JFET

KIT33662JEFEVBE: Evaluation Kit - MC33662J, LIN2.1/SAEJ2602-2, LIN Physical Layer

Overview

This evaluation board provides support for the MC33662JEF and is for preliminary evaluation purposes only.

The kit contains production devices that users can test in different configurations to quickly evaluate functionality. The kit can also be used for electrostatic discharge (ESD) and bulk current injection (BCI) testing.

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Documentation

All reference designs on this site are sourced from major semiconductor manufacturers or collected online for learning and research. The copyright belongs to the semiconductor manufacturer or the original author. If you believe that the reference design of this site infringes upon your relevant rights and interests, please send us a rights notice. As a neutral platform service provider, we will take measures to delete the relevant content in accordance with relevant laws after receiving the relevant notice from the rights holder. Please send relevant notifications to email: bbs_service@eeworld.com.cn.

It is your responsibility to test the circuit yourself and determine its suitability for you. EEWorld will not be liable for direct, indirect, special, incidental, consequential or punitive damages arising from any cause or anything connected to any reference design used.

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Update:2025-06-20 08:16:44

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