C1210Z162JBGAH datasheet, PDF - EEWORLD Datasheet

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C1210Z162JBGAH: DescriptionCeramic Capacitor, Multilayer, Ceramic, 50V, 5% +Tol, 5% -Tol, BP, 30ppm/Cel TC, 0.0016uF, Surface Mount, 1210, CHIP; CategoryPassive components capacitor; File Size170KB，4 Pages; ManufacturerKEMET; Websitehttp://www.kemet.com

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C1210Z162JBGAH Overview

Ceramic Capacitor, Multilayer, Ceramic, 50V, 5% +Tol, 5% -Tol, BP, 30ppm/Cel TC, 0.0016uF, Surface Mount, 1210, CHIP

C1210Z162JBGAH Parametric

Parameter Name	Attribute value
Maker	KEMET
package instruction	, 1210
Reach Compliance Code	compli
ECCN code	EAR99
capacitance	0.0016 µF
Capacitor type	CERAMIC CAPACITOR
dielectric materials	CERAMIC
JESD-609 code	e0
Manufacturer's serial number	C
Installation features	SURFACE MOUNT
multi-layer	Yes
negative tolerance	5%
Number of terminals	2
Maximum operating temperature	125 °C
Minimum operating temperature	-55 °C
Package shape	RECTANGULAR PACKAGE
method of packing	TRAY
positive tolerance	5%
Rated (DC) voltage (URdc)	50 V
size code	1210
surface mount	YES
Temperature characteristic code	BP
Temperature Coefficient	30ppm/Cel ppm/°C
Terminal surface	TIN LEAD
Terminal shape	WRAPAROUND

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CERAMIC HIGH RELIABILITY MOLDED & CHIPS

GENERAL INFORMATION MIL-PRF-123

INTRODUCTION

MIL-PRF-123 specification covers the general requirements for high

reliability, general purpose (BX) and temperature stable (BP) ceramic

dielectric fixed capacitors for space, missile, and other high reliability

applications. Capacitors covered by MIL-PRF-123 may be used in

critical frequency determining applications, timing circuits, and other

applications where absolute stability is required (BP) and in applica-

tions where appreciable variations in capacitance with respect to

temperature, voltage, frequency, and life can be tolerated (BX).

10.

Radiographic Inspection

(leaded devices only) (100% of lot).

11.

Visual Inspection

per MIL-PRF-123 criteria.

12.

Destructive Physical Analysis

per EIA-469 and MIL-PRF-123.

SAMPLE TESTS

The following Group B tests shall be performed on samples from

each lot, which have been subjected to and have passed Group A

inspection.

Thermal Shock—Performed

in accordance to MIL-STD-202,

Method 107, Condition A, with step 3 being 125°C. Number of

cycles shall be 100.

Life Test per MIL-5TD-202, Method 108.

Test temperature and

tolerance is +125°C +4, -0°C. Capacitors shall be subjected to

2X rated voltage for 1000 hours.

Humidity, steady state, low voltage per MIL-STD-202,

Method 103, Condition A.

Capacitors shall be subjected to an

environment of 85°C with 85% relative humidity for 240 hours

minimum. Cycling shall not be performed. A dc potential of 1.3

±0.25 volts shall be applied continuously through a 100,000

ohm resistance to each device under test. At completion, 25°C

IR and Cap are read.

Voltage-temperature limits—Capacitance

is measured at var-

ious temperatures (-55°C to +125°C) with and without rated

voltage.

Moisture Resistance per MIL-STD-202, Method 106.

There

shall be 20 continuous cycles. During the first 10 cycles only, a

dc potential of 50 volts shall be applied across the capacitor ter-

minals. Once each day, a check shall be performed to deter-

mine whether a capacitor has shorted. Vibration cycle of MIL-

STD-202, Method 106, Step 7b shall not be performed. Upon

completion of MIL-STD-202, Method 106, Step 6 of the final

cycle, capacitors shall be measured for capacitance, dielectric

withstanding voltage and insulation resistance.

The following Group C tests shall be performed on samples selected

from lots that have passed Group A and have been submitted for

Group B inspection. Samples shall be selected every two months.

1. Terminal Strength

2. Solderability

3. Resistance to Soldering Heat

4. Solvent Resistance (Leaded devices only)

All lots shipped must have been subjected to and passed Group A

and B testing.

SCREENING TESTS

Each lot has the following In-Process Inspections performed:

1. 100% C-SAM (C-Mode Surface Acoustical Microscopy)

2. In-Process Destructive Physical Analysis

3. 100% visual inspection at a minimum of 10X magnification

4. Pre-encapsulation terminal strength evaluation (leaded devices

only). Radial leaded capacitors must meet a minimum lead pull

of 1.8 kg (4.0 lbs.).

The following Group A shall be performed on each lot:

Thermal Shock—Performed

in accordance to MIL-STD-202,

Method 107, Condition A, with step 3 being 125°C. Number of

cycles shall be 20 (100% of lot).

Voltage Conditioning—The

voltage conditioning shall consist

of applying twice the rated voltage to the units at the maximum

rated temperature of 125°C for a minimum of 168 hours and a

maximum of 264 hours. The voltage conditioning may be termi-

nated at any time during 168 hours to 264 hours time interval

that confirmed failures meet the requirements for the PDA dur-

ing the last 48 hours listed in Table I below (100% of lot).

Optional Voltage Conditioning (Accelerated Voltage

Conditioning)—AII

conditions of the standard voltage condi-

tioning apply with the exception of the increased voltage and the

decreased test time. (Refer to Mil-PRF-123 for formula.)

*Step 5

is performed on chips at this point (100% of lot).

Dielectric Withstanding Voltage

250% of the dc rated voltage

at 25°C (100% of lot).

Insulation Resistance—The

25°C measurement with rated

voltage applied shall be the lesser of 100 GΩ or 1000 megohm-

microfarads (100% of lot).

*5.Insulation

Resistance—The

125°C measurement with rated

voltage applied shall be the lesser of 10 GΩ or 100 megohm-

microfarads (1000% of lot). For chips 125°C IR is performed

prior to step 3 above.

Storage

at 150°C for 2 hours minimum without voltage applied

followed by a 12-hour minimum stabilization period (tempera-

ture characteristic BX only).

Capacitance

must be within specified tolerance at 25°C (100%

of lot).

Cap Exclusion:

Capacitance values no more than 5% or

.5 pF, whichever is greater, for BX characteristics or 1% or .3 pF,

whichever is greater, for BP characteristics beyond specified tol-

erance limit shall be removed from the lot but shall not be con-

sidered defective for determination of the PDA.

Dissipation Factor

shall not exceed 2.5% for X dielectric,

0.15% for G dielectric at 25°C (100% of lot).

Percent Defective Allowable (PDA).

The following table lists

the PDA requirements for MIL-PRF-123 Group A:

TABLE I

BURN IN PDA

LAST 48 HOURS

1 unit or 0.1%

1 unit or 0.2%

1 unit or 0.1%

STANDARD PACKAGING FOR

MIL-PRF-123 IS AS FOLLOWS:

C052Z

C062Z

C512Z

tray

1 pc. per bag

C0805Z

C1206Z

C1210Z

C1808Z

C1812Z

C1825Z

C2225Z

chip

tray

DATA PACKAGE

A data package is sent with each shipment which contains:

1. Summary of Group A testing

2. Summary of Group B testing

3. Group B Variables Test Data

4. Lead Pull Data (Leaded Devices Only)

5. Final Destructive Physical Analysis Report

6. Certificate of Compliance stating that the ceramic capacitors

supplied meet all the requirements of MIL-PRF-123, the applic-

able slash sheet(s) and all associated documents.

KEMET

STYLE

C052Z

C062Z

C512Z

C0805Z

C1210Z

C1808Z

C2225Z

C1206Z

C1812Z

C1825Z

MIL

STYLE

CKS05

CKS06

CKS07

CKS51

CKS52

CKS53

CKS54

CKS55

CKS56

CKS57

PDA

OVERALL

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