Semiconductor Fuse
35-100A
700-1200A 700 Volts
10
4
6
4
2
10
3
6
4
2
10
2
BIF Document
35785308
Size
6
4
2
Virtual Pre-Arcing Time In Seconds
10
1
6
4
2
10
0
6
4
2
10
–1
6
4
2
10
–2
6
4
2
10
–3
6
4
2
10
–4
2
4
6
8
10
2
2
10
3
Prospective Current In Amperes RMS
Approved:
Rev. Date:
FWP-700A
FWP-800A
FWP-900A
FWP-1000A
FWP-1200A
FWP-35B
FWP-40B
FWP-50B
FWP-60B
FWP-70B
FWP-80B
FWP-90B
FWP-100B
2
4
6
8
4
6
8
10
4
Minimum Melting
Time-Current Characteristic Curves
FWP 35B-100B & 700A-1200A
BUSSMANN
P.O. Box 14460
St. Louis, MO 63178-4460
U.S.A.
Phone: 314-394-2877
Fax:
800-544-2570
Int’l Fax: 314-527-1413
NN
SEPT-97
Page
Pub. Date:
1 of 2
JAN-98
BUSSMANN U.K.
Burton-on-the-Wolds
Leicestershire LE12 5TH
England
Phone: 44-1509-882737
Fax:
44-1509-882786
BUSSMANN DENMARK
5 Literbuen
DK-2740 Skovlunde
Copenhagen, Denmark
Phone: 45-4485-0900
Fax:
45-4485-0901
7-11-01
SB01191
Bussmann reserves the right without notice to change design and/or discontinue distribution of this product.
Semiconductor Fuse
35-100A
700-1200A 700 Volts
BIF Document
35785308
Size
10
6
FWP-1200A
6
4
FWP-1000A
FWP-800A
FWP-700A
2
10
4
Peak Let-Through Current
6
4
2
10
3
6
FWP-100B
4
FWP-70B
FWP-60B
2
FWP-50B
FWP-40B
FWP-35B
10
2
2
10
2
4
6
10
3
2
4
6
10
4
2
4
6
10
5
2
Prospective Short-Circuit Current
Peak Let-Through
Cut-Off Current Characteristic Curves
FWP 35B-100B & 700A-1200A
Approved:
Rev. Date:
NN
SEPT-97
Page
Pub. Date:
2 of 2
JAN-98
7-11-01
SB01191
The only controlled copy of this BIF document is the electronic read-only version located on the Bussmann Network Drive. All other copies of this BIF document are by definition
uncontrolled. This bulletin is intended to clearly present comprehensive product data and provide technical information that will help the end user with design applications. Bussmann
reserves the right, without notice, to change design or construction of any products and to discontinue or limit distribution of any products. Bussmann also reserves the right to
change or update, without notice, any technical information contained in this bulletin. Once a product has been selected, it should be tested by the user in all possible applications.
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