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EPM7128STC100 Test

Overview

Test EPM7128/ ATF1508 CPLDs.

Features:

All IOs are fanned out.
BitBlaster/ ByteBlaster/ USB Blaster are supported.
Includes a high voltage (+12V) generator, for force unlocking JTAG pins.

Design Files

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It is your responsibility to test the circuit yourself and determine its suitability for you. EEWorld will not be liable for direct, indirect, special, incidental, consequential or punitive damages arising from any cause or anything connected to any reference design used.

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Update:2025-07-04 23:05:04

c) 3dB bandwidth: 2Δf0.7 = 300kHz; the fluctuation within the band is no more than 2dB;
[i=s] This post was last edited by paulhyde on 2014-9-15 04:01 [/i] c) 3dB bandwidth: 2Δf0.7 = 300kHz; the intra-band fluctuation is no more than 2dB; What does the intra-band fluctuation no more than
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