K4T1G044QQ
K4T1G084QQ
DDR2 1.55V SDRAM
1Gb Q-die DDR2 1.55V SDRAM Specification
60FBGA with Lead-Free & Halogen-Free
(RoHS compliant)
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AND IS SUBJECT TO CHANGE WITHOUT NOTICE.
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EXPRESS OR IMPLIED, BY ESTOPPEL OR OTHERWISE,
TO ANY INTELLECTUAL PROPERTY RIGHTS IN SAMSUNG PRODUCTS OR TECHNOLOGY.
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ON AS "AS IS" BASIS WITHOUT GUARANTEE OR WARRANTY OF ANY KIND.
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* Samsung Electronics reserves the right to change products or specification without notice.
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DDR2 1.55V SDRAM
Table of Contents
1.0 Ordering Information ................................................................................................................... 4
2.0 Key Features ................................................................................................................................ 4
3.0 Package Pinout/Mechanical Dimension & Addressing ............................................................ 5
3.1 x4 package pinout (Top View) : 60ball FBGA Package
..................................................................... 5
3.2 x8 package pinout (Top View) : 60ball FBGA Package
..................................................................... 6
3.3 FBGA Package Dimension (x4/x8)
................................................................................................. 7
4.0 Input/Output Functional Description ......................................................................................... 8
5.0 DDR2 SDRAM Addressing .......................................................................................................... 9
6.0 Absolute Maximum DC Ratings ................................................................................................ 10
7.0 AC & DC Operating Conditions ................................................................................................ 10
7.1 Recommended DC Operating Conditions (SSTL - 1.8)
................................................................... 10
7.2 Operating Temperature Condition
............................................................................................... 11
7.3 Input DC Logic Level
................................................................................................................. 11
................................................................................................................. 11
7.5 AC Input Test Conditions
........................................................................................................... 11
7.6 Differential input AC logic Level
................................................................................................. 12
7.7 Differential AC output parameters
............................................................................................... 12
8.0 ODT DC electrical characteristics ............................................................................................ 12
9.0 IDD Specification Parameters and Test Conditions ............................................................... 13
10.0 DDR2 SDRAM IDD Spec Table ................................................................................................ 15
11.0 Input/Output capacitance ........................................................................................................ 16
12.0 Electrical Characteristics & AC Timing for DDR2-667 .......................................................... 16
7.4 Input AC Logic Level
...................................................................................... 16
12.2 Speed Bins and CL, tRCD, tRP, tRC and tRAS for Corresponding Bin
........................................... 16
12.3 Timing Parameters by Speed Grade
.......................................................................................... 17
13.0 General notes, which may apply for all AC parameters ....................................................... 19
14.0 Specific Notes for dedicated AC parameters ........................................................................ 21
12.1 Refresh Parameters by Device Density
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Rev. 1.2 December 2008
K4T1G044QQ
K4T1G084QQ
DDR2 1.55V SDRAM
Year
2008
2008
2008
2008
- Initial Release
- typo correction
- Updated AC timing table with the JEDEC update(JESD79-2E)
- Updated AC/DC operating condition with the JEDEC update(JESD79-2E)
History
Revision History
Revision
1.0
1.01
1.1
1.2
Month
April
May
July
December
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Rev. 1.2 December 2008
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1.0 Ordering Information
Org.
256Mx4
128Mx8
DDR2-667 5-5-5
K4T1G044QQ-HYE6
K4T1G084QQ-HYE6
DDR2 1.55V SDRAM
Package
60 FBGA
60 FBGA
Note :
1. Speed bin is in order of CL-tRCD-tRP.
2. “H” of Part number(12th digit) stands for Lead-Free, Halogen-Free, and RoHS compliant products.
3. “Y” of Part number(13th digit) stands for Low Voltage product.
2.0 Key Features
Speed
CAS Latency
tRCD(min)
tRP(min)
tRC(min)
DDR2-667 5-5-5
5
15
15
60
Units
tCK
ns
ns
ns
• JEDEC Compliant V
DD
= 1.55V ± 0.05V Power Supply
• V
DDQ
= 1.55V ± 0.05V
• Backward compatible with DDR2 1.8V ± 0.1V
• 333MHz f
CK
for 667Mb/sec/pin
• 8 Banks
• Posted CAS
• Programmable CAS Latency: 3, 4, 5
• Programmable Additive Latency: 0, 1, 2, 3, 4
• Write Latency(WL) = Read Latency(RL) -1
• Burst Length: 4 , 8(Interleave/Nibble sequential)
• Programmable Sequential / Interleave Burst Mode
• Bi-directional Differential Data-Strobe (Single-ended data-
strobe is an optional feature)
• Off-Chip Driver(OCD) Impedance Adjustment
• On Die Termination
• Special Function Support
- 50ohm ODT
- High Temperature Self-Refresh rate enable
• Average Refresh Period 7.8us at lower than T
CASE
85°C,
3.9us at 85°C < T
CASE
< 95
°C
• All of products are Lead-Free, Halogen-Free, and RoHS
compliant
The 1Gb DDR2 SDRAM is organized as a 32Mbit x 4 I/Os x
8banks, 16Mbit x 8 I/Os x 8banks device. This synchronous
device achieves high speed double-data-rate transfer rates of
667Mb/sec/pin (DDR2-667) for general applications.
The chip is designed to comply with the following key DDR2
SDRAM features such as posted CAS with additive latency, write
latency = read latency - 1, Off-Chip Driver(OCD) impedance
adjustment and On Die Termination.
All of the control and address inputs are synchronized with a pair
of externally supplied differential clocks. Inputs are latched at the
crosspoint of differential clocks (CK rising and CK falling). All I/Os
are synchronized with a pair of bidirectional strobes (DQS and
DQS) in a source synchronous fashion. The address bus is used
to convey row, column, and bank address information in a RAS/
CAS multiplexing style. For example, 1Gb(x8) device receive 14/
10/3 addressing.
The 1Gb DDR2 device operates with a single 1.55V ± 0.05V
power supply and 1.55V ± 0.05V V
DDQ
.
The 1Gb DDR2 device is available in 60ball FBGAs(x4/x8).
Note : The functionality described and the timing specifications included in
his data sheet are for the DLL Enabled mode of operation.
Note : This data sheet is an abstract of full DDR2 specification and does not cover the common features which are described in “DDR2 SDRAM Device
Operation & Timing Diagram”.
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3.0 Package Pinout/Mechanical Dimension & Addressing
DDR2 1.55V SDRAM
3.1 x4 package pinout (Top View) : 60ball FBGA Package
1
2
3
4
5
6
7
8
9
A
B
C
D
E
F
G
H
J
K
L
V
DD
NC
V
DDQ
NC
V
DDL
BA2
V
SS
V
DD
NC
V
SSQ
DQ1
V
SSQ
V
REF
CKE
BA0
A10/AP
A3
A7
A12
V
SS
DM
V
DDQ
DQ3
V
SS
WE
BA1
A1
A5
A9
NC
V
SSQ
DQS
V
DDQ
DQ2
V
SSDL
RAS
CAS
A2
A6
A11
NC
DQS
V
SSQ
DQ0
V
SSQ
CK
CK
CS
A0
A4
A8
A13
V
DDQ
NC
V
DDQ
NC
V
DD
ODT0
V
DD
V
SS
Note : V
DDL
and V
SSDL
are power and ground for the DLL. It is recommended that they be isolated on the device from V
DD
,
V
DDQ
, V
SS
, and V
SSQ
.
1
2
3
4
5
6
7
8
9
Ball Locations (x4)
A
B
C
Populated ball
Ball not populated
D
E
F
G
H
Top view
(See the balls through the package)
J
K
L
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