Electrical Characteristics at test current for LUXEON Q
Junction Temperature = 85°C
Table 3.
Forward Voltage V
f
(V)
[1]
Nominal
ANSI CCT
Minimum
2.50
2.50
2.50
2.50
2.50
2.50
Maximum
3.25
3.25
3.25
3.25
3.25
3.25
Typical Temperature
Coefficient
of Forward Voltage
[2]
(mV/°C)
DV
F
/ DT
J
-1.6
-1.6
-1.6
-1.6
-1.6
-1.6
Typical Thermal Resistance
Junction to Thermal Pad
(°C/W)
Rθ
J-C
7
7
7
7
7
7
2700K
3000K
3500K
4000K
5000K
5700K
Notes for Table 3:
1. Lumileds maintains a tolerance of ± 0.06V on forward voltage measurements.
2. Measured between T
J
= 25°C and T
J
= 110°C at I
f
= 350mA.
Absolute Maximum Ratings
Table 4.
Parameter
DC Forward Current (mA)
[1] [2]
Peak Pulsed Forward Current (mA)
[1] [3]
ESD Sensitivity
LED Junction Temperature
[1]
Operating Case Temperature at 700mA
Storage Temperature
Soldering Temperature
Allowable Reflow Cycles
Reverse Voltage (Vr)
[4] [5]
LUXEON Q
1050
1200
< 8000V Human Body Model (HBM) Class 3A JESD22-A114-E
135°C
-40°C - 135°C
-40°C - 135°C
JEDEC 020c 260°C
3
LUXEON Q LEDs are not designed to be driven in reverse bias
Notes for Table 4:
1. Proper current derating must be observed to maintain junction temperature below the maximum. For additional information on thermal measurement guidelines please refer to Application
Brief AB118 (not available yet).
2. Residual periodic variations due to power conversion from alternating current (AC) to direct current (DC), also called “ripple”, with frequencies
≥
100 Hz and amplitude
≤
150mA are acceptable, assuming the average current throughout each cycle does not exceed 1050mA.
3. Pulsed operation with a peak drive current of 1200mA is acceptable if the pulse on-time is
≤
5 ms per cycle and the duty cycle is
≤
50%.
4. Transient reverse voltages and surge currents due to electrical switching or supply interruptions are acceptable if these events do not last for more than 10ms, the amplitude of the reverse
voltage does not exceed 5V and the reverse current is less than 200μA.
5. Max 5V reverse for up to 10s is an acceptable beginning of life, one time test condition.
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