5962-9561322HYX datasheet, PDF

Datasheet> All Categories > storage> storage> 5962-9561322HYX

5962-9561322HYX: DescriptionStandard SRAM, 512KX8, 25ns, CMOS, CDIP32, CERAMIC, DIP-32; Categorystorage storage; File Size226KB，43 Pages; ManufacturerMicrosemi; Websitehttps://www.microsemi.com

Download Datasheet Parametric View All

5962-9561322HYX Overview

Standard SRAM, 512KX8, 25ns, CMOS, CDIP32, CERAMIC, DIP-32

5962-9561322HYX Parametric

Parameter Name	Attribute value
Objectid	1820276260
Parts packaging code	DIP
package instruction	DIP,
Contacts	32
Reach Compliance Code	compliant
ECCN code	3A991.B.2.A
Maximum access time	25 ns
JESD-30 code	R-CDIP-T32
length	42.2 mm
memory density	4194304 bit
Memory IC Type	STANDARD SRAM
memory width	8
Number of functions	1
Number of terminals	32
word count	524288 words
character code	512000
Operating mode	ASYNCHRONOUS
Maximum operating temperature	125 °C
Minimum operating temperature	-55 °C
organize	512KX8
Package body material	CERAMIC, METAL-SEALED COFIRED
encapsulated code	DIP
Package shape	RECTANGULAR
Package form	IN-LINE
Parallel/Serial	PARALLEL
Certification status	Not Qualified
Maximum supply voltage (Vsup)	5.5 V
Minimum supply voltage (Vsup)	4.5 V
Nominal supply voltage (Vsup)	5 V
surface mount	NO
technology	CMOS
Temperature level	MILITARY
Terminal form	THROUGH-HOLE
Terminal location	DUAL

Preview

Download Datasheet

View All

REVISIONS

LTR

DESCRIPTION

Added device types 05 through 10. Added case outlines X, Z, and T.

Redrew entire document.

Added device types 11 through 13. Added case outline U.

Made changes in accordance with NOR 5962-R289-97. -sld

Table I; Changed the max limit for the operating supply current test

for device types 05-10 from 130 mA to 135 mA. Table I; Changed

the max limit for data retention current (I

CCDR1

) for device types 05-10

from 3.0 mA to 7.0 mA. Add vendor cage 88379 for device types 11,

12, and 13 per letter dated 1 MAY 1997. -sld

Add device type 14.

Changes to case outlines U and X.

Add: note to paragraph 1.2.2 and table I, conditions. Add device types

15 through 27, case outlines M, N, and 9, vendor CAGE code

0EU86, condition D to paragraphs 4.2.a.1 and 4.3.3.b.1. Changes to

table I and dimensions to case outlines T, U, Y, and Z. Table I, add

note 3 to C

and C

OUT

Table I; Changed the I

from 8 mA to 6 mA for device types 07-14

and 21-27 for the V

test. Added device types 28, 29, and 30.

Editorial changes throughout. -sld

DATE (YR-MO-DA)

96-08-23

96-10-22

97-04-28

98-02-18

APPROVED

K. A. Cottongim

98-06-22

99-04-30

01-02-08

K. A. Cottongim

Raymond Monnin

04-05-28

Raymond Monnin

REV

SHEET

REV

SHEET

REV STATUS

OF SHEETS

PMIC N/A

REV

SHEET

PREPARED BY

Steve L. Duncan

CHECKED BY

Michael C. Jones

STANDARD

MICROCIRCUIT

DRAWING

THIS DRAWING IS

AVAILABLE

FOR USE BY ALL

DEPARTMENTS

AND AGENCIES OF THE

DEPARTMENT OF DEFENSE

AMSC N/A

DEFENSE SUPPLY CENTER COLUMBUS

COLUMBUS, OHIO 43218-3990

http://www.dscc.dla.mil/

APPROVED BY

Kendall A. Cottongim

MICROCIRCUIT, MEMORY, DIGITAL, SRAM,

512K x 8-BIT, MONOLITHIC SILICON

DRAWING APPROVAL DATE

95-11-07

REVISION LEVEL

SIZE

SHEET

CAGE CODE

67268

1 OF

5962-95613

DSCC FORM 2233

APR 97

5962-E263-04

3.2.4 Timing diagram(s). The timing diagram(s) shall be as specified on figures 4 and 5.

3.2.5 Block diagram. The block diagram shall be as specified on figure 6.

3.2.6 Output load circuit. The output load circuit used to test product shall be equivalent to the circuit specified on figure 7.

3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as

specified in table I and shall apply over the full specified operating temperature range.

3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests

for each subgroup are described in table I.

3.6 Marking of device(s). Marking of device(s) shall be in accordance with MIL-PRF-38534. The device shall be marked

with the PIN listed in 1.2 herein. In addition, the manufacturer's vendor similar PIN may also be marked.

3.6 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the device described

herein shall maintain the electrical test data (variables format) from the initial quality conformance inspection group A lot sample, for

each device type listed herein. Also, the data should include a summary of all parameters manually tested, and for those which, if

any, are guaranteed. This data shall be maintained under document revision level control by the manufacturer and be made

available to the preparing activity (DSCC-VA) upon request.

3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to this drawing.

The certificate of compliance submitted to DSCC-VA shall affirm that the manufacturer's product meets the requirements of

MIL-PRF-38534 and the requirements herein.

3.8 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be provided with each lot of

microcircuits delivered to this drawing.

4. VERIFICATION

4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 or as modified in

the device manufacturer's Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function

as described herein.

4.2 Screening. Screening shall be in accordance with MIL-PRF-38534. The following additional criteria shall apply:

Burn-in test, method 1015 of MIL-STD-883.

(1)

Test condition B or D. The test circuit shall be maintained by the manufacturer under document revision level control

and shall be made available to either DSCC-VA or the acquiring activity upon request. Also, the test circuit shall specify

the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015

of MIL-STD-883.

as specified in accordance with table 1 of method 1015 of MIL-STD-883.

(2)

Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests

prior to burn-in are optional at the discretion of the manufacturer.

STANDARD

MICROCIRCUIT DRAWING

DEFENSE SUPPLY CENTER COLUMBUS

COLUMBUS, OHIO 43218-5000

SIZE

REVISION LEVEL

5962-95613

SHEET

DSCC FORM 2234

APR 97

Recommended Resources

3V to 5V regulated power supply circuit

Voltage divider bridge circuit diagram

Expansion type voltage regulator 1 circuit diagram

Series electronic ballast circuit diagram

Dual-channel radio AC remote control switch circuit

New high voltage alarm part 2

[Show samples] + The samples are finally here!: [i=s]This post was last edited by 770781327 on 2014-9-29 21:10[/i] Yes, the samples have finally arrived. TI is really fast. I filled out the application in the afternoon, and received a confirmation ...; 770781327 TI Technology Forum

16 times voltage rectifier circuit, the output voltage is low after each welding (30% of the design), occasionally one or two can reach the design purpose: 16x voltage rectifier circuit, the output voltage is low after each welding (30% of the design), occasionally one or two can reach the design purpose...; happytong Power technology

In the forum, who is the moderator who moved you the most?: Who gave you a warm greeting when you first came to EEWORLD? Who is it that, when you are in trouble, cares for you and gives you advice and solutions? Who is it, who, after a hard day's work and when...; EEWORLD社区 Talking

【DFRobot motor driver】+DC motor driver: [i=s] This post was last edited by woaixiaxiao on 2019-7-29 21:40[/i]The board was obtained from the EEWorld event and provided by DFRobot Product link: http://www.dfrobot.com.cn/goods-1317.html?tdsou...; 我爱下载 Motor Drive Control（Motor Control）

How to use custom command buttons in EVC and how to change the text color on command buttons? ?: As the title says, when creating a dialog-based project in EVC and using command buttons, how can I use custom command buttons and change the text color on command buttons for the sake of interface be...; mnllnm Embedded System

Have you noticed that RISC-V has begun to show its strength in the energy field, eating up the cake at a rapid speed?: Last week, China's high-performance RISC-V pioneer Semiconductor shared newsPioneer Semiconductor and Dongfang Electronics Group reached a strategic cooperation to enable the rapid development of Chin...; nmg Domestic Chip Exchange

Shortcut: E0 E1 E2 E3 E4 E5 E6 E7 E8 E9 EA EB EC ED EE EF EG EH EI EJ EK EL EM EN EO EP EQ ER ES ET EU EV EW EX EY EZ F0 F1 F2 F3 F4 F5 F6 F7 F8 F9 FA FB FC FD FE FF FG FH FI FJ FK FL FM FN FO FP FQ FR FS FT FU FV FW FX FY FZ G0 G1 G2 G3 G4 G5 G6 G7 G8 G9 GA GB GC GD GE GF GG GH GI GJ GK GL GM GN GO GP GQ GR GS GT GU GV GW GX GZ H0 H1 H2 H3 H4 H5 H6 H7 H8 HA HB HC HD HE HF HG HH HI HJ HK HL HM HN HO HP HQ HR HS HT HU HV HW HX HY HZ I1 I2 I3 I4 I5 I6 I7 IA IB IC ID IE IF IG IH II IK IL IM IN IO IP IQ IR IS IT IU IV IW IX J0 J1 J2 J6 J7 JA JB JC JD JE JF JG JH JJ JK JL JM JN JP JQ JR JS JT JV JW JX JZ K0 K1 K2 K3 K4 K5 K6 K7 K8 K9 KA KB KC KD KE KF KG KH KI KJ KK KL KM KN KO KP KQ KR KS KT KU KV KW KX KY KZ

Popular Components