MULTIPLE OUTPUT LVDS SERIES
Q-TECH
Description
CORPORATION
3.3Vdc, 1 to 12 Differential LVDS Pairs, Space Qualified Crystal Oscillators
15MHz to 200MHz
Q-Tech QT625LW & QT697LW series Space Qualified,
100kRad(Si) Tolerant Hybrid Oscillators are Class 2
hybrids per MIL-PRF-55310, Multiple-Output LVDS,
hermetically sealed in a 20-pin Flat-Pack .625” SQR or
1.25” x 1.65” 62-pin custom Flat-Pack, and operate at
3.3Vdc over full military -55°C to +125°C temperature
range.
The products combine good shock and vibration
resistant with superior low phase noise.
Made in USA
Hermetically sealed packages
Supply voltage 3.3Vdc
Wide temperature range -55°C to +125°C
Screened and Quality Conformance
Inspection to MIL-PRF-38534, Class K
(modified)
• LVDS differential outputs
• 100k(Si) Radiation tolerant
• Low phase noise and jitter
Applications
• Satellites
• Aerospace
• Master clock for FPGA
Features
•
•
•
•
•
Ordering Information
QT
6254
LW
D
Q T 6 25 4 LWD 9 M - 1 25. 00 M H z
9
M
-
(Sample part number)
125.000MHz
Terminal Finish
Standard Gold
QT =
Plated
Hot Solder Dip
QS =
Sn60Pb40
Frequency
15MHz to 200MHz
Screening Options
EAR Destination Control Statement
This product and related technical data are
subject to the EAR as promulgated and
implemented by the U.S. Department of
Commerce Bureau of Industry and Security.
This product and related technical data are
controlled under Export Control Classification
Number (ECCN) 9A515.e.1 of the Commerce
Control List (CCL), and may not be exported, re-
exported, or re-transferred outside of the U.S. or
released or disclosed to Foreign Persons, as
defined by the EAR, without first complying
with all applicable U.S. Export Regulations.
QPDS-0115 Rev. E - August 2017
Packaging Options
(*) QT625X = 20FP
QT6251
QT6252
QT6253
QT6254
QT6271
QT6272
QT6273
QT6274
QT6976
QT6978
QT6972
Part Number (*)
= QT625 1 LVDS Pairs
= QT625 2 LVDS Pairs
= QT625 3 LVDS Pairs
= QT625 4 LVDS Pairs
= QT627 1 LVDS Pairs
= QT627 2 LVDS Pairs
= QT627 3 LVDS Pairs
= QT627 4 LVDS Pairs
= QT697 6 LVDS Pairs
= QT697 8 LVDS Pairs
= QT697 12 LVDS Pairs
2 = ±65ppm, -55°C to +125°C
9 = ±50ppm, -55°C to +125°C
11 = ±50ppm, -40°C to +85°C
12 = ±100ppm, -40°C to +85°C
Blank = N/C
D
Tristate (Enable/Disable)
= Tristate E/D
6 = ±50ppm, -55°C to +105°C
Stability/Temperature Options
M = Flight Model
B = Breadboard Model
E = Engineering Model
• Standard ESD packaging
QT627X = 20FP with Formed Leads
QT697X = 62FP
Note: QT697LW has Tristate as a
default option
Supply Voltage and Logic
+3.3V±5% LVDS
Q-TECH Corporation - 10150 W. Jefferson Boulevard, Culver City 90232 - Tel: 310-836-7900 - Fax: 310-836-2157 - www.q-tech.com
1 of 18
MULTIPLE OUTPUT LVDS SERIES
Q-TECH
CORPORATION
3.3Vdc, 1 to 12 Differential LVDS Pairs, Space Qualified Crystal Oscillators
15MHz to 200MHz
1
1.1
2
2.1
3
3.1
4
4.1
PURPOSE
The purpose of this Specification Control Drawing (SCD) is to describe the design, construction, performance
and specific quality and reliability requirements for hermetically sealed 20-pin or 62-pin flat packs, Space
Level, Hybrid Crystal Oscillators intended for use in high-reliability spacecraft applications.
SCOPE
This specification establishes the minimum detail requirements for QT625LW, QT627LW, and QT697LW
intended for use in conjunction with the applicable documents.
PART PROTECTION AND SAFETY
These items are susceptible to breakdown damage resulting from electrostatic discharge. Every precaution
shall be taken while handling, installing, and testing the parts to prevent static charge. Care should be
exercised to not apply more than rated voltage or current to any terminal/pad during testing.
PART NUMBER
The Q-Tech Part Number shall be as specified in Ordering Information.
5
5.1
5.2
5.2.1
5.2.2
5.2.3
5.2.4
5.3
5.3.1
5.3.2
5.3.3
5.3.4
5.3.5
5.3.6
5.4
5.4.1
5.5
5.5.1
5.6
5.6.1
6
6.1
Q-TECH Corporation - 10150 W. Jefferson Boulevard, Culver City 90232 - Tel: 310-836-7900 - Fax: 310-836-2157 - www.q-tech.com
QPDS-0115 Rev. E - August 2017
REQUIREMENTS
General Requirements
The parts shall comply with the requirements of MIL-PRF-38534, Class K and MIL-PRF-55310,
Level S except as modified or supplemented herein.
APPLICABLE DOCUMENTATION & REFERENCES
The following documents form a part of this drawing to the extent specified or modified herein.
Military
MIL-PRF-55310, Oscillator, Crystal Controlled, General Specification for
MIL-PRF-19500, Semiconductor Devices, General Specification for
MIL-PRF-38534, Microcircuit Manufacturing, General Specification for
MIL-PRF-38535, Integrated Circuits, (Microcircuits) Manufacturing, General Specification for
Standards
MIL-STD-202, Test Methods for Electronic and Electrical Component Parts
MIL-STD-750, Test Methods for Semiconductor Devices
MIL-STD-883, Test Methods and Procedures for Microelectronics
MIL-STD-1686, Electrostatic Discharge Control Program for Protection of Electrical and Electronic Parts,
Assemblies and Equipment
MIL-STD-1285, Marking of Electrical and Electronic Parts
MIL-STD-1580, Destructive Physical Analysis for EEE parts
American Society for Testing And Materials
ASTM E 595, Standard Test Method for Total Mass Loss and Collected Volatile Condensable materials from
Outgassing in a vacuum Environment
Other Documents
NASA Reference Publication 1124, Outgassing Data for Selecting Spacecraft Materials
Order of Precedence
In the event of conflict between this document and the references cited herein or other requirements, the
requirements of this drawing shall take precedence.
Customer Purchase Order Special Requirements
Additional special requirements shall be specified in the applicable customer purchase order when additional
requirements or modifications are needed for compliance to special programs or product line compliance.
Unique identification of the items produced may be required.
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MULTIPLE OUTPUT LVDS SERIES
Q-TECH
CORPORATION
Approved Source of Supply
Hybrid crystal oscillators shall be supplied from the manufacturer specified in “Source of Supply” below.
6.3
Design and Construction
6.3.1
Outline Dimensions and Terminal Connections
The outline dimensions and terminal connections shall be as shown in Figures 1 to 3 herein.
6.3.2
Package Body and Lead Finish
The package body and lead finish shall be gold in accordance with MIL-PRF-38534. Hot Solder dip can be
added as an option.
6.3.3
Circuit Design
The circuit design analysis shall be performed to establish the electrical stresses for each element under the
crystal oscillator nominal and maximum rated operating condition. The circuit design shall make allowances
for worst-case variation, to compensate for manufacturing variations and End-Of- Life parameter limits in the
following as a minimum, but not limited to: input and output voltages; input and output currents; power
dissipation; propagation delay, frequency stability over temperature: frequency/voltage stability and operating
junction temperature.
6.3.4
Quartz Crystal
The quartz crystal utilized in the design shall be Swept, grade 2.2 million or better, physically mounted on a
three-point minimum.
6.3.5
Crystal Mounting
The crystal element shall be three-point minimum mounted in such a manner as to assure adequate crystal
performance when the oscillator is subjected to the environmental conditions specified herein.
6.3.6
Active Devices
The microcircuit used in this part shall use LVDS technology and shall be from a wafer proven to be radiation
tolerant to 100kRad(Si) total ionizing dose.
6.3.7
Element Evaluation
All piece parts shall be derived from lots that meet the element evaluation requirements of MIL-PRF- 38534,
Class K.
6.3.8
Package Elements
Salt Spray Salt spray testing not required.
6.3.9
Electrical and Thermal Derating
The derating analysis shall be performed using the maximum operating temperature specified in Table I.
6.3.10
Prohibited Finishes
6.3.10.1
Metals
All metals (internal and external) shall be such that they will not promote the growth of whiskers, dentrites, in
termetallic formation or Kirkendall voids, corrosion, and shall not sublime in the intended application
conditions. Mercury, Zinc, Cadmium and Selenium are prohibited. Alloy and brazing materials containing
Cadmium or Zinc shall not be used without over plating. Pure tin (greater than 97%) is prohibited. Tin shall be
alloyed with a minimum of 3% lead (Pb) by weight.
6.3.10.2
Metal Finishes
Metal finishes (internal and external) shall be such that they will not promote the growth of whiskers,
dentrites, intermetallic formation or Kirkendall voids, corrosion, and shall not sublime in the intended
application conditions. Pure tin (greater than 97%) is prohibited. Tin shall be alloyed with a minimum of
3% lead (Pb) by weight.
6.4
Performance Requirements
6.4.1
Materials
Materials used in the device shall be in accordance with MIL-PRF-38534 and MIL-PRF-55310. The die inter
connect materials, such as wires, shall be in accordance with MIL-PRF-38534, Class K.
6.4.2
Bimetallic Wire Bonds
Bimetallic wire bonds at the die are used. However, the following process steps are implemented:
6.2
3.3Vdc, 1 to 12 Differential LVDS Pairs, Space Qualified Crystal Oscillators
15MHz to 200MHz
Q-TECH Corporation - 10150 W. Jefferson Boulevard, Culver City 90232 - Tel: 310-836-7900 - Fax: 310-836-2157 - www.q-tech.com
QPDS-0115 Rev. E - August 2017
3 of 18
MULTIPLE OUTPUT LVDS SERIES
Q-TECH
CORPORATION
3.3Vdc, 1 to 12 Differential LVDS Pairs, Space Qualified Crystal Oscillators
15MHz to 200MHz
7
7.1
a) 100% Non-Destructive Bond Pull.
b) Machine set-up, bond verification and in-process controls.
6.4.3
Outgassing
All nonmetallic and organic materials used shall meet outgassing requirements of ASTM E 595.
6.4.4
Rework
Rework and rework qualification shall be in accordance with MIL-PRF-38534, Class K.
6.4.5
Weight
The weight of the device shall be less than 5 grams for QT625/627LW or less than 25 grams for QT697LW.
6.4.6
ESDS Classification
The Q-Tech ESDS classification for this part is Class 1C
6.4.7
Marking
The marking shall be in accordance with Figure 1 to 3 herein.
6.4.8
Serialization
Each unit shall have a unique serial number and be traceable to the specific date code, inspection lot and wafer
lot as required in MIL-PRF-38534, Class K.
6.4.9
Maximum Ratings
The maximum ratings shall be as specified in Table I herein.
6.4.10
Electrical Performance Characteristics and Limits
The electrical performance requirements and limits shall be in accordance with Table III herein.
6.4.11
Maximum Allowable Leak Rate
The maximum allowable leakage rate shall be as specified by MIL-STD-883, method 1014 based on the
internal free cavity volume. The hermetic seal (fine and gross leak) tests shall be in accordance with
MIL-STD-883, Method 1014.
6.4.12
Total Dose Radiation Limits
Hybrid crystal oscillators shall be capable of meeting the performance requirements after being exposed to
100kRad(Si) total dose radiation levels.
6.4.13
Non-Flight Oscillators
Following general requirements for non-flight hardware shall apply as minimums:
6.4.13.1
Breadboard/Prototype (B) Oscillators
The requirements for breadboard/prototype oscillators shall be as follows:
a) Breadboard oscillators need only meet the form, fit and function of the flight units.
b) Breadboard oscillators shall be suitable identified.
6.4.13.2
Engineering Model (E) Oscillators
The requiremetns for engineering model oscillators shall be as follows:
a) Design and manufacturing processes shall be identical to flight units.
b) Finished units shall be functional over the operating temperature range.
c) Screening test and/or Quality Conformance Inspection is not required.
d) Engineering model oscillators shall be suitably identified.
QUALITY ASSURANCE PROVISIONS
Responsiblility for Inspection
Unless otherwise specified in the contract or purchase order, the supplier shall be responsible for the
performance of all inspection requirements as specified. Except as otherwise specified in the contract or
purchase order, the supplier may use their own or any other facilities suitable for the performance of the
inspection requirements specified herein, unless disapproved by Customer. Customer reserves the right to
Q-TECH Corporation - 10150 W. Jefferson Boulevard, Culver City 90232 - Tel: 310-836-7900 - Fax: 310-836-2157 - www.q-tech.com
QPDS-0115 Rev. E - August 2017
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MULTIPLE OUTPUT LVDS SERIES
Q-TECH
CORPORATION
perform any of the inspections set forth in the specification where such inspections are deemed necessary to
assure supplies and services conform to prescribed requirements, and to return any product failing to meet the
specified requirements.
7.2
Screening
Hybrid crystal oscillators shall have been subjected to and successfully passed all the screening tests as
specified in Table IV herein in order to be acceptable for delivery. All variables data shall be read and
recorded. Devices which fail any test criteria in the screening sequence shall be removed from the lot at the
time of observation or immediately at the conclusion of the test in which the failure was observed. Once
rejected and verified as a device failure, rework and subsequent rescreening in accordance with the rework
provisions may be performed. Devices which fail during screening may be used for Group B inspection,
provided that they have completed screening through completion of the burn-in testing.
7.2.1
Nondestructive Bond Pull
Except for the wires connecting the crystal to the circuit (if available), 100 percent nondestructive bond pull,
shall be performed on each hybrid crystal oscillator in accordance with MIL-STD-883, method 2023. The total
number of failed wires and the total number of devices failed shall be recorded. The lot shall have a percent
defective allowable (PDA) of 2 percent or less based on the total number of wires pulled in the production lot.
7.2.2
Internal Visual Inspection
Internal visual inspection shall be in accordance with the condition K (class S) requirements of MIL-STD-883,
methods 2017 and 2032. During the time interval between final internal visual inspection and preparation for
sealing, hybrid crystal oscillators shall be stored in a dry, controlled environment as defined in MIL-STD-883,
method 2017 or in a vacuum bake oven. The following details shall apply:
a) The final internal visual inspection shall occur after crystal resonator installation and prior to cover seal.
Hybrid crystal oscillator inspection and preparation for sealing shall be in a class 100 environment as
defined in Federal Standard 209. Hybrid crystal oscillators shall be in a covered container when
transferred from one controlled environment to another.
7.2.3
Stabilization Bake
Stabilization bake shall be performed prior to package seal. Stabilization bake shall be performed in a vacuum
environment.
7.2.4
Temperature Cycling
Unless otherwise specified, temperature cycling shall be in accordance with Table IV herein.
7.2.5
Constant Acceleration
Constant acceleration shall be performed in the Y1 orientation.
7.2.6
Particle Impact Noise Detection (PIND) Test
PIND testing shall be performed in accordance with MIL-STD-883, method 2020, condition B. The PIND test
shall be performed using five independent passes and all failures found at the end of each pass are rejected.
The survivors of the last pass are acceptable. The cumulative number of defective devices shall not exceed 25
percent.
7.2.7
Pre Burn-In Electrical Characteristics Test
Unless otherwise specified, pre burn-in electrical testing shall consist of the tests listed in Table IX.
Electrical performance limits shall be in accordance with Table III.
7.2.8
Burn-In
The burn-in period shall be 320 hours minimum. The 320 hour burn-in period shall be divided into two
successive 160 hour minimum burn-in periods. Electrical testing shall be performed after the first burn-in to
select acceptable devices for the second burn-in.
7.2.9
Interim Electrical Testing
Unless otherwise specified, interim electrical testing shall consist of the tests listed in Table IX. Electrical
performance limits shall be in accordance with Table III.
7.2.10
Final Electrical Testing
Unless otherwise specified, final electrical testing shall consist of the tests listed in Table IX. Electrical
performance limits shall be in accordance with Table III.
3.3Vdc, 1 to 12 Differential LVDS Pairs, Space Qualified Crystal Oscillators
15MHz to 200MHz
Q-TECH Corporation - 10150 W. Jefferson Boulevard, Culver City 90232 - Tel: 310-836-7900 - Fax: 310-836-2157 - www.q-tech.com
QPDS-0115 Rev. E - August 2017
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