Preliminary
EM7164SU16W Series
1Mx16 Single Transistor RAM
Document Title
1M x 16 bit Single Transistor RAM
Revision History
Revision No.
0.0
0.1
History
Initial Draft
2’nd Draft
Add net die and pad coordinates
Draft Date
Jun. 07 , 2005
Aug. 22 , 2005
Remark
Preliminary
4F Korea Construction Financial Cooperative B/D, 301-1 Yeon-Dong, Jeju-Si, Jeju-Do, Rep.of Korea
Tel : +82-64-740-1700 Fax : +82-64-740-1749~1750 / Homepage : www.emlsi.com
Emerging Memory & Logic Solutions Inc.
Zip Code : 690-717
The attached datasheets are provided by EMLSI reserve the right to change the specifications and products. EMLSI will answer to your
questions about device. If you have any questions, please contact the EMLSI office.
1
Preliminary
EM7164SU16W Series
1Mx16 Single Transistor RAM
1M x16 bit Single Transistor RAM
GENERAL DESCRIPTION
The EM7164SU16 is 16,777,216 bits of Single Transistor RAM which uses DRAM type memory cells, but
this device has refresh-free operation and extreme low power consumption technology. Furthermore the
interface is compatible to a low power Asynchronous type SRAM. The EM7164SU16 is organized as
1,048,576 Words x 16 bit.
FEATURES
- Organization :1M x16
- Power Supply Voltage : 2.7 ~ 3.3V
- Separated I/O power(VccQ) & Core power(Vcc)
- Three state outputs
- Byte read/write control by UB/LB
- Support Direct Deep Power Down control by ZZ and Auto TCSR for power saving
PRODUCT FAMILY
Part Number
Operating Temp.
Power Supply
Speed
(t
RC
)
Power Dissipation
(I
SB1
, Max.)
Standby
(I
CC2
, Max.)
Operating
EM7164SU16W
-25
o
C to 85
o
C
2.7V to 3.3V
70ns
80uA
25mA
FUNCTION BLOCK DIAGRAM
/ZZ
/CS
/UB
/LB
/WE
/OE
Self-Refresh
CONTROL
CONTROL
LOGIC
COLUMN SELECT
ROW SELECT
A0~A19
ADDRESS
DECODER
Memory Array
1M X 16
DQ0~
DQ15
Din/Dout BUFFER
I/O CIRCUIT
2
Preliminary
EM7164SU16W Series
1Mx16 Single Transistor RAM
1M x16 bit Single Transistor RAM
GENERAL WAFER SPECIFICATIONS
- Process Technology : 0.13um CMOS Deep trench process
- 3 Metal layers including local inter-connection
- Wafer thickness : 725 +/- 25um
- Minimum Pad Pitch : 100um
- Wafer diameter : 8-inch
PAD DESCRIPTION
Name
/CS
/OE
/WE
/ZZ
Function
Chip select inputs
Output enable input
Write enable input
Low Power Control
Name
/LB
/UB
VCC
VCCQ
Function
Lower byte (DQ
0~7
)
Upper byte (DQ
8~15
)
Power supply
I/O Power supply
60
1
DQ
0-15
Data In-out
A
0-19
Address inputs
VSS(Q) Ground
NC
No connection
y
+
(0.0)
30
x
DEVICE CODE
(EM716XSU16)
31 32
3
Preliminary
EM7164SU16W Series
1Mx16 Single Transistor RAM
ABSOLUTE MAXIMUM RATINGS
1)
Parameter
Voltage on Any Pin Relative to Vss
Voltage on Vcc supply relative to Vss
Power Dissipation
Storage Temperature
Operating Temperature
Symbol
V
IN
, V
OUT
V
CC
, V
CCQ
P
D
T
STG
T
A
Ratings
-0.2 to V
CCQ
+0.3V
-0.2
2)
to 3.6V
1.0
-65 to 150
-25 to 85
Unit
V
V
W
o
C
o
C
1.
Stresses greater than those listed above “Absolute Maximum Ratings” may cause permanent damage to the device. Functional
operation should be restricted to recommended operating condition. Exposure to absolute maximum rating conditions for extended
periods may affect reliability.
2. Undershoot at power-off : -1.0V in case of pulse width < 20ns
FUNCTIONAL DESCRIPTION
CS
H
X
X
L
L
L
L
L
L
L
L
ZZ
H
L
H
H
H
H
H
H
H
H
H
OE
X
X
X
H
H
L
L
L
X
X
X
WE
X
X
X
H
H
H
H
H
L
L
L
LB
X
X
H
L
X
L
H
L
L
H
L
UB
X
X
H
X
L
H
L
L
H
L
L
DQ
0~7
High-Z
High-Z
High-Z
High-Z
High-Z
Data Out
High-Z
Data Out
Data In
High-Z
Data In
DQ
8~15
High-Z
High-Z
High-Z
High-Z
High-Z
High-Z
Data Out
Data Out
High-Z
Data In
Data In
Mode
Deselected
Deselected
Deselected
Output Disabled
Output Disabled
Lower Byte Read
Upper Byte Read
Word Read
Lower Byte Write
Upper Byte Write
Word Write
Power
Stand by
Deep Power Down
Stand by
Active
Active
Active
Active
Active
Active
Active
Active
Note: X means don’t care. (Must be low or high state)
4
Preliminary
EM7164SU16W Series
1Mx16 Single Transistor RAM
RECOMMENDED DC OPERATING CONDITIONS
1)
Parameter
Supply voltage
Ground
Input high voltage
Input low voltage
1.
2.
3.
4.
Symbol
V
CC
V
CCQ
V
SS
, V
SSQ
V
IH
V
IL
Min
2.7
2.7
0
0.8 * V
CCQ
-0.2
3)
Typ
3.0
3.0
0
-
-
Max
3.3
3.3
0
V
CCQ
+ 0.2
2)
0.2 * V
CCQ
Unit
V
V
V
V
V
T
A
= -25 to 85
o
C, otherwise specified
Overshoot: V
CC
+1.0 V in case of pulse width < 20ns
Undershoot: -1.0 V in case of pulse width < 20ns
Overshoot and undershoot are sampled, not 100% tested
.
CAPACITANCE
1)
(f =1MHz, T
A
=25
o
C)
Item
Input capacitance
Input/Ouput capacitance
1. Capacitance is sampled, not 100% tested
Symbol
C
IN
C
IO
Test Condition
V
IN
=0V
V
IO
=0V
Min
-
-
Max
8
8
Unit
pF
pF
DC AND OPERATING CHARACTERISTICS
Parameter
Input leakage current
Output leakage current
Symbol
I
LI
I
LO
I
CC1
Average operating current
I
CC2
Output low voltage
Output high voltage
V
OL
V
OH
I
SB1
Test Conditions
V
IN
=V
SS
to V
CCQ
, V
CC=
V
CCmax
CS=V
IH
, /ZZ=V
IH
, OE=V
IH
or WE=V
IL
,
V
IO
=V
SS
to V
CCQ
, V
CC=
V
CCmax
Cycle time=1µs, 100% duty, I
IO
=0mA,
CS<0.2V, ZZ=V
IH
, V
IN
<0.2V or V
IN
>V
CCQ
-0.2V
Cycle time = Min, I
IO
=0mA, 100% duty,
CS=V
IL
, ZZ=V
IH
, V
IN
=V
IL
or V
IH
I
OL
= 0.5mA, V
CC=
V
CCmin
I
OH
= -0.5mA, V
CC=
V
CCmin
CS,ZZ>V
CCQ
-0.2V, Other inputs = 0 ~ V
CCQ
(Typ. condition : V
CC
=3.0V @ 25
o
C)
(Max. condition : V
CC
=3.3V @ 85
o
C)
Min
-1
-1
-
-
-
0.8*V
CCQ
Typ
-
-
-
-
-
-
Max
1
1
3
25
0.2*V
CCQ
Unit
uA
uA
mA
mA
V
V
-
Standby Current (CMOS)
LL
-
-
80
uA
1. Maximum Icc specifications are tested with V
CC
= V
CCmax.
5
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