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FLK017XP

Description
RF Small Signal Field-Effect Transistor, 1-Element, KU Band, Gallium Arsenide, N-Channel, High Electron Mobility FET, DIE-4
CategoryDiscrete semiconductor    The transistor   
File Size178KB,4 Pages
ManufacturerSUMITOMO
Websitehttps://global-sei.com/
Environmental Compliance
Download Datasheet Parametric View All

FLK017XP Overview

RF Small Signal Field-Effect Transistor, 1-Element, KU Band, Gallium Arsenide, N-Channel, High Electron Mobility FET, DIE-4

FLK017XP Parametric

Parameter NameAttribute value
Is it lead-free?Lead free
Is it Rohs certified?conform to
MakerSUMITOMO
Parts packaging codeDIE
package instructionUNCASED CHIP, R-XUUC-N4
Contacts4
Reach Compliance Codeunknown
ECCN codeEAR99
Other featuresHIGH RELIABILITY
ConfigurationSINGLE
Minimum drain-source breakdown voltage15 V
FET technologyHIGH ELECTRON MOBILITY
highest frequency bandKU BAND
JESD-30 codeR-XUUC-N4
Number of components1
Number of terminals4
Operating modeDEPLETION MODE
Package body materialUNSPECIFIED
Package shapeRECTANGULAR
Package formUNCASED CHIP
Peak Reflow Temperature (Celsius)NOT SPECIFIED
Polarity/channel typeN-CHANNEL
Certification statusNot Qualified
surface mountYES
Terminal formNO LEAD
Terminal locationUPPER
Maximum time at peak reflow temperatureNOT SPECIFIED
Transistor component materialsGALLIUM ARSENIDE
Base Number Matches1
FLK017XP
GaAs FET & HEMT Chips
FEATURES
High Output Power: P1dB = 20.5dBm(Typ.)
High Gain: G1dB = 8.0dB(Typ.)
High PAE:
η
add = 26%(Typ.)
Proven Reliability
Source
Gate
Drain
DESCRIPTION
The FLK017XP chip is a power GaAs FET that is designed for
general purpose applications in the Ku-Band frequency range as it
provides superior power, gain, and efficiency.
Eudyna
stringent Quality Assurance Program assures the highest
reliability and consistent performance.
ABSOLUTE MAXIMUM RATING (Ambient Temperature Ta=25°C)
Item
Drain-Source Voltage
Gate-Source Voltage
Total Power Dissipation
Storage Temperature
Channel Temperature
Symbol
VDS
VGS
Ptot
Tstg
Tch
Condition
Source
Rating
15
-5
Unit
V
V
W
°C
°C
Tc = 25°C
1.15
-65 to +175
175
Eudyna
recommends the following conditions for the reliable operation of GaAs FETs:
1. The drain-source operating voltage (VDS) should not exceed 10 volts.
2. The forward and reverse gate currents should not exceed 1.34 and -0.05 mA respectively with
gate resistance of 3000Ω.
3. The operating channel temperature (Tch) should not exceed 145°C.
ELECTRICAL CHARACTERISTICS (Ambient Temperature Ta=25°C)
Item
Saturated Drain Current
Transconductance
Pinch-off Voltage
Gate Source Breakdown Voltage
Output Power at 1dB G.C.P.
Power Gain at 1dB G.C.P.
Power-added Efficiency
Noise Figure
Associated Gain
Maximum Availble Gain
Thermal Resistance
Symbol
IDSS
gm
Vp
VGSO
P1dB
G1dB
η
add
NF
Gas
Ga(max)
Rth
Test Conditions
VDS = 5V, VGS = 0V
VDS = 5V, IDS = 40mA
VDS = 5V, IDS = 3mA
IGS = -3µA
VDS = 10V
IDS
0.6 IDSS
f = 14.5GHz
VDS = 3V
IDS = 20mA
f = 12GHz
VDS = 10V
IDS = 36mA
f = 12GHz
Channel to Case
Min.
-
-
-1.0
-5
19.5
7.0
-
-
-
-
-
Limit
Typ. Max.
60
90
30
-2.0
-
20.5
8.0
26
2.5
7
11
65
-
-3.5
-
-
-
-
-
-
-
130
Unit
mA
mS
V
V
dBm
dB
%
dB
dB
dB
°C/W
Note:
RF parameter sample size 10pcs. criteria (accept/reject)=(2/3)
The chip must be enclosed in a hermetically sealed environment for optimum performance and reliability.
G.C.P.: Gain Compression Point
Edition 1.3
July 1999
1
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