INCH-POUND
MIL-PRF-83421F
17 May 2017
SUPERSEDING
MIL-PRF-83421E
6 December 2010
PERFORMANCE SPECIFICATION
CAPACITOR, FIXED, METALLIZED PLASTIC FILM DIELECTRIC,
(DC, AC, OR DC AND AC), HERMETICALLY SEALED IN METAL CASES OR CERAMIC CASES,
ESTABLISHED RELIABILITY, GENERAL SPECIFICATION FOR
This specification is approved for use by all Departments
and Agencies of the Department of Defense.
1. SCOPE
1.1 Scope. This specification covers the general requirements for established reliability (ER), metallized plastic
film dielectric, fixed capacitors, hermetically sealed in metal or ceramic cases. Capacitors covered by this
specification have failure rate levels (FRL) established in accordance with
MIL-STD-690.
The reliability for each level
is identified by a symbol in accordance with
table I.
These FRLs are established at a 90 percent confidence level and
maintained at a 10 percent producer's risk and, unless otherwise specified (see
3.1),
are based on life tests
performed at maximum rated voltage at maximum rated temperature. Unless otherwise specified (see
3.1),
an
acceleration factor of 5:1 has been used to relate life-test data obtained at 140 percent of rated voltage at maximum
rated temperature, to rated voltage at maximum rated temperature (see
6.1).
A part per million (PPM) quality system
is used for documenting and reporting the average outgoing quality of capacitors supplied to this specification.
Statistical process control (SPC) techniques are required in the manufacturing process to minimize variation in
production of capacitors supplied to the requirements of this specification.
1.2 Classification. Capacitors covered by this specification are classified by the style, as specified (see
3.1).
1.2.1 Part or Identifying Number (PIN). Capacitors specified herein (see
3.1)
are identified by a PIN which
consists of the basic number of the performance specification and a series of coded characters. The coded
characters provide information concerning the capacitors temperature coefficient, specification sheet number,
capacitance value, capacitance tolerance, voltage, case code, termination finish, and failure rate level. The PIN is in
the following form:
M83421/
01
-
1
123
M
Performance
specification
number
Specification sheet
number
(1.2.1.1)
Single digit
designating style
Nonsignificant
dash number
FRL
(1.2.1.2)
1.2.1.1 Dash. Use “-“ for standard product or “H” for random vibration option.
Comments, suggestions, or questions on this document should be addressed to DLA Land and Maritime, ATTN:
VAT, Post Office Box 3990, Columbus, OH 43218-3990, or emailed to
CapacitorFilter@dla.mil.
Since contact
information can change, you may want to verify the currency of this address information using the ASSIST Online
database at
https://assist.dla.mil/.
AMSC N/A
FSC 5910
MIL-PRF-83421F
1.2.1.2 Failure rate level (FRL). The FRL is identified by a single letter as shown in table I.
TABLE I. FRL.
Symbol
M
P
R
S
FRL (percent per 1,000 hours)
1.0
0.1
0.01
0.001
2. APPLICABLE DOCUMENTS
2.1 General. The documents listed in this section are specified in sections 3 and 4 of this specification. This
section does not include documents cited in other sections of this specification or recommended for additional
information or as examples. While every effort has been made to ensure the completeness of this list, document
users are cautioned that they must meet all specified requirements documents cited in sections 3 and 4 of this
specification, whether or not they are listed.
2.2 Government documents.
2.2.1 Specifications, standards, and handbooks. The following specifications, standards, and handbooks form a
part of this document to the extent specified herein. Unless otherwise specified, the issues of these documents are
those cited in the solicitation or contract.
DEPARTMENT OF DEFENSE SPECIFICATIONS
MIL-PRF-83421/1
-
Capacitor, Fixed, Metallized Plastic Film, Dielectric, DC and AC, Hermetically
Sealed in Metal Cases, Established Reliability, Styles CRH01, CRH02,
CRH03, CRH04, CRH05, CRH06, CRH07, CRH08, CRH09, and CRH00
Capacitor, Fixed, Metallized Plastic Film, Dielectric, (DC, AC, or DC and AC),
Hermetically Sealed in Metal Cases, Established Reliability, Styles CRH11,
CRH12, and CRH13 (Insulated)
Capacitor, Fixed, Metallized Plastic Film Dielectric, DC and AC, Hermetically
Sealed in Metal Cases, Established Reliability, Styles CRH31, CRH32,
CRH33, CRH34, and CRH35
MIL-PRF-83421/2
-
MIL-PRF-83421/6
-
DEPARTMENT OF DEFENSE STANDARDS
MIL-STD-202
MIL-STD-202-101
MIL-STD-202-104
MIL-STD-202-105
MIL-STD-202-106
MIL-STD-202-107
MIL-STD-202-108
MIL-STD-202-112
MIL-STD-202-204
MIL-STD-202-208
MIL-STD-202-210
MIL-STD-202-211
MIL-STD-202-213
MIL-STD-202-214
MIL-STD-202-215
MIL-STD-202-301
MIL-STD-202-302
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
Test Methods Standard Electronic and Electrical Component Parts
Method 101, Salt Atmosphere (Corrosion)
Method 104, Immersion
Method 105, Barometric Pressure (Reduced)
Method 106, Moisture Resistance
Method 107, Thermal Shock
Method 108, Life (at Elevated Ambient Temperature)
Method 112, Seal
Method 204, Vibration, High Frequency
Method 208, Solderability
Method 210, Resistance to Soldering Heat
Method 211, Terminal Strength
Method 213, Shock (Specified Pulse)
Method 214, Random Vibration
Method 215, Resistance to Solvents
Method 301, Dielectric Withstanding Voltage
Method 302, Insulation Resistance
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MIL-PRF-83421F
MIL-STD-202-305
MIL-STD-690
MIL-STD-790
-
-
-
MIL-STD-810
MIL-STD-1285
-
-
Method 305, Capacitance
Failure Rate Sampling Plans and Procedures
Standard Practice for Established Reliability and High Reliability Qualified
Products List (QPL) Systems for Electrical, Electronic, and Fiber Optic Parts
Specifications
Environmental Engineering Considerations and Laboratory Tests
Marking of Electrical and Electronic Parts
(Copies of these documents are available online at
http://quicksearch.dla.mil/.)
2.3 Non-Government publications. The following documents form a part of this document to the extent specified
herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract.
ASTM INTERNATIONAL (ASTM)
ASTM D92
-
Standard Test Method for Flash and Fire Points by Cleveland Open Cup
(Copies of this document are available online at
http://www.astm.org.)
ASSOCIATION CONNECTING ELECTRONICS INDUSTRIES (IPC)
IPC/JEDEC J-STD-002
-
Solderability Tests for Component Leads, Terminations, Lugs, Terminals and
Wires
(Copies of these documents are available online at
http://www.ipc.org/.)
SAE INTERNATIONAL (SAE)
SAE EIA-554-1
-
Assessment of Average Outgoing Quality Levels in Parts Per Million (PPM)
(Copies of this documents are available online at
http://www.sae.org.)
SOLID STATE TECHNOLOGY ASSOCIATION (JEDEC)
JEDEC EIA-557
-
Statistical Process Control Systems
(Copies of this document are available online at
http://www.jedec.org.)
2.4 Order of precedence. Unless otherwise noted herein or in the contract, in the event of a conflict between the
text of this document and the references cited herein (except for related specification sheets), the text of this
document takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless
a specific exemption has been obtained.
3. REQUIREMENTS
3.1 Specification sheets. The individual item requirements shall be as specified herein and in accordance with the
applicable specification sheets. In the event of any conflict between requirements of this specification and the
specification sheets, the latter shall govern.
3.2 Qualification. Capacitors furnished under this specification shall be products which are authorized by the
qualifying activity for listing on the applicable qualified products list (QPL) before contract award. In addition, the
manufacturer shall obtain certification from the qualifying activity that the QPL system requirements of 3.3 and
4.2
have been met and are being maintained.
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MIL-PRF-83421F
3.3 QPL system. The manufacturer shall establish and maintain a QPL system for parts covered by this
specification. Requirements for this system are specified in
MIL-STD-690
and
MIL-STD-790.
In addition, the
manufacturer shall establish a Statistical Process Control (SPC) and Part Per Million (PPM) system which meets the
requirements of 3.3.1 and 3.3.2, respectively. The following
MIL-STD-790
exception is allowed:
a. Under "Description of production processes and controls", the procedure for identification of each production
lot shall include only "the manufacturer shall as a minimum be able to identify the time period during which
the final production operation was performed on each item of product prior to final test. The date or lot code
marked on each part shall be identified to a production lot."
b. "Traceability" of materials shall not apply.
3.3.1 SPC system. As part of the overall
MIL-STD-790
QPL system, the manufacturer shall establish a SPC
system which meets the requirements of
JEDEC EIA-557.
Typical manufacturing processes for application of a SPC
include pre-assembly, assembly, encapsulation, and packaging.
3.3.2 PPM system. As part of the overall
MIL-STD-790
QPL system, the manufacturer shall establish a PPM
system for assessing the average outgoing quality of lots in accordance with
SAE EIA-554-1.
Data exclusion, in
accordance with
SAE EIA-554-1,
may be used with approval of the qualifying activity. The PPM system shall identify
the PPM rate at the end of each month and shall be based on a six month moving average.
3.4 Material. The material shall be as specified herein. However, when a definite material is not specified, a
material shall be used which will enable the capacitors to meet the performance requirements of this specification.
Acceptance or approval of any constituent material shall not be construed as a guaranty of the acceptance of the
finished product.
3.4.1 Impregnant. The impregnant shall be chemically inactive with respect to the capacitor element and the case.
The impregnant, either in the state of original application or as a result of having aged, shall have no adverse effect
on the performance of the capacitor. For liquid-impregnated capacitors, the same material shall be used for
impregnating as is used for filling.
3.4.2 Metals. Metals shall be of a corrosion-resistant type or shall be plated or treated to resist corrosion. Silver
plating shall not be used in any external portions of these capacitors.
3.4.2.1 Dissimilar metals. Where dissimilar metals are used in intimate contact with each other, provision shall be
made to provide protection against electrolysis and corrosion. The use of dissimilar metals in contact, which may
tend toward active electrolytic corrosion (particularly brass, copper, or steel used in contact with aluminum or
aluminum alloy), shall not be acceptable. However, metal plating or metal spraying of dissimilar metals to base
metals to provide similar or suitable abutting surfaces will be permitted (for example, the spraying of copper on
aluminum for soldering operations will be permitted). The use of dissimilar metals separated by insulating material
will also be permitted.
3.4.3 Pure tin. The use of pure tin, as an underplate or final finish, is prohibited both internally and externally. Tin
content of capacitor components and solder shall not exceed 97 percent, by mass. Tin shall be alloyed with a
minimum of 3 percent lead, by mass (see
6.7).
Lead-free, tin alloy high temperature solders may be used where high
temperature solder is necessary with the approval of the qualifying activity. The tin content of lead-free high
temperature solders shall not exceed 97 percent, by mass.
3.5 Interface and physical dimension requirements. Capacitors shall meet the interface and physical dimensions
specified (see
3.1).
3.5.1 Case. Each capacitor shall be enclosed in a hermetically-sealed case (see
3.1)
which will protect the
capacitor element from moisture, impregnant or filling compound leakage, and mechanical damage under all test
conditions specified herein.
4
MIL-PRF-83421F
3.5.2 Sleeving. The sleeving material shall not soften, creep, or shrink to a point where any part of the cylindrical
portion of the case is left uncovered at any test temperature specified herein. The sleeving shall not obscure the part
marking.
3.5.3 Leads. Leads shall be solderable and meet the requirements of
3.19.
3.5.3.1 Solder dip (retinning) leads. Only the manufacturer (or his authorized category B or C distributor) may
solder dip/retin the leads of product supplied to this specification provided the solder dip process (see
appendix A)
has been approved by the qualifying activity.
3.6 Burn-in (when specified, see
3.1).
When tested as specified in
4.7.2,
capacitors shall withstand the exposure
to high temperature and voltage without visible damage.
3.7 Dielectric absorption (when specified, see
3.1).
When measured as specified in
4.7.3,
the dielectric absorption
shall not exceed the value specified.
3.8 Thermal shock. When tested as specified in
4.7.4,
capacitors shall withstand the extremes of high and low
temperatures without visible damage.
3.9 Seal.
3.9.1 Liquid-impregnated or solid-impregnated capacitors. When capacitors are tested as specified in
4.7.5,
there
shall be no evidence of leakage of impregnant or repetitive bubbling.
3.9.2 Liquid-filled capacitors. When capacitors are tested as specified in
4.7.5,
there shall be no evidence of liquid
leakage.
3.10 Dielectric withstanding voltage. When tested as specified in
4.7.6,
capacitors shall be capable of
withstanding the potentials specified (see
3.1)
without permanent damage, open-circuiting or short-circuiting.
3.11 Insulation resistance. When capacitors are tested as specified in
4.7.7,
the following shall apply.
3.11.1 Terminal to terminal. When measured as specified in
4.7.7b(1),
the insulation resistance shall be not less
than the values specified (see
3.1).
3.11.2 Terminals to case (when case is not a terminal). When measured as specified in
4.7.7b(2),
the insulation
resistance between terminals and case shall be not less than the value specified (see
3.1).
3.12 Capacitance. When measured as specified in
4.7.8,
the capacitance shall be within the applicable tolerance
specified (see
3.1).
3.13 Dissipation factor. When measured as specified in
4.7.9,
the dissipation factor shall not exceed the value
specified (see
3.1).
3.14 Equivalent series resistance (ESR) (applicable to styles CRH11, CRH12, and CRH13). When measured as
specified in
4.7.10,
the ESR (in ohms) shall not exceed the value specified (see
3.1).
3.15 Barometric pressure (reduced) for qualification only. When tested as specified in
4.7.11,
capacitors shall
withstand the specified potential (see
3.1)
without visible damage, external flashover, open-circuiting or
short-circuiting.
3.16 Vibration, high frequency and random. When capacitors are tested as specified in
4.7.12,
there shall be no
evidence of mechanical damage, intermittent contacts of 0.5 millisecond (ms) or greater duration, open-circuiting or
short-circuiting.
5
MCU
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