Stress above those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress rating only, and functional operation of the
device at these or any other conditions above those indicated in the operational sections of the specification is not implied. Exposure to absolute maximum rating conditions for
extended periods may affect device reliability.
Note 2:
The f
OP
frequency specification specifies a minimum clock period of 1/f
OP
. Therefore, for every f
OP
clock cycle, t
CLH
+ t
CLL
must be equal to or greater than 1/f
OP
. For
example, for a f
OP
of 2.1MHz, the period equals 476ns. In this case if t C
LH
= is set to 190ns, then t
CLL
must be set to a minimum of 286ns.
Note 3:
/CS must be brought high for a minimum of t
CSH
between consecutive instruction cycles.
Note 4:
This parameter is periodically sampled and not 100% tested.
3
FM25C040U Rev. B
www.fairchildsemi.com
FM25C040U 4K-Bit SPI Interface Serial CMOS EEPROM
Low Voltage 2.7V
≤
V
CC
≤
4.5V Specifications
Operating Conditions
Absolute Maximum Ratings
(Note 5)
Ambient Storage Temperature
All Input or Output Voltage with
Respect to Ground
Lead Temp. (Soldering, 10 sec.)
ESD Rating
-65°C to +150°C
+6.5V to -0.3V
+300°C
2000V
Ambient Operating Temperature
FM25C040UL/LZ
FM25C040ULE/LZE
FM25C040ULV
Power Supply (V
CC
)
0°C to +70°C
-40°C to +85°C
-40°C to +125°C
2.7V–4.5V
DC and AC Electrical Characteristics
2.7V
≤
V
CC
≤
4.5V (unless otherwise specified)
25C040UL/LE
25C040ULZ/ZE
Symbol
I
CC
I
CCSB
I
IL
I
OL
V
IL
V
IH
V
OL
V
OH
f
OP
t
RI
t
FI
t
CLH
t
CLL
t
CSH
t
CSS
t
DIS
t
HDS
t
CSN
t
DIN
t
HDN
t
PD
t
DH
t
LZ
t
DF
t
HZ
t
WP
25C040ULV
Min
Max
3
10
N/A
-1
-1
-0.3
V
CC
* 0.7
V
CC
- 0.8
1
1
V
CC
* 0.3
V
CC
+ 0.3
0.4
1.0
2.0
2.0
410
410
500
500
100
240
500
100
240
Parameter
Operating Current
Standby Current
Input Leakage
Output Leakage
Input Low Voltage
Input High Voltage
Output Low Voltage
Output High Voltage
SCK Frequency
Input Rise Time
Input Fall Time
Clock High Time
Clock Low Time
Min. /CS High Time
/CS Setup Time
Data Setup Time
/HOLD Setup Time
/CS Hold Time
Data Hold Time
/HOLD Hold Time
Output Delay
Output Hold Time
/HOLD Output Low Z
Output Disable Time
/HOLD to Output Hi Z
Write Cycle Time
Part
L
LZ
Conditions
/CS = V
IL
/CS = V
CC
V
IN
= 0 to V
CC
V
OUT
= GND to V
CC
Min.
Max.
3
10
1
Units
mA
µA
µA
µA
µA
V
V
V
V
MHz
µs
µs
ns
ns
ns
ns
ns
ns
ns
ns
ns
-1
-1
-0.3
V
CC
* 0.7
1
1
V
CC
* 0.3
V
CC
+ 0.3
0.4
I
OL
= 0.8 mA
I
OH
= –0.8 mA
V
CC
- 0.8
1.0
2.0
2.0
(Note 6)
(Note 6)
(Note 7)
410
410
500
500
100
240
500
100
240
C
L
= 200 pF
0
240
C
L
= 200 pF
1-16 Bytes
500
240
15
500
0
500
240
500
240
15
ns
ns
ns
ns
ns
ms
Capacitance
T
A
= 25°C, f = 2.1/1 MHz (Note 8)
Symbol
C
OUT
C
IN
AC Test Conditions
Output Load
Input Pulse Levels
Timing Measurement Reference Level
C
L
= 200pF
0.1 * V
CC
- 0.9 * V
CC
0.3 * V
CC
- 0.7 * V
CC
Test
Output Capacitance
Input Capacitance
Typ Max Units
3
2
8
6
pF
pF
Note 5:
Stress above those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress rating only, and functional operation of the device
at these or any other conditions above those indicated in the operational sections of the specification is not implied. Exposure to absolute maximum rating conditions for extended
periods may affect device reliability.
Note 6:
The f
OP
frequency specification specifies a minimum clock period of 1/f
OP
. Therefore, for every f
OP
clock cycle, t
CLH
+ t
CLL
must be equal to or greater than 1/f
OP
. For
example, for a f
OP
of 1MHz, the period equals 1000ns. In this case if t
CLH
= is set to 410ns, then t
CLL
must be set to a minimum of 590ns.
Note 7:
/CS must be brought high for a minimum of t
CSH
between consecutive instruction cycles.
Note 8:
This parameter is periodically sampled and not 100% tested.
[font=Arial][size=2]About the characteristic word of AT89 series MCU: The characteristic word of MCU is its ID card. When AT51pro programmer reads the characteristic word of MCU, the programmer can be...
[size=4][color=#000080]Would you rather work 996 for a high salary, or work 9 to 5 for an average salary? What is your attitude towards overtime? [/color][/size] [size=4] [color=#a0522d](To explain: 9...
Beijing military enterprise is recruiting DSP engineers for satellite navigation (urgently needed) 1. Bachelor degree or above, major in communication, electronic engineering and related majors. 2. Pr...
I encountered a problem in the tree network. I found that after adding the NV_RESTORE option to the coordinator, the original PAN ID can be selected all the time. However, the router child nodes canno...
[align=left][color=#000]When I use the cc254x HIDEmuKbd routine test, it often disconnects automatically. [/color][/align][align=left][color=#000]The program only modifies the startup broadcast uint8 ...
1. Introduction
RFID (radio frequency identification) is a non-contact automatic identification technology that emerged in the 1990s. It uses the characteristics of radio frequency signal prop...[Details]
1. Overview
Will passive devices
produce nonlinear intermodulation distortion? The answer is yes! Although there is no systematic theoretical analysis, it has been found in engineerin...[Details]
introduction
In the discharge process of tokamak plasma physics, the study of rupture and sawtooth is of great significance. Rupture and sawtooth exist in most tokamaks. Rupture is a notew...[Details]
Electronic systems are located at different points on the automotive power bus and therefore often need to operate under very stringent power requirements. These include load dump, cold crank, very lo...[Details]
Power management solutions for today's portable application processors are becoming increasingly integrated. Total power consumption, standby and sleep current consumption affect battery size, bill...[Details]
1. Introduction
Testing the temperature of steel billets before rolling is an important measure to ensure the quality of steel. Traditional manual testing is difficult to ensure product qu...[Details]
Among the many members of the single-chip microcomputer family, the MCS-51 series of single-chip microcomputers has occupied the main market of industrial measurement and control and automation eng...[Details]
From the previous section, we have learned that the timer/counter in the microcontroller can have multiple uses, so how can I make them work for the purpose I need? This requires setting the timer/...[Details]
hint:
The number of speakers and their spacing limit the sound field of a portable stereo system.
Spatial audio attempts to artificially recreate the experience of listening to sounds i...[Details]
To understand how and why OLED power supply affects display image quality, you must first understand OLED display technology and power supply requirements. This article will explain the latest OLED...[Details]
introduction
Incandescent bulbs can emit a variety of light, but in specific applications, only green, red, and yellow light are usually needed - such as traffic lights. If an incand...[Details]
The serial interface real-time clock chip DS1302 launched by Dallas Company in the United States can trickle charge the backup battery of the clock chip. Due to the main features of the chip such a...[Details]
1 Basic Features
In computer control systems and various intelligent instruments and meters composed of single-chip microcomputers (or microprocessors), various external analog signals must be ...[Details]
Introduction
Today, as IC (integrated circuit) has developed to a super-large scale, IC design based on IP (Intellectual Property) cores and their reuse are important means to ensure the ef...[Details]
1 Introduction to LED
With the development of science and technology, people have higher and higher requirements on automobile light sources. LED (Light Emitting Diode) has gradually attracted...[Details]