兰博

FUSB252GEVB: FSUSB252 evaluation board

FUSB252GEVB: Eval board for FSUSB252

 
Overview



The FUSB252 evaluation board is designed to be inserted between a board that contains a Type-C controller (such as FUSB301 or FUSB302) and a source of voltage for OVP testing. Test points on the CC pins will allow OVP test scenarios to test the devices intended function. An LED indicator will show an OVP condition and the device should break connection to the USB host. If there isn’t access to a Type-C voltage source, test points (GND and VDD) are available on the board for direct power supply connections.
After performing OVP testing, the Type-C receptacle can accept a Type-C device such as a memory stick to demonstrate normal USB functionality (with SEL=L).
参考设计图片
×
 
 
Search Datasheet?

Supported by EEWorld Datasheet

Forum More
Update:2025-08-14 14:06:18
  • The data of STM32 ADC is tampered when using DMA mode
  • raw-os has been updated to version 1091
  • About PLL optimization
  • I want to learn C6416. Is there any classic book introducing this?
  • VxWorks Simulator
  • Regarding the communication problem of G2231 board...

EEWorld
subscription
account

EEWorld
service
account

Automotive
development
community

Robot
development
community

About Us Customer Service Contact Information Datasheet Sitemap LatestNews


Room 1530, 15th Floor, Building B, No.18 Zhongguancun Street, Haidian District, Beijing, Postal Code: 100190 China Telephone: 008610 8235 0740

Copyright © 2005-2024 EEWORLD.com.cn, Inc. All rights reserved 京ICP证060456号 京ICP备10001474号-1 电信业务审批[2006]字第258号函 京公网安备 11010802033920号