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LV8121VSLDGEVK

Description
LV8121V 电机控制器/驱动器 电源管理 评估板
CategoryDevelopment board/suite/development tools    Development board/development kit   
File Size224KB,14 Pages
ManufacturerON Semiconductor
Websitehttp://www.onsemi.cn
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LV8121VSLDGEVK Overview

LV8121V 电机控制器/驱动器 电源管理 评估板

LV8121VSLDGEVK Parametric

Parameter NameAttribute value
category
MakerON Semiconductor
series-
PackageBulk
typePower management
FunctionMotor controller/driver
Embedded-
IC/parts usedLV8121V
Main attributes-
What's includedplate
Auxiliary properties-
Basic product numberLV8121
Ordering number : ENA2135
LV8121V
Bi-CMOS IC
For Fan Motor
http://onsemi.com
3-phase Brushless Motor Driver
Overview
The LV8121V is a three-phase brushless motor driver that uses a PWM drive technique. The motor speed is controlled
by changing the PWM duty that based on an analog voltage input. This motor driver includes an automatic return
constraint protection circuit and is optimal for driving fan motors.
Features
PWM control based on an analog voltage input (the CTL voltage), synchronous rectification
One Hall-effect sensor FG output
Automatic return constraint protection circuit (ON/OFF=1/15)
Start/Stop switching circuit, Forward/Reverse switching circuit
Current limiter circuit, Low-voltage shutdown protection circuit, Thermal shutdown protection circuit
Specifications
Absolute Maximum Ratings
at Ta = 25°C
Parameter
Supply voltage
Symbol
VCC max
VG max
Output current
Allowable power dissipation
Operation temperature
Storage temperature
Junction temperature
IO max
Pd max
Topr
Tstg
Tj max
VCC pin
VG pin
t
500ms
Mounted on a specified board *
Conditions
Ratings
36
42
3.5
1.7
-30 to +100
-55 to +150
150
Unit
V
V
A
W
°C
°C
°C
* Specified board : 114.3mm
×
76.1mm
×
1.6mm, glass epoxy board
Caution 1) Absolute maximum ratings represent the values which cannot be exceeded for any length of time.
Caution 2) Even when the device is used within the range of absolute maximum ratings, as a result of continuous usage under high temperature, high current,
high voltage, or drastic temperature change, the reliability of the IC may be degraded. Please contact us for the further details.
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the Recommended Operating
Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect device reliability.
Semiconductor Components Industries, LLC, 2013
May, 2013
O2412NKPC 20120919-S00001 No.A2135-1/14

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