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A42MX36-FBGG272

Description
fpga - field programmable gate array 54k system gates
CategoryProgrammable logic devices    Programmable logic   
File Size552KB,78 Pages
ManufacturerActel
Websitehttp://www.actel.com/
Environmental Compliance
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A42MX36-FBGG272 Overview

fpga - field programmable gate array 54k system gates

A42MX36-FBGG272 Parametric

Parameter NameAttribute value
Is it Rohs certified?conform to
MakerActel
package instructionPLASTIC, BGA-272
Reach Compliance Codecompli
Other featuresALSO OPERATE AT 5.0V SUPPLY
maximum clock frequency43.56 MHz
Combined latency of CLB-Max3.8 ns
JESD-30 codeS-PBGA-B272
JESD-609 codee1
length27 mm
Humidity sensitivity level3
Configurable number of logic blocks1184
Equivalent number of gates54000
Number of entries202
Number of logical units2438
Output times202
Number of terminals272
Maximum operating temperature70 °C
Minimum operating temperature
organize1184 CLBS, 54000 GATES
Package body materialPLASTIC/EPOXY
encapsulated codeBGA
Encapsulate equivalent codeBGA272,20X20,50
Package shapeSQUARE
Package formGRID ARRAY
Peak Reflow Temperature (Celsius)250
power supply3.3,3.3/5,5 V
Programmable logic typeFIELD PROGRAMMABLE GATE ARRAY
Certification statusNot Qualified
Maximum seat height2.5 mm
Maximum supply voltage3.6 V
Minimum supply voltage3 V
Nominal supply voltage3.3 V
surface mountYES
technologyCMOS
Temperature levelCOMMERCIAL
Terminal surfaceTIN SILVER COPPER
Terminal formBALL
Terminal pitch1.27 mm
Terminal locationBOTTOM
Maximum time at peak reflow temperature40
width27 mm
v3.1
40MX and 42MX Automotive FPGA Families
Features
High Capacity
Single-Chip ASIC Alternative for Automotive
Applications
3,000 to 54,000 System Gates
Up to 2.5 kbits Configurable Dual-Port SRAM
Fast Wide-Decode Circuitry
Up to 202 User-Programmable I/O Pins
Ease of Integration
Up to 100% Resource Utilization and 100% Pin
Locking
Deterministic, User-Controllable Timing
Unique In-System Diagnostic and Verification
Capability with Silicon Explorer II
Low Power Consumption
IEEE Standard 1149.1 (JTAG) Boundary Scan Testing
Product Profile
Device
Capacity
System Gates
SRAM Bits
Logic Modules
Sequential
Combinatorial
Decode
SRAM Modules
(64x4 or 32x8)
Dedicated Flip-Flops
Maximum Flip-Flops
Clocks
Maximum User I/Os
Boundary Scan Test (BST)
Packages (by pin count)
PLCC
PQFP
VQFP
TQFP
A40MX02
3,000
295
147
1
57
68
100
80
A40MX04
6,000
547
273
1
69
84
100
80
A42MX09
14,000
348
336
348
516
2
104
84
100, 160
100
176
A42MX16
24,000
624
608
624
928
2
140
208
100
176
A42MX24
36,000
954
912
24
954
1,410
2
176
Yes
160, 208
176
A42MX36
54,000
2,560
1,230
1,184
24
10
1,230
1,822
6
202
Yes
208, 240
Note:
While the automotive-grade MX devices are offered in standard speed grade only, the MX family is also offered in commercial,
industrial and military temperature grades with -F, Std, -1, -2 and -3 speed grades. Refer to the
40MX and 42MX Family FPGAs
datasheet for more details.
May 2006
© 2006 Actel Corporation
i
See the Actel website (www.actel.com) for the latest version of this datasheet.

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