3 – REQUIREMENTS
3.1 – General
The microcircuits are in accordance with the applicable document and as specified herein.
3.2 – Design and construction
3.2.1 – Terminal connections
Depending on the package, the terminal connections shall be is shown in figure 2.
3.2.2 – Lead material and finish
Lead material and finish shall be any option of MIL–STD–1835 tin dipped.
3.2.3 – Package
The macrocircuits are packaged in a hermetically sealed ceramic package which is conform to case outlines of MIL–STD–1835 :
– 40 lead DIL, Dual In Line,
– 44 lead LCCC.
The precise case outlines are described into MIL–STD–1835, and also §9.
3.3 Electrical characteristics
3.3.1 – Absolute maximum ratings (Table 1)
Limiting conditions (ratings) defined below shall not be for inspection purposes. Some limiting conditions (ratings) may however
be taken in other parts of this specification as detail conditions for an applicable test.
If limiting condition(s) is (are) got over during testing or using of the component, the device can be damaged, even destroyed.
Anyhow, component characteristics can be disturbed and they are not guaranteed any more.
Table 1 – Absolute maximum ratings
Unless otherwise stated, all voltages are referenced to the reference terminal as defined in Figure 3.
Symbol
V
CC
V
PP
V
I
V
O
V
OZ
I
O
I
I
P
D
max.
T
stg
T
lead
Note :
Supply voltage
Programming supply voltage
Input voltages
Output voltages
Off–state voltage
Output curents
Input currents
Max. power–dissipation
Storage temperature
Lead temperature (soldering : 10 s)
– 65
(Except A9)
(A9)
Parameter
Min
–0.6
–0.6
–0.6
–0.6
–0.6
–0.6
Max
7
14
6.5
13.5
V
CC
+ 1
V
CC
+ 1
5
15
250
+ 150
+ 300
Unit
V
V
V
V
V
V
mA
mA
mW
°C
°C
Stresses above those listed under ”Absolute maximum ratings” may cause permanent damage to the device. This
is a stress rating only and functional operation of the device at these or any other conditions above those indicated
in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for
extended periods may affect device reliability.
3.3.2 – Recommended conditions of use and guaranteed characteristics
a) Guaranteed characteristics (Tables 4 and 5)
The characteristics associated to a specified meaxurement in the detail specification shall only be for inspection purposes.
Such characteristic defined in this specification in guaranteed only under the conditions and within the limits which are specified
for the relevant measurement. Unless otherwise specified, this guarantee applies within all the recommanded operating ranges
specified below.
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FPGA/CPLD
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