1111VFREQ3AX datasheet, PDF - EEWORLD Datasheet

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1111VFREQ3AX: DescriptionTTL Output Clock Oscillator, 24MHz Min, 100MHz Max, DIP-14; CategoryPassive components oscillator; File Size1MB，19 Pages; ManufacturerVectron International, Inc.; Websitehttp://www.vectron.com/

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1111VFREQ3AX Overview

TTL Output Clock Oscillator, 24MHz Min, 100MHz Max, DIP-14

1111VFREQ3AX Parametric

Parameter Name	Attribute value
Reach Compliance Code	compli
maximum descent time	5 ns
Frequency Adjustment - Mechanical	NO
frequency stability	50%
Manufacturer's serial number	1111
Installation features	THROUGH HOLE MOUNT
Maximum operating frequency	100 MHz
Minimum operating frequency	24 MHz
Maximum operating temperature	125 °C
Minimum operating temperature	-55 °C
Oscillator type	TTL
Output load	10 KOHM, 15 pF
physical size	0.887mm x 0.54mm x 0.2mm
longest rise time	5 ns
Maximum supply voltage	5.5 V
Minimum supply voltage	4.5 V
Nominal supply voltage	5 V
surface mount	NO
maximum symmetry	60/40 %
Base Number Matches	1

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REV

DESCRIPTION

07-0692

DATE

2/22/07

PREP

APPD

DATE

PREPARED BY

QUALITY

ENGINEERING

VECTRON INTERNATIONAL

MOUNT HOLLY SPRINGS, PA 17065

Stan Carpenter

SWP

S. Carpenter

10/26/00

11/1/00

10/30/00

Oscillator Specification, Hybrid Clock

Hi-Rel Standard

CODE IDENT NO

SIZE

DWG. NO.

REV

00136

OS-68338

UNSPECIFIED TOLERANCES: N/A

SHEET 1 0F 19

1.1

SCOPE

General. This specification defines the design, assembly and functional evaluation of high

reliability, hybrid clock oscillators produced by Vectron International. Devices delivered to

this specification represent the standardized Parts, Materials and Processes (PMP) Program

developed, implemented and certified for advanced applications and extended environments.

Applications Overview. The designs represented by these products were primarily developed

for the MIL-Aerospace community. The lesser Design Pedigrees and Screening Options

imbedded within OS-68338 bridge the gap between Space and COTS hardware by providing

custom hardware with measures of mechanical, assembly and reliability assurance needed for

Military or Ruggedized COTS environments.

APPLICABLE DOCUMENTS

Specifications and Standards. The following specifications and standards form a part of this

document to the extent specified herein. The issue currently in effect on the date of quotation

will be the product baseline, unless otherwise specified. In the event of conflict between the

texts of any references cited herein, the text of this document shall take precedence.

Military

MIL-PRF-55310

MIL-PRF-38534

Standards

MIL-STD-202

MIL-STD-883

MIL-STD-1686

Other

HT-67849

QSP-90100

VL-65339

Oscillators, Crystal Controlled, General Specification For

Hybrid Microcircuits, General Specification For

Test Method Standard, Electronic and Electrical Component Parts

Test Methods and Procedures for Microelectronics

Electrostatic Discharge Control Program for Protection of Electrical and

Electronic Parts, Assemblies and Equipment

Test Specification, OS-68338 Hybrids, Hi-Rel Standard

Quality Systems Manual, Vectron International

Identification Common Documents, Materials and Processes, Hi-Rel XO

1.2

2.1

3.1

GENERAL REQUIREMENTS

Classification. All devices delivered to this specification are of hybrid technology conforming

to Type 1, Class 2 of MIL-PRF-55310. Primarily developed as a Class S equivalent

specification, options are imbedded within it to also produce Class B, Engineering Model and

Ruggedized COTS devices. Devices carry a Class 2 ESDS classification.

SIZE

CODE IDENT NO.

UNSPECIFIED TOLERANCES

DWG NO.

REV.

SHEET

00136

N/A

OS-68338

3.2

Item Identification. External packaging choices are of metal flatpacks, DIP’s and ceramic J-

lead 9x14mm and LCC’s with either TTL or ACMOS logic output. Unique Model Number

Series’ are utilized to identify device package configurations and output logic as listed in Table

Absolute Maximum Ratings.

a. Supply Voltage Range (V

b. Storage Temperature Range (T

STG

c. Junction Temperature (T

d. Lead Temperature (soldering, 10 seconds):

e. Output Source/Sink Current

-0.5Vdc to +7.0Vdc

-65°C to +125°C

+175°C

+300°C

±70 mA

3.3

3.4

3.4.1

Design, Parts, Materials and Processes, Assembly, Inspection and Test.

Design. The ruggedized designs implemented for these devices are proven in military and

space applications under extreme environments. Designs utilize 4-point crystal mounting in

compliment with Established Reliability (MIL-ER) componentry. When specified, radiation

hardening up to 100krad(Si) (RHA level R) can be included without altering the device’s

internal topography.

3.4.1.1 Design and Configuration Stability. Barring changes to improve performance by reselecting

passive chip component values to offset component tolerances, there will not be fundamental

changes to the design or assembly or parts, materials and processes after first product delivery

of that item without written approval from the procuring activity.

3.4.1.2 Environmental Integrity. Designs have passed the environmental qualification levels of MIL-

PRF-55310. These designs have also passed extended dynamic levels of at least:

Sine Vibration: MIL-STD-202, Method 204, Condition G (30g pk.)

Random Vibration: MIL-STD-202, Method 214, Condition II-J (43.92g rms)

Mechanical Shock: MIL-STD-202, Method 213, Condition F (1500g, 0.5ms)

3.4.2

Prohibited Parts, Materials and Processes. The items listed are prohibited for use in high

reliability devices produced to this specification.

a. Gold metallization of package elements without a barrier metal.

b. Zinc chromate as a finish.

c. Cadmium, zinc, or pure tin external or internal to the device.

d. Plastic encapsulated semiconductor devices.

e. Ultrasonically cleaned electronic parts.

f. Heterojunction Bipolar Transistor (HBT) technology.

g. ‘getter’ materials

Assembly. Manufacturing utilizes standardized procedures, processes and verification

methods to produce MIL-PRF-55310 Class S / MIL-PRF-38534 Class K equivalent devices.

MIL-PRF-38534 Group B Option 1 in-line inspection is included on radiation hardened part

numbers to further verify lot pedigree. Traceability of all components and production lots are

UNSPECIFIED TOLERANCES

3.4.3

SIZE

CODE IDENT NO.

DWG NO.

REV.

SHEET

00136

N/A

OS-68338

in accordance with MIL-PRF-38534, as a minimum. Tabulated records are provided as a part

of the deliverable data package. Devices are handled in accordance with MIL-STD-1686 for

Class 1 devices.

3.4.4

Inspection. The inspection requirements of MIL-PRF-55310 apply to all devices delivered to

this document. Inspection conditions and standards are documented in accordance with the

Quality Assurance, ISO-9001 derived, System of QSP-90100.

Test. The Screening test matrix of Table 5 is tailored for selectable-combination testing to

eliminate costs associated with the development/maintenance of device-specific documentation

packages while maintaining performance integrity.

Marking. Device marking shall be in accordance with the requirements of MIL-PRF-55310.

3.4.5

3.4.6

3.4.7 Ruggedized COTS Design Implementation. Design Pedigree “D” devices (see ¶ 5.2) use the

same robust designs found in the other device pedigrees. They do not include the provisions of

traceability or the Class-qualified componentry noted in paragraphs 3.4.3 and 4.1.

4.1

4.1.1

DETAIL REQUIREMENTS

Components

Crystals. Cultured quartz crystal resonators are used to provide the selected frequency for the

devices. The optional use of Premium Q swept quartz can, because of its processing to remove

impurities, be specified for better frequency aging characteristics. In accordance with MIL-

PRF-55310, the manufacturer has a documented crystal element evaluation program.

Passive Components. Established Reliability (ER) failure level R passive components are

procured from QPL suppliers. Lot evaluations are in accordance with MIL-PRF-55310.

Class S Microcircuits. Microcircuits are procured from wafer lots that have passed MIL-PRF-

55310 Lot Acceptance Tests for Class S devices. The prescribed die carries a Class 2 ESDS

classification in accordance with MIL-PRF-38535. When optionally specified, further testing

in accordance with MIL-PRF-55310 and MIL-PRF-38534 is performed for radiation hardness

assurance. Those microcircuits, identified by a unique part number, are certified for

100krad(Si) total ionizing dose (TID), RHA level R (2X minimum margin). NSC, as the

54ACT designer, rates the SEU LET at >40 MeV and SEL at >120MeV for the FACT™

family (AN-932). Our wafer testing does not include these parameters and determinations, but

by design similarity.

4.1.2

4.1.3

4.1.3.1 Class B Microcircuits. When specified, microcircuits assembled into OS-68338 Design

Pedigree letters “B” and “C” devices (¶ 5.2a) are procured from wafer lots that have passed

MIL-PRF-55310 element evaluations for Class B devices.

SIZE

CODE IDENT NO.

UNSPECIFIED TOLERANCES

DWG NO.

REV.

SHEET

00136

N/A

OS-68338

4.1.4

Packages. Packages are procured that meet the construction, lead materials and finishes as

specified in MIL-PRF-55310. Package lots are upscreened in accordance with the

requirements of MIL-PRF-38534 as applicable.

Traceability. Active device lots are homogenous and traceable to the manufacturer’s

individual wafer. Crystals are traceable to the quartz bar and the processing details of the

autoclave lot, as applicable. All other elements and materials are traceable to their incoming

inspection lots.

Mechanical.

Package Outline. Table 1 links each Hi-Rel Standard Model Number of this specification to a

corresponding package style. Mechanical Outline information of each package style is found

in the referenced Figure.

Thermal Characteristics. The worst case thermal characteristics of each package style are

found in Table 4.

Electrical.

Input Power. Devices are designed for standard 5.0 volt dc operation, ±10%. Optional 3.3

Vdc (±10%) input performance for ACMOS output conditions. Current is measured, no load,

at maximum rated operating voltage.

Temperature Range. Operating range is -55°C to +125°C.

Frequency Tolerance. Initial accuracy at +23°C is ±15 ppm maximum. Frequency-

Temperature Stability is ±50 ppm maximum from +23°C reference. Frequency-Voltage

Tolerance is ±4 ppm maximum.

Frequency Aging. Aging limits, and when tested in accordance with MIL-PRF-55310 Group B

inspection, shall not exceed ±1 ppm the first 30 days, ±5 ppm Year 1 and ±2 ppm per year

thereafter.

4.1.5

4.2

4.2.1

4.2.2

4.3

4.3.1

4.3.2

4.3.3

4.3.4

4.3.4.1 Frequency Aging Duration Option. By customer request, the Aging test may be terminated

after 15 days if the measured aging rate is less than half of the specified aging rate. This is a

common method of expediting 30-Day Aging without incurring risk to the hardware and used

quite successfully for numerous customers. It is based on the ‘least squares fit’ determinations

of MIL-PRF-55310 paragraph 4.8.35. The ‘half the time/half the spec’ limit is generally

conservative as roughly 2/3 of a unit’s Aging deviation occurs within that period of time.

Vectron’s automated aging systems take about 6 data points per day, so a lot of data is

available to do very accurate projections, much more data than what is required by MIL-PRF-

55310. The delivered data would include the Aging plots projected to 30 days. If the units

would not perform within that limit then they would continue to full 30 Day term. Please

SIZE

CODE IDENT NO.

UNSPECIFIED TOLERANCES

DWG NO.

REV.

SHEET

00136

N/A

OS-68338

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