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K4T51083QE-ZLCC

Description
DDR DRAM, 64MX8, 0.6ns, CMOS, PBGA60
Categorystorage    storage   
File Size947KB,45 Pages
ManufacturerSAMSUNG
Websitehttp://www.samsung.com/Products/Semiconductor/
Environmental Compliance  
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K4T51083QE-ZLCC Overview

DDR DRAM, 64MX8, 0.6ns, CMOS, PBGA60

K4T51083QE-ZLCC Parametric

Parameter NameAttribute value
Is it lead-free?Lead free
Is it Rohs certified?conform to
MakerSAMSUNG
package instructionFBGA, BGA60,9X11,32
Reach Compliance Codecompliant
Maximum access time0.6 ns
Maximum clock frequency (fCLK)200 MHz
I/O typeCOMMON
interleaved burst length4,8
JESD-30 codeR-PBGA-B60
JESD-609 codee3
memory density536870912 bit
Memory IC TypeDDR DRAM
memory width8
Humidity sensitivity level1
Number of terminals60
word count67108864 words
character code64000000
Maximum operating temperature95 °C
Minimum operating temperature
organize64MX8
Output characteristics3-STATE
Package body materialPLASTIC/EPOXY
encapsulated codeFBGA
Encapsulate equivalent codeBGA60,9X11,32
Package shapeRECTANGULAR
Package formGRID ARRAY, FINE PITCH
Peak Reflow Temperature (Celsius)225
power supply1.8 V
Certification statusNot Qualified
refresh cycle8192
Continuous burst length4,8
Maximum standby current0.0045 A
Maximum slew rate0.18 mA
Nominal supply voltage (Vsup)1.8 V
surface mountYES
technologyCMOS
Temperature levelOTHER
Terminal surfaceMATTE TIN
Terminal formBALL
Terminal pitch0.8 mm
Terminal locationBOTTOM
Maximum time at peak reflow temperatureNOT SPECIFIED

K4T51083QE-ZLCC Preview

K4T51043QE
K4T51083QE
K4T51163QE
DDR2 SDRAM
512Mb E-die DDR2 SDRAM Specification
60FBGA & 84FBGA with Pb-Free
(RoHS compliant)
INFORMATION IN THIS DOCUMENT IS PROVIDED IN RELATION TO SAMSUNG PRODUCTS,
AND IS SUBJECT TO CHANGE WITHOUT NOTICE.
NOTHING IN THIS DOCUMENT SHALL BE CONSTRUED AS GRANTING ANY LICENSE,
EXPRESS OR IMPLIED, BY ESTOPPEL OR OTHERWISE,
TO ANY INTELLECTUAL PROPERTY RIGHTS IN SAMSUNG PRODUCTS OR TECHNOLOGY. ALL
INFORMATION IN THIS DOCUMENT IS PROVIDED
ON AS "AS IS" BASIS WITHOUT GUARANTEE OR WARRANTY OF ANY KIND.
1. For updates or additional information about Samsung products, contact your nearest Samsung office.
2. Samsung products are not intended for use in life support, critical care, medical, safety equipment, or similar
applications where Product failure couldresult in loss of life or personal or physical harm, or any military or
defense application, or any governmental procurement to which special terms or provisions may apply.
* Samsung Electronics reserves the right to change products or specification without notice.
1 of 45
Rev. 1.8 July 2007
K4T51043QE
K4T51083QE
K4T51163QE
DDR2 SDRAM
Table of Contents
1.0 Ordering Information ....................................................................................................................4
2.0 Key Features .................................................................................................................................4
3.0 Package Pinout/Mechanical Dimension & Addressing .............................................................5
3.1 x4 package pinout (Top View) : 60ball FBGA Package
........................................................................5
3.2 x8 package pinout (Top View) : 60ball FBGA Package
.........................................................................6
3.3 x16 package pinout (Top View) : 84ball FBGA Package
.......................................................................7
3.4 FBGA Package Dimension(x4/x8)
.....................................................................................................8
3.5 FBGA Package Dimension(x16)
.......................................................................................................9
4.0 Input/Output Functional Description ........................................................................................10
5.0 DDR2 SDRAM Addressing .........................................................................................................11
6.0 Absolute Maximum DC Ratings .................................................................................................12
7.0 AC & DC Operating Conditions .................................................................................................12
.......................................................................12
7.2 Operating Temperature Condition
..................................................................................................13
7.3 Input DC Logic Level
....................................................................................................................13
7.4 Input AC Logic Level
....................................................................................................................13
7.5 AC Input Test Conditions
..............................................................................................................13
7.6 Differential input AC logic Level
.....................................................................................................14
7.7 Differential AC output parameters
..................................................................................................14
8.0 ODT DC electrical characteristics .............................................................................................14
9.0 OCD default characteristics ......................................................................................................15
10.0 IDD Specification Parameters and Test Conditions ..............................................................16
11.0 DDR2 SDRAM IDD Spec ...........................................................................................................18
12.0 Input/Output capacitance .........................................................................................................19
13.0 Electrical Characteristics & AC Timing for DDR2-800/667/533/400 ......................................19
13.1 Refresh Parameters by Device Density
........................................................................................19
13.2 Speed Bins and CL, tRCD, tRP, tRC and tRAS for Corresponding Bin
.............................................19
13.3 Timing Parameters by Speed Grade
............................................................................................20
14.0 General notes, which may apply for all AC parameters ........................................................22
15.0 Specific Notes for dedicated AC parameters ..........................................................................23
7.1 Recommended DC Operating Conditions (SSTL - 1.8)
2 of 45
Rev. 1.8 July 2007
K4T51043QE
K4T51083QE
K4T51163QE
DDR2 SDRAM
Year
2006
2006
2006
2006
2006
2007
2007
2007
2007
- Initial Release
- Revised the IDD values
- Revised the IDD values
- Added DDR2-800 CL6
- Added the detailed explanation on the notes for AC parameters
- Corrected Typo
- Added data setup and hold time derating values for single-end DQS
- Corrected Typo
- Corrected Typo
- Updated general and specific notes for AC parameters
History
Revision History
Revision
1.0
1.1
1.2
1.3
1.4
1.5
1.6
1.7
1.8
Month
March
August
September
September
October
March
April
June
July
3 of 45
Rev. 1.8 July 2007
K4T51043QE
K4T51083QE
K4T51163QE
1.0 Ordering Information
Org.
128Mx4
64Mx8
32Mx16
DDR2-800 5-5-5
K4T51043QE-ZC(L)E7
K4T51083QE-ZC(L)E7
K4T51163QE-ZC(L)E7
DDR2-800 6-6-6
K4T51043QE-ZC(L)F7
K4T51083QE-ZC(L)F7
K4T51163QE-ZC(L)F7
DDR2-667 5-5-5
K4T51043QE-ZC(L)E6
K4T51083QE-ZC(L)E6
K4T51163QE-ZC(L)E6
DDR2-533 4-4-4
DDR2 SDRAM
DDR2-400 3-3-3
Package
60 FBGA
60 FBGA
84 FBGA
K4T51043QE-ZC(L)D5 K4T51043QE-ZC(L)CC
K4T51083QE-ZC(L)D5 K4T51083QE-ZC(L)CC
K4T51163QE-ZC(L)D5 K4T51163QE-ZC(L)CC
Note :
1. Speed bin is in order of CL-tRCD-tRP
2. RoHS Compliant
2.0 Key Features
Speed
CAS Latency
tRCD(min)
tRP(min)
tRC(min)
DDR2-800 5-5-5
5
12.5
12.5
57.5
DDR2-800 6-6-6
6
15
15
60
DDR2-667 5-5-5
5
15
15
60
DDR2-533 4-4-4
4
15
15
60
DDR2-400 3-3-3
3
15
15
55
Units
tCK
ns
ns
ns
• JEDEC standard 1.8V ± 0.1V Power Supply
• VDDQ = 1.8V ± 0.1V
• 200 MHz f
CK
for 400Mb/sec/pin, 267MHz f
CK
for 533Mb/sec/
pin, 333MHz f
CK
for 667Mb/sec/pin, 400MHz f
CK
for 800Mb/
sec/pin
• 4 Banks
• Posted CAS
• Programmable CAS Latency: 3, 4, 5, 6
• Programmable Additive Latency: 0, 1 , 2 , 3, 4 , 5
• Write Latency(WL) = Read Latency(RL) -1
• Burst Length: 4 , 8(Interleave/nibble sequential)
• Programmable Sequential / Interleave Burst Mode
• Bi-directional Differential Data-Strobe (Single-ended data-
strobe is an optional feature)
• Off-Chip Driver(OCD) Impedance Adjustment
• On Die Termination
• Special Function Support
-PASR(Partial Array Self Refresh)
-50ohm ODT
-High Temperature Self-Refresh rate enable
• Average Refresh Period 7.8us at lower than T
CASE
85°C,
3.9us at 85°C < T
CASE
< 95
°C
• All of Lead-free products are compliant for RoHS
The 512Mb DDR2 SDRAM is organized as a 32Mbit x 4 I/Os x 4
banks, 16Mbit x 8 I/Os x 4banks or 8Mbit x 16 I/Os x 4 banks
device. This synchronous device achieves high speed double-
data-rate transfer rates of up to 800Mb/sec/pin (DDR2-800) for
general applications.
The chip is designed to comply with the following key DDR2
SDRAM features such as posted CAS with additive latency, write
latency = read latency -1, Off-Chip Driver(OCD) impedance
adjustment and On Die Termination.
All of the control and address inputs are synchronized with a pair
of externally supplied differential clocks. Inputs are latched at the
crosspoint of differential clocks (CK rising and CK falling). All I/Os
are synchronized with a pair of bidirectional strobes (DQS and
DQS) in a source synchronous fashion. The address bus is used
to convey row, column, and bank address information in a RAS/
CAS multiplexing style. For example, 512Mb(x4) device receive
14/11/2 addressing.
The 512Mb DDR2 device operates with a single 1.8V ± 0.1V
power supply and 1.8V ± 0.1V VDDQ.
The 512Mb DDR2 device is available in 60ball FBGAs(x4/x8) and
in 84ball FBGAs(x16).
Note :
The functionality described and the timing specifications included in
this data sheet are for the DLL Enabled mode of operation.
Note :
This data sheet is an abstract of full DDR2 specification and does not cover the common features which are described in “Samsung’s DDR2
SDRAM Device Operation & Timing Diagram”
4 of 45
Rev. 1.8 July 2007
K4T51043QE
K4T51083QE
K4T51163QE
3.0 Package Pinout/Mechanical Dimension & Addressing
DDR2 SDRAM
3.1 x4 package pinout (Top View) : 60ball FBGA Package
1
VDD
NC
VDDQ
NC
VDDL
2
NC
VSSQ
DQ1
VSSQ
VREF
CKE
3
VSS
DM
VDDQ
DQ3
VSS
WE
BA1
A1
A5
A9
NC
A
B
C
D
E
F
G
H
J
K
L
7
VSSQ
DQS
VDDQ
DQ2
VSSDL
RAS
CAS
A2
A6
A11
NC
8
DQS
VSSQ
DQ0
VSSQ
CK
CK
CS
A0
A4
A8
A13
9
VDDQ
NC
VDDQ
NC
VDD
ODT
NC
BA0
A10/AP
VDD
VSS
A3
A7
VSS
VDD
A12
Note :
1. Pin B3 has identical capacitance as pin B7.
2. VDDL and VSSDL are power and ground for the DLL.
Ball Locations (x4)
: Populated Ball
+ : Depopulated Ball
Top View
(See the balls through the Package)
1
A
B
C
D
E
F
G
H
J
K
L
2
3
4
5
6
7
8
9
+
+
+
+
+
+
+
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+
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+
+
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+
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+
5 of 45
Rev. 1.8 July 2007
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