The STEVAL-ISA161V1 is an evaluation board to test the performance of the SEA01 constant voltage and current controller with online digital trimming from STMicroelectronics. The board implements a 65 W adapter, targeting applications such as power supplies for high-end portable computers. The board uses the SEA01 as secondary side CV/CC controller, allowing the application to satisfy very precise output voltage and current regulations thanks to the digital trimming technique employed. The primary side PWM controller is the L6566B. This device drives a TM flyback topology, the best fit for this type of application.
The SEA01 is mounted on a small daughterboard that includes a connector to communicate, via I²C protocol, with an external trimming tool. This evaluation board can therefore be useful also as a means to test the benefits of digital trimming in a real application. The SEA01, housed in an SO8 package, is a CV/CC controller which includes 2 transconductance op-amps and 2 voltage references, digitally trimmable using an I²C interface. ST also offers an advanced trimming board (STEVAL-PCC019V1) that allows users to perform all the trimming operations (including automatic trimming) using a standard Windows®-based PC.
Main features
All reference designs on this site are sourced from major semiconductor manufacturers or collected online for learning and research. The copyright belongs to the semiconductor manufacturer or the original author. If you believe that the reference design of this site infringes upon your relevant rights and interests, please send us a rights notice. As a neutral platform service provider, we will take measures to delete the relevant content in accordance with relevant laws after receiving the relevant notice from the rights holder. Please send relevant notifications to email: bbs_service@eeworld.com.cn.
It is your responsibility to test the circuit yourself and determine its suitability for you. EEWorld will not be liable for direct, indirect, special, incidental, consequential or punitive damages arising from any cause or anything connected to any reference design used.
Supported by EEWorld Datasheet