EEWORLDEEWORLDEEWORLD

Part Number

Search
 PDF

PAL12L6JC

Description
Progammable Array Logic Series 24 (PAL Series 24)
CategoryProgrammable logic devices    Programmable logic   
File Size449KB,14 Pages
ManufacturerNational Semiconductor(TI )
Websitehttp://www.ti.com
Stay tuned Parametric

PAL12L6JC Overview

Progammable Array Logic Series 24 (PAL Series 24)

PAL12L6JC Parametric

Parameter NameAttribute value
Is it Rohs certified?incompatible
MakerNational Semiconductor(TI )
package instructionDIP, DIP20,.3
Reach Compliance Codeunknow
Other featuresACTIVE LOW OUTPUT
ArchitecturePAL-TYPE
JESD-30 codeR-GDIP-T20
JESD-609 codee0
length24.51 mm
Dedicated input times12
Number of I/O lines
Number of entries12
Output times6
Number of product terms16
Number of terminals20
Maximum operating temperature75 °C
Minimum operating temperature
organize12 DEDICATED INPUTS, 0 I/O
Output functionCOMBINATORIAL
Package body materialCERAMIC, GLASS-SEALED
encapsulated codeDIP
Encapsulate equivalent codeDIP20,.3
Package shapeRECTANGULAR
Package formIN-LINE
Peak Reflow Temperature (Celsius)NOT SPECIFIED
power supply5 V
Programmable logic typeOT PLD
propagation delay35 ns
Certification statusNot Qualified
Maximum seat height5.08 mm
Maximum supply voltage5.25 V
Minimum supply voltage4.75 V
Nominal supply voltage5 V
surface mountNO
technologyTTL
Temperature levelCOMMERCIAL EXTENDED
Terminal surfaceTin/Lead (Sn/Pb)
Terminal formTHROUGH-HOLE
Terminal pitch2.54 mm
Terminal locationDUAL
Maximum time at peak reflow temperatureNOT SPECIFIED
width7.62 mm
【Small Survey】EEWORLD in your eyes
Recently, I have been thinking about how to build a better forum. I would like to hear your suggestions on a few questions: 1. What do you think are the current advantages of EEWORLD? 2. What do you t...
soso Suggestions & Announcements
Keithley 3700 Series Mainframe Application Case Analysis - Accelerated Aging Test
Main application cases: The 3700 series can be used for power supply (PC , Network, Telecom ) aging testing. Similar use cases include Environmental Stress Screening (ESS) and Highly Accelerated Stres...
Jack_ma Test/Measurement
What is the future of IC design?
[size=5]As the title says, fresh graduates majoring in electrical engineering have the opportunity to work in power IC design. Is there a future for them? Is it difficult to change jobs or careers in ...
2835 Medical Electronics
Detailed comparison of MSP430 series and 89C51 series chips
Most readers in my country are very familiar with the 89C51 series of microcontrollers. In order to deepen the understanding of the MSP430 series of microcontrollers, we might as well compare the two....
qinkaiabc Microcontroller MCU
How to send the AD sampling result of the microcontroller to the serial port debugging assistant in decimal
The data after AD conversion calculation is unsigned long type data. How to transfer it to the debugging assistant through the serial port and make it decimal? Experts, please give me some advice...
wzp2007 Microcontroller MCU
CF76XX functions, features, and application areas
●Main feature differences of CF76XX compared to PIC16C5X, and precautions for use: CF76XX uses the core of the 16CXX series (14BIT), so its performance is basically the same as that of the 16C55X in t...
rain MCU

EEWorld
subscription
account

EEWorld
service
account

Automotive
development
circle

Robot
development
community

Index Files: 573  799  2890  2481  1441  12  17  59  50  30 
Datasheet   0 1 2 3 4 5 6 7 8 9 A B C D E F G H I J K L M N O P Q R S T U V W X Y Z
Room 1530, 15th Floor, Building B, No. 18 Zhongguancun Street, Haidian District, Beijing Telephone: (010) 82350740 Postal Code: 100190
Copyright © 2005-2026 EEWORLD.com.cn, Inc. All rights reserved 京ICP证060456号 京ICP备10001474号-1 电信业务审批[2006]字第258号函 京公网安备 11010802033920号