REVISIONS
LTR
A
B
C
D
DESCRIPTION
Table I; Changed the maximum limit for the SRAM supply current test
from 260 mA to 270 mA. -sld
Table I; Changed the maximum limit for the standby current test from
35 mA to 45 mA.
Made corrections to case outline X. Updated drawing to reflect the
latest requirements of MIL-PRF-38534.-sld
Table I; Changed the I
OL
condition from 8 mA to 6 mA for device type
02 during the V
OLS
test. Editorial changes throughout. -sld
DATE (YR-MO-DA)
98-02-11
98-06-26
03-12-22
04-04-29
APPROVED
K. A. Cottongim
K. A. Cottongim
Raymond Monnin
Raymond Monnin
REV
SHEET
REV
SHEET
REV STATUS
OF SHEETS
PMIC N/A
D
15
D
16
D
17
D
18
REV
SHEET
PREPARED BY
Steve L. Duncan
CHECKED BY
Michael Jones
D
19
D
20
D
21
D
1
D
22
D
2
D
23
D
3
D
4
D
5
D
6
D
7
D
8
D
9
D
10
D
11
D
12
D
13
D
14
STANDARD
MICROCIRCUIT
DRAWING
THIS DRAWING IS
AVAILABLE
FOR USE BY ALL
DEPARTMENTS
AND AGENCIES OF THE
DEPARTMENT OF DEFENSE
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216
http://www.dscc.dla.mil
APPROVED BY
Kendall A. Cottongim
MICROCIRCUIT, HYBRID, MEMORY, 512K x
16-BIT, SRAM AND FLASH EPROM
DRAWING APPROVAL DATE
97-02-25
AMSC N/A
REVISION LEVEL
D
SIZE
A
SHEET
DSCC FORM 2233
APR 97
CAGE CODE
67268
1 OF
23
5962-96901
5962-E252-04
1. SCOPE
1.1 Scope. This drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A
choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When
available, a choice of radiation hardness assurance levels are reflected in the PIN.
1.2 PIN. The PIN shall be as shown in the following example:
5962
Federal
stock class
designator
\
-
96901
RHA
designator
(see 1.2.1)
/
01
Device
type
(see 1.2.2)
H
Device
class
designator
(see 1.2.3)
M
Case
outline
(see 1.2.4)
X
Lead
finish
(see 1.2.5)
\/
Drawing number
1.2.1 Radiation hardness assurance (RHA) designator. RHA marked devices shall meet the MIL-PRF-38534 specified RHA
levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device.
1.2.2 Device type(s). The device type(s) identify the circuit function as follows:
Device type
01
02
Generic number
WSF512K16-72Q
WSF512K16-39Q
Circuit function
512K x 16-bit SRAM and
512K x 16-bit Flash EPROM
512K x 16-bit SRAM and
512K x 16-bit Flash EPROM
Access time
70 ns
120 ns
35 ns
90 ns
1.2.3 Device class designator. This device class designator shall be a single letter identifying the product assurance level.
All levels are defined by the requirements of MIL-PRF-38534 and require QML Certification as well as qualification (Class H, K,
and E) or QML Listing (Class G and D). The product assurance levels are as follows:
Device class
K
H
G
Device performance documentation
Highest reliability class available. This level is intended for use in space
applications.
Standard military quality class level. This level is intended for use in applications
where non-space high reliability devices are required.
Reduced testing version of the standard military quality class. This level uses the
Class H screening and In-Process Inspections with a possible limited temperature
range, manufacturer specified incoming flow, and the manufacturer guarantees (but
may not test) periodic and conformance inspections (Group A, B, C and D).
Designates devices which are based upon one of the other classes (K, H, or G)
with exception(s) taken to the requirements of that class. These exception(s) must
be specified in the device acquisition document; therefore the acquisition document
should be reviewed to ensure that the exception(s) taken will not adversely affect
system performance.
Manufacturer specified quality class. Quality level is defined by the manufacturers
internal, QML certified flow. This product may have a limited temperature range.
E
D
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
SIZE
A
REVISION LEVEL
D
5962-96901
SHEET
2
DSCC FORM 2234
APR 97
1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows:
Outline letter
M
X
Descriptive designator
See figure 1
See figure 1
Terminals
68
66
Package style
Ceramic, dual cavity, quad flatpack
Hex-in-line, single cavity, with standoffs
1.2.5 Lead finish. The lead finish shall be as specified in MIL-PRF-38534.
1.3 Absolute maximum ratings. 1/
Supply voltage range (V
CC
)........................................................
Input voltage range ...................................................................
Power dissipation (P
D
)...............................................................
Storage temperature range .......................................................
Lead temperature (soldering, 10 seconds)................................
Thermal resistance junction-to-case (θ
JC
):
Case outline M .......................................................................
Case outline X........................................................................
Data retention (Flash)................................................................
Endurance (Flash).....................................................................
1.4 Recommended operating conditions.
Supply voltage range (V
CC
)........................................................
Input low voltage range (V
IL
)......................................................
Input high voltage range (V
IH
)....................................................
Output voltage, high minimum (V
OH
) .........................................
Output voltage, low maximum (V
OL
) ..........................................
Case operating temperature range (T
C
) ....................................
2. APPLICABLE DOCUMENTS
2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a
part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in
the solicitation or contract.
DEPARTMENT OF DEFENSE SPECIFICATION
MIL-PRF-38534 - Hybrid Microcircuits, General Specification for.
DEPARTMENT OF DEFENSE STANDARDS
MIL-STD-883 - Test Method Standard Microcircuits.
MIL-STD-1835 - Interface Standard for Electronic Component Case Outlines.
DEPARTMENT OF DEFENSE HANDBOOKS
MIL-HDBK-103 - List of Standard Microcircuit Drawings.
MIL-HDBK-780 - Standard Microcircuit Drawings.
(Copies of these documents are available online at
http://assist.daps.dla.mil/quicksearch/
or
www.dodssp.daps.mil
or from
the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)
+4.5 V dc to +5.5 V dc
-0.5 V dc to +0.8 V dc
+2.2 V dc to V
CC
+ 0.3 V dc
+2.4 V dc
+0.4 V dc
-55°C to +125°C
-0.5 V dc to +7.0 V dc
-0.5 V dc to +7.0 V dc
1.43 W maximum
-65°C to +150°C
+300°C
12.8°C/W
8.7°C/W
10 years minimum
10,000 cycles minimum
1/
Stresses above the absolute maximum ratings may cause permanent damage to the device. Extended operation at the
maximum levels may degrade performance and affect reliability.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
SIZE
A
REVISION LEVEL
D
5962-96901
SHEET
3
DSCC FORM 2234
APR 97
2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text
of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a
specific exemption has been obtained.
3. REQUIREMENTS
3.1 Item requirements. The individual item performance requirements for device classes D, E, G, H, and K shall be in
accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 shall include the performance of all tests herein or as
designated in the device manufacturer's Quality Management (QM) plan or as designated for the applicable device class. The
manufacturer may eliminate, modify or optimize the tests and inspections herein, however the performance requirements as
defined in MIL-PRF-38534 shall be met for the applicable device class. In addition, the modification in the QM plan shall not
affect the form, fit, or function of the device for the applicable device class.
3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified
in MIL-PRF-38534 and herein.
3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.4 herein and figure 1.
3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2.
3.2.3 Truth table(s). The truth table(s) shall be as specified on figure 3.
3.2.4 Timing diagram(s). The timing diagram(s) shall be as specified on figures 4, 5, 6, 7, 8 and 9.
3.2.5 Block diagram(s). The block diagram(s) shall be as specified on figure 10.
3.2.6 Output load circuit. The output load circuit shall be as specified on figure 11.
3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are
as specified in table I and shall apply over the full specified operating temperature range.
3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical
tests for each subgroup are defined in table I.
3.5 Programming procedure. The programming procedure shall be as specified by the manufacturer and shall be available
upon request.
3.6 Marking of device(s). Marking of device(s) shall be in accordance with MIL-PRF-38534. The device shall be marked
with the PIN listed in 1.2 herein. In addition, the manufacturer's vendor similar PIN may also be marked.
3.7 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the device described
herein shall maintain the electrical test data (variables format) from the initial quality conformance inspection group A lot
sample, for each device type listed herein. Also, the data should include a summary of all parameters manually tested, and for
those which, if any, are guaranteed. This data shall be maintained under document revision level control by the manufacturer
and be made available to the preparing activity (DSCC-VA) upon request.
3.8 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to this
drawing. The certificate of compliance (original copy) submitted to DSCC-VA shall affirm that the manufacturer's product meets
the performance requirements of MIL-PRF-38534 and herein.
3.9 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be provided with each lot of
microcircuits delivered to this drawing.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
SIZE
A
REVISION LEVEL
D
5962-96901
SHEET
4
DSCC FORM 2234
APR 97
TABLE I. Electrical performance characteristics.
Test
Symbol
Conditions 1/ 2/
-55°C
≤
T
C
≤+125°C
unless otherwise specified
Group A
subgroups
Device
types
Limits
Min
Max
Unit
DC parameters.
SRAM supply current
I
CC1
SCS = V
IL
, OE = FCS = V
IH
,
V
CC
= 5.5 V dc, f = 5 MHz
FCS = V
IL
, OE = SCS = V
IH
,
V
CC
= 5.5 V dc, f =5 MHz
FCS = V
IL
, OE = SCS = V
IH
,
V
CC
= 5.5 V dc, f =5 MHz
FCS = SCS = V
IH
, OE = V
IH
,
V
CC
= 5.5 V dc, f =5 MHz
V
IN
= V
SS
to V
CC
1,2,3
All
270
mA
Flash supply current for read
only
Flash supply current for
program or erase
Standby current
I
CC2
1,2,3
All
130
mA
I
CC3
1,2,3
All
150
mA
I
SB
1,2,3
All
45
mA
Input leakage current
I
LI
1,2,3
All
10
µA
µA
Output leakage current
I
LO
SCS = FCS = V
IH
, OE = V
IH
,
V
OUT
= V
SS
to V
CC
1,2,3
All
10
Input low voltage
V
IL
1,2,3
All
0.8
V
Input high voltage
V
IH
1,2,3
All
2.2
V
SRAM output low voltage
V
OLS
FCS = V
IH
, V
CC
= 4.5 V,
I
OL
= 2.1 mA
FCS = V
IH
, V
CC
= 4.5 V,
I
OL
= 6 mA
1,2,3
01
0.4
V
02
0.4
V
Flash ouput low voltage
V
OLF
SCS = V
IH
, V
CC
= 4.5 V,
I
OL
= 12 mA
FCS = V
IH
, V
CC
= 4.5 V,
I
OH
= -1.0 mA
FCS = V
IH
, V
CC
= 4.5 V,
I
OH
= -4.0 mA
1,2,3
All
0.45
V
SRAM output high voltage
V
OHS
1,2,3
01
2.4
V
02
2.4
V
See footnotes at end of table.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
SIZE
A
REVISION LEVEL
D
5962-96901
SHEET
5
DSCC FORM 2234
APR 97
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