1. Stresses above those listed in Absolute Maximum Ratings may cause permanent damage to the device. Functional operation at conditions other than the operating conditions
specified is not implied. Only one Absolute Maximum Rating should be applied at any one time.
2. Mounted on an FR4 board with exposed paddle connected to ground plane.
= -40°C to +85°C, unless otherwise noted. Typical values are T
A
= 25°C.
Symbol
LDO
V
OUT
V
IN
V
DO
V
OUT
/
V
OUT
* V
IN
V
OUT(Line)
V
OUT(Load)
I
OUT
I
SC
I
QLDO
V
POK
V
POKHYS
V
POK(OL)
I
POK
I
SHDN
PSRR
T
SD
T
HYS
e
N
T
C
Output Voltage Tolerance
Input Voltage
Dropout Voltage
3, 4
Line Regulation
Dynamic Line Regulation
Dynamic Load Regulation
Output Current
Short-Circuit Current
LDO Quiescent Current
POK Trip Threshold
POK Hysteresis
POK Output Voltage Low
POK Output Leakage Current
Shutdown Current
Power Supply Rejection Ratio
Over-Temperature Shutdown Threshold
Over-Temperature Shutdown Hysteresis
Output Noise
Output Voltage Temperature Coefficient
I
SINK
= 1mA
V
POK
< 5.5V, V
OUT
in Regulation
V
IN
= 5V; ENLDO = GND, EN = SGND =
PGND
1kHz
10kHz
I
OUT
= 10mA
1MHz
I
OUT
= 300mA
V
IN
= V
OUT
+ 1V to 5V
I
OUT
= 300mA, V
IN
= V
OUT
+ 1V to V
OUT
+ 2V,
T
R
/T
F
= 2μs
I
OUT
= 1mA to 300mA, T
R
<5μs
V
OUT
> 1.3V
V
OUT
< 0.4V
V
IN
= 5V, No Load, ENLDO = V
IN
V
OUT
Rising, T
A
= 25°C
2.5
60
300
1
70
90
94
1.0
0.4
1.0
1.0
65
45
42
145
15
250
22
125
98
I
OUT
= 1mA to 300mA
T
A
= 25°C
T
A
= -40°C to +85°C
-1.5
-2.5
V
OUT
+
V
DO2
400
1.5
2.5
5.5
600
0.09
%
V
mV
%/V
mV
mV
mA
A
μA
% of
V
OUT
% of
V
OUT
V
μA
μA
dB
°C
°C
μV
RMS
ppm/°C
Description
Conditions
Min
Typ
Max
Units
1. The AAT2505 is guaranteed to meet performance specifications over the -40°C to +85°C operating temperature range and is assured by design, characterization, and correla-
tion with statistical process controls.
2. To calculate the minimum LDO input voltage, use the following equation: V
1. The AAT2505 is guaranteed to meet performance specifications over the -40°C to +85°C operating temperature range and is assured by design, characterization, and correla-
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