ClassⅠ(NP0) General
Multilayer Ceramic Chip Capacitors
ClassⅠ(NP0)
General Multilayer Ceramic Chip Capacitors
■
Product Features And Application
Various kinds of dimensions, All kinds of series temperature coefficient, Stable performance.
Suited for resonant circuit application where low losses and high stability of capacitance are
essential or where a precisely defined temperature coefficient is required.
■
Part Numbering
C
①
0805
②
CG
③
101
④
J
⑤
500
⑥
W
⑦
T
⑧
General Ceramic
Chip Capacitor
①
Chip
Dimensions Temperature Rated Tolerance
Coefficient Capacitance
Rated Termination Packing
Voltage Type
Code
capacitor code
Code
C
Ceramic chip capacitors
General
②
Dimensions
Dimensions（Unit：mm）
Code
0402
0603
0805
1206
1210
1812
L
1.0 ± 0.05
1.6 ± 0.1
2.0 ± 0.2
3.2 ± 0.2
3.2 ± 0.2
4.5 ± 0.3
W
0.5 ± 0.05
0.80 ± 0.1
1.25 ± 0.2
1.6 ± 0.2
2.5 ± 0.2
3.2 ± 0.2
T(max)
0.5 ± 0.05
0.8 ± 0.1
1.40
1.40
1.70
2.0
B(min)
0.2
0.20
0.25
0.25
0.25
0.45
B(max)
0.3
0.71
0.76
0.76
0.76
1.0
③
Temperature
Coefficient
Temperature Coefficient
0 ± 30ppm/℃
-33 ± 30ppm/℃
-75 ± 30ppm/℃
-150 ± 60ppm/℃
-220 ± 60ppm/℃
-330 ± 60ppm/℃
-470 ± 60ppm/℃
-750 ± 120ppm/℃
+350½-1000ppm/℃
Operating Temperature Range
Code(EIA)
CG (C0G)
HG (H2G)
LG (L2G)
PH (P2H)
RH (R2H)
SH (S2H)
TH (T2H)
UJ (U2J)
SL
-55℃½+125℃
ClassⅠ(NP0) General
Multilayer Ceramic Chip Capacitors
■
Specifications
No
1
Item
Operating
Temperature
Range
Rated
Voltage
Appearance
Dimensions
Dielectric
Strength
Insulation
Resistance
Capacitance
Q/(D.F.)
Dissipation
Factor
and Test Methods
Specification
-55℃½+125℃
The rated voltage means the maximum direct voltage or peak
value of pulse voltage which may be applied continuously to
a capacitor.
Visual inspection
Callipers inspection
No failure shall be observed when 250% of the rated voltage
is applied between the terminations for 1 to 5 seconds,
provided the charge/discharge current is less than 50mA.
The insulation resistance shall be measured with the
following voltage at normal temperature and humidity and
within 1 minute of charging.
The capacitance/Q/D.F. shall be measured at 25℃ with the
frequency and voltage shown in the table.
Item
Frequency
Voltage
C＜1000pF
1±0.1MHz
1±0.2Vrms
C≥1000pF
1±0.1KHz
1±0.2Vrms
Test Method
2
3
4
5
See the previous pages
No defects or abnormality
See the previous pages
No defect or abnormality
Morn than 100000MΩ or 500
ΩF
(Whichever is smaller)
Within the specified tolerance
C＞30pF, Q≥1000
C≤30pF, Q≥400+20C(pF)
6
7
8
9
Temperature
Coefficient
Temperature coefficient: within
the specified tolerance.
Capacitance drift: within 0.3%
or 0.05pF
(Whichever is larger)
The temperature coefficient is measured with the capacitance
of step 3 as a reference. The temperature cycling sequential is
from step 1 through 5, The temperature coefficient shall be
within the specified tolerance for the temperature coefficient.
The temperature coefficient equal [(Ci-C
3
)/C
3
]/(Ti-T
3
).
The capacitance drift is calculated by dividing the differences
between the maximum and minimum measured values in the
step 1,3 and 5 by the capacitance value in step 3.
Step
1
2
3
4
5
Temperature
25±2℃
-55±3℃
25±2℃
125±3℃
25±2℃
10
Adhesive
Strength of
Termination
No removal of the terminations
or other defect shall occur.
Solder a capacitor to test jig (glass epoxy board) shown in
below fig using a eutectic solder. Then apply 10N force in
the direction of the arrow.
The soldering should be done either by hand iron or using the
reflow method and shall be conducted with care so that the
soldering is uniform and free of defects such as heat
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