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SQS20B2871FS

Description
Array/Network Resistor, Bussed, Thin Film, 0.1W, 2870ohm, 100V, 1% +/-Tol, -100,100ppm/Cel, 3415,
CategoryPassive components    The resistor   
File Size119KB,4 Pages
ManufacturerTT Electronics plc
Websitehttp://www.ttelectronics.com/
Download Datasheet Parametric View All

SQS20B2871FS Overview

Array/Network Resistor, Bussed, Thin Film, 0.1W, 2870ohm, 100V, 1% +/-Tol, -100,100ppm/Cel, 3415,

SQS20B2871FS Parametric

Parameter NameAttribute value
Is it Rohs certified?incompatible
Objectid842108764
Reach Compliance Codecompliant
structureEpoxy Molded
Network TypeBussed
Number of terminals20
Maximum operating temperature125 °C
Minimum operating temperature-55 °C
Package height1.55 mm
Package length8.65 mm
Package formSMT
Package width3.9 mm
method of packingTube
Rated power dissipation(P)0.1 W
resistance2870 Ω
Resistor typeARRAY/NETWORK RESISTOR
seriesSQS-B
size code3415
technologyTHIN FILM
Temperature Coefficient100 ppm/°C
Tolerance1%
Operating Voltage100 V
MODELS
SQSxxA
1
, SQSxxB, SSNxxA, SSNxxB,
SSWxxA, SSWxxB, SPDxxA, SPDxxB
Isolated and bussed circuits
Thin film resistor network
RoHS compliant available
FEATURES
Precision Nichrome Resistors on Silicon
Industry Standard Packaging
Ratio Tolerances
TCR Tracking Tolerances
Passivation coating provides protection in humid environments
JEDEC 95
< ± 0.05%
< ± 5 ppm/°C
SCHEMATICS
ELECTRICAL
2
Standard Resistance Range
3
Resistor Tolerances
Ratio Tolerances
TCR
Operating Temperature Range
Interlead Capacitance
Insulation Resistance
Maximum Operating Voltage
Noise, Maximum (MIL-STD-202, Method 308)
Resistor Power Rating at 70°C
1K ohms to 100K ohms (Isolated)
1K ohms to 30K ohms (Bussed)
± 0.25%
± 0.05%
Reference TCR table
-55°C to +125°C
< 2 pF
= 10,000 Megohms
100 Vdc or v PR
-25 dB
0.1 Watts
1
2
3
x
X
denotes package pin count. Reference package type section in this data sheet for description.
Specifications subject to change without notice.
E96 codes available.
BI Technologies Corporation
4200 Bonita Place
Fullerton, CA 92835 USA
Website:
www.bitechnologies.com
May 28, 2008
page 1 of 4
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