GMT04X7R221J10XT-10 datasheet, PDF

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GMT04X7R221J10XT-10: DescriptionCeramic Capacitor, Multilayer, Ceramic, 10V, 5% +Tol, 5% -Tol, X7R, 15% TC, 0.00022uF, Surface Mount, 0402, CHIP; CategoryPassive components capacitor; File Size19MB，19 Pages; ManufacturerCal-Chip Electronics; Environmental Compliance

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GMT04X7R221J10XT-10 Overview

Ceramic Capacitor, Multilayer, Ceramic, 10V, 5% +Tol, 5% -Tol, X7R, 15% TC, 0.00022uF, Surface Mount, 0402, CHIP

GMT04X7R221J10XT-10 Parametric

Parameter Name	Attribute value
Is it Rohs certified?	conform to
Maker	Cal-Chip Electronics
package instruction	, 0402
Reach Compliance Code	compli
capacitance	0.00022 µF
Capacitor type	CERAMIC CAPACITOR
dielectric materials	CERAMIC
high	0.55 mm
JESD-609 code	e2
length	1 mm
Installation features	SURFACE MOUNT
multi-layer	Yes
negative tolerance	5%
Number of terminals	2
Maximum operating temperature	125 °C
Minimum operating temperature	-55 °C
Package form	SMT
method of packing	TR, Paper, 7 Inch
positive tolerance	5%
Rated (DC) voltage (URdc)	10 V
Guideline	AEC-Q200
size code	0402
surface mount	YES
Temperature characteristic code	X7R
Temperature Coefficient	15% ppm/°C
Terminal surface	Tin/Nickel (Sn/Ni)
Terminal shape	WRAPAROUND
width	0.5 mm

GMT04X7R221J10XT-10 Preview

G Srs

MT ei

•Part Numbering

GMT

Product

Type

AEC0200

Qualified

Dimensions

04:0402

10:0603

21:0805

31:1206

102

Dielectric

CG NPO/COG

X7R X7R

Capacitance

(pF)

OR5 0.5pF

5R05pF

100 10pF

101 100pF

102 1000pF

103 .01uF

104 .1uF

105 1.0uF

106 10uF

Tolerance

A:::t:0.05pF

B:::t:0.1 pF

C:::t:0.25pF

D:::1:0.SpF

F:::1:1%

G:::1:2%

J:::1:5%

K:::1:10%

M:::1:20-%

Voltage

6R3: 6.3 DC

10: 10 DC

16: 16 DC

25: 25 DC

50: 50 DC

100 100DC

200 200 DC

Packaging

Code

Reel

Size

NT Tape & R

eel

XT: SOFT TERM

4• 4K reel

10 1 OK reel

15 15K reel

"See packaging

quantity on page

1 for more info

•standard Electrical Specifications

Dielectric

Size

Capacitance range•

Capacitance tolerance••

Rated voltage (WVDC)

Tan½·

Insulation resistance at Ur

Operating temperature

Capacitance characteristic

Termination

±30ppm/'C

NPO

0402.0603, 0805,

1206

0.5pF to 0.01uF

CapS5pF:

A (±0.05pF ), B (±0.1pF), C (±0.25pF)

5pF<Cap<10pF:B (±0.1pF) ,C (±0.25pF), D (±0.5pF)

Ca½10pF

F (±1%),

(±2%),

(±5%)

10V,

16V,25V,S0V, 100V,200V

<30 F:Q½400+20C

a½

OpF: ½1000

½10GO or RxC½SOOOxF whichever is

less

-55 to +125'C

Ni/Sn (lead-free

termination)

X7R

0402,0603,0805, 1206

100pF to

1µF

J (±5%)

K (±10%), M (±20%)

10V,

16V, 25V,SOV

Note

±15%

• Measured at the condition of 30-70% related humidity.

NPO: Apply 1.0±0.2Vnns, 1.0MHz:1:10% for CapS1000pF and 1.0±0.2Vnns, 1.0kHz:1:10% for Cap>1000pF, 25'C at ambient temperature

Measured at 1.0±0.2Vrms, 1.0kHz:1:10% for Cs1 OµF; 0.5±0.2Vrms, 120Hz±20% for C>10µF, 30-70% related

humidity,

25'C ambient temperature for

X7R.

•• Preconditioning for

Class

MLCC: Perform a heat treatment at 150:1:10'C for 1

hour,

then

leave

a mbient condition for 24±2

hours

before

measurement.

Note 1: X?R

l"!ated

½ol.

,;;50V

½5V

125V

16V

10V

'5.3V

l).F.:.

:.2.5%

½3.5%

:a,3.5%

:.5%

:,1()%

Exception of D.F.

:.i3o/o

:.5%

tl603.:.o.o47µF; oeo5;,;o.1eµF:12os;;:;o.47µF

0603.:;

µF; 0805ie:.1µF;1206;,;4.7µF;

1210<1; 10µF

P805a2.2µF;

1210;;: 1

OµF

peo5.:;

µF;

1210;;:;

1oµF

1210,;;4.7µF

S:10%

:;;10%

;5;5%

½70/o

:.5%

S:10%

:;;10%

:.10%

1)402i?;0.10µF;0603ie;0.47µF; 0805ie;2.2µF;1206.,;6.8µF

;

1210ii:.22µF

ll60320.33µF;

12062;4.7µF

1)402ie;0.033µF;

0603ie;0.15µF; 0805ie;0.68µF;1206ie;2.2µF;1210ie; 4.7µF

1)402;,; 0.47uF; oso3;,;o.seµF;oeo5;,;2.2µF;12os;,;4_7µF;

1210;,;22µF

1)402.:0.33µF;0603.: 0.33µF; 0805.:

2.2µF;

1206½

2.2µF;121

O.:

22µF

:.15%

;515%

;,;i20%

1)402.:1µF

l4v

:.15%

1)4022:.2.2µF

p402,;,;

µF;0603<':

10µF;

08052;4.7µF;

1206<":47µF

:1210;;,

100µF

-·

Calchip Electronics, INC.

Phone: (215) 942-8900

www.calchipelectronics.com

Fax : (215) 942-6400

NGO/COG

DIMENSION (MM)

Rated Voltage

Cap. Range

0.5pF

0.6

0.7

0.8

0.9

1.2

1.5

1.8

2.2

2.7

3.3

3.9

4.7

5.6

6.8

8.2

100

120

150

180

220

270

330

390

470

560

680

820

1000

1200

1500

180

2200

2700

3300

3900

4700

5600

6800

8200

0.010 uF

0R5

0R6

0R7

0R8

0R9

1R0

1R2

1R5

1R8

2R2

2R7

3R3

3R9

4R7

5R6

6R8

8R2

100

120

150

180

220

270

330

390

470

560

680

820

101

121

151

181

221

271

331

391

471

561

681

821

102

122

152

182

222

272

332

392

472

562

682

822

103

GMT04 (0402)

GMT10 (0603)

100

200

GMT21 (0805)

100

GMT31 (1206)

100

0.55 mm

0.7mm

0.87mm

0.9mm

.95mm

1.05mm

1.35mm

Calchip Electronics, INC.

Phone: (215) 942-8900

www.calchipelectronics.com

Fax : (215) 942-6400

X7R

DIMENSION (MM)

Rated Voltage

Cap. Range

100 pF

120

150

180

220

270

330

390

470

560

680

820

1000

1200

1500

1800

2200

2700

3300

3900

4700

5600

6800

8200

0.010uF

0.012

0.015

0.018

0.022

0.027

0.033

0.039

0.047

0.056

0.068

0.082

0.10

0.12

0.15

0.18

0.22

0.27

0.33

0.39

0.47

0.56

0.68

1.00

2.20

101

121

151

181

221

271

331

391

471

561

681

821

102

122

152

182

222

272

332

392

472

562

682

822

103

123

153

183

223

273

333

393

473

563

683

823

104

124

154

184

224

274

334

394

474

564

684

105

225

GMT04 (0402)

GMT10 (0603)

GMT21 (0805)

GMT31 (1206)

100

0.55 mm

0.87mm

0.95mm

0.9mm

1.05mm

1.3mm

1.35mm

1.80mm

Calchip Electronics, INC.

Phone: (215) 942-8900

www.calchipelectronics.com

Fax : (215) 942-6400

•· Reliability Test Conditions and Dimensions

No.

Pre-and

AEC-Q200

Test Item

AEC-Q200 Test Condition

Requirements

High Temperature

MIL-STD-202

Method 108

Electrical Test

Post-Stress

Test temp.: 150:i:3'C

Exposure (Storage):· Unpowered.

No remarkable damage.

Cap change : NPO: within ±2.5% or ±0.25pF whichever is

larger.

X7R: within ±10.00%.

Test time:

1000+24/-0

hrs.

,Nrg·2a p½½½½F, Q<!,1 000;

Cap<-30pF,

Q<!,4oo+2oc.

Measurement to be made after keeping at ?

- -r-----.-----------------------,

,room temp. for 24±2 hrs.

Rate d

.F.;:;, Exception of D.F.

;:;;

vol. t>

!·

;:;,6% 0603<1;0.047µF; 0805<1;0.18µF; 1206<1;0.47µF

<1;50V ;:;,3% ;:;,10% 1210<1;4.?µF

;:;,5% ;:;,20% 0805<!,2,2µF;1210<1;10µF

;:;;5%

;:;,10% 0805<1;1µF; 1210<1;10µF

35V

25V

;:;,20% 0603,1; 1µF; 0805,1; 1µF;1206<1;4.7µF; 1210,1; 10µF

;:;.14%

0603<1;0.33µF;1206<1;4.7µF

0402<1;0.10µF;0603<1; 0.47µF;0805<1; 2.2µF;1206,1; 6.BµF;

515'¾

1210<1;22µF

;:;,

10%

0603,1; 0.15µF;0B05,1; 0.68µF;1206,1; 2.2µF;1210.1;4.7µF

k)402<1;0.033µF;0603<1;0.68µF;0B05<1;2.2µF;

:16V

;:;. % 515'¾

1205;:;:4,?uF; 1210222uF

___.

'¾ 0402<1;0.33µF; 0603<1;0.33µF;0805<1;2.2µF;

'¾

515

0 1206<1;2.2µF; 1210<1;22µF

;:;,7.5

: 10V

;:;,20%

kl4

02.1;1µF

__________

:-----. ---.

-1

o-2_

,1;_

1_.

_ - _

6_0

_ _ _

_ _

µF;0 3

,1;

µF ;

kl4

6,3V

;:;,

151/o

;:;;3o

1/o

oao5;:;:4,7uF;1206247uF;1210;:;: 100µF

____________ __________________

whichever

smaller.

!l-4-,

V-+-;:i;-2_0_%+----1--------'---------,._.._....., _._

..... ______

-I

! Class II (X7R)

!°

I.R.: <!,10GOor RxC<!,500O-F

! Rate d voltage

Resistance

"'" - _ _ _ _ _ __________________--1..;.a.=="'--!

! 1oov: X?R

:50V:0603<!,1µF;0805<!,1µF;1206<!,4,7µF;1210<!,4,7µF

!1-3 V:o ao 5

<!,

2 .2µ_F;12

10µ

_____

!5 _ _ _ _ _ _ _

________1GOor RxC

_ _ _

.1;_

_ _

,1;

10 O-F

25V:0402<!,1µF;0603<!,2,2µF;0805<!,2,2µF;1206<!,1 0µF;1210<!,10µF

! 16V:0402<!,0,22µF;0603<!,1µF;0805<!,2,2µF;1206<!,10µF;1210<!,47µF

½½½ ½:r½er is

! 10V: 0402<!,0.47µF;0603<!,0.47µF;0805<!,2,2µF;

1206<!,4,7µF;1210<!,47µF

:6.3V;

4V;

•½-------------------------½

Insulation

Destructive

EIA-469

Physical Analysis

Per EIA-469

••

!No defects or abnormalities

Calchip Electronics, INC.

Phone: (215) 942-8900

www.calchipelectronics.com

Fax : (215) 942-6400

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